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21.
提出了一种新的铝液夹杂物快速检测方法。导出了该法的检测原理方程。分析并试验研究了影响检测重复性和分辨率的因素。试验选择了较好的检测参数,并获得了较好的检测结果。 相似文献
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A model in which jointly optimal stocks of material and finished products are to be chosen is reexamined. While it costs less to hold material, a certain percentage of the random demand not immediately satisfied by previously finished products is lost. We pay particular attention to the dependence of the optimal stocks on the initial ones, which assumes an interesting form. For example, if the stock of finished products is high but the combined stock is low, die quantity of material ordered depends on the stock of finished products. 相似文献
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Lada E.K. Jye-Chyi Lu Wilson J.R. 《Semiconductor Manufacturing, IEEE Transactions on》2002,15(1):79-90
To detect faults in a time-dependent process, we apply a discrete wavelet transform (DWT) to several independently replicated data sets generated by that process. The DWT can capture irregular data patterns such as sharp "jumps" better than the Fourier transform and standard statistical procedures without adding much computational complexity. Our wavelet coefficient selection method effectively balances model parsimony against data reconstruction error. The few selected wavelet coefficients serve as the "reduced-size" data set to facilitate an efficient decision-making method in situations with potentially large-volume data sets. We develop a general procedure to detect process faults based on differences between the reduced-size data sets obtained from the nominal (in-control) process and from a new instance of the target process that must be tested for an out-of-control condition. The distribution of the test statistic is constructed first using normal distribution theory and then with a new resampling procedure called "reversed jackknifing" that does not require any restrictive distributional assumptions. A Monte Carlo study demonstrates the effectiveness of these procedures. Our methods successfully detect process faults for quadrupole mass spectrometry samples collected from a rapid thermal chemical vapor deposition process 相似文献
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The development and test of a PLC control program takes time, increases equipment down-time, and might damage hardware due to program errors. All of these problems can be eliminated if there is a computer simulation system for testing control programs off line. This paper presented a new method, called Direct Sequential Method, for simulating PLCs. This method resolves a ladder logic sequentially by applying a series of logic deductions. This simulation system has been implemented in C and tested successfully. 相似文献