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41.
Diamond layers have been deposited by hot filament chemical vapour deposition (HF CVD) on TiN-coated steel substrates. After deposition, we could observe separate, well-developed diamond icosahedrons and decahedrons on the surface. We have found that a lower content of methane in hydrogen supports their growth, this being a result of multifold twinning. The quality of diamond layers has been evaluated by Raman spectroscopy and scanning electron microscopy. 相似文献
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Miao Song Dehong Chen Yafeng Yang Maoqiao Xiang Qingshan Zhu Hongdan Zhao Liam Ward Xiao-Bo Chen 《Advanced functional materials》2021,31(6):2008028
Single-crystalline {100} faceted TiC is of great significance in theory to a large number of engineering applications owing to its extraordinary catalytic properties. However, the {111} planes are prevalent in conventional TiC powders given their favorable thermodynamic stability during the initial low stoichiometric growth stage. Herein, a disproportionation–decomposition strategy is developed to directly produce Ti and C atoms to synthesize single-crystalline {100} faceted TiC powders. Outstanding electrochemical performance of TiC {100} crystal planes in terms of the hydrogen evolution reaction is evidenced by an overpotential of 392 mV at 10 mA cm−2, which is 52% lower than that of randomly faceted TiC counterparts (815 mV). 相似文献
44.
We have grown high quality epitaxial TiN/Si(100) and Cu/TiN/Si(100) heterostructures by pulsed laser deposition. The epitaxial
TiN films have the same low (15 μΩ-cm) resistivity as TiSi2 (C-54) phase with excellent diffusion barrier properties. In addition, Schottky barrier height of TiN was close to that of
TiSi2 (0.6-0.7 eV). Auger and Raman spectroscopy revealed that the films were stoichiometric TiN and free from oxygen impurities.
The x-ray diffraction and transmission electron microscope (TEM) results showed that the TiN films deposited at 600°C were
single crystal in nature with epitaxial relationship TiN|| Si. The Rutherford baskscattering channeling yield for TiN films
was found to be in the range of 10–13%. The epitaxy of Cu on TiN was found to be cube-on-cube, i.e., Cull<100>TiN||Si. The
Cu/TiN and TiN/Si interfaces were found to be quite sharp without any indication of interfacial reaction. The growth mechanism
of copper on TiN was found to be three-dimensional. We discuss domain matching epitaxy as a mechanism of growth in these large
lattice mismatch systems, where three lattice constants of Si(5.43?) match with four of TiN(4.24?) and seven units of Cu(3.62?)
match with six of the TiN. Thus, for next generation of device complementary metal oxide semiconductor structures, Cu/TiN/Si(100)
contacts hold considerable promise, particularly since Cu is a low resistivity metal (1.6 μΩ-cm) and is considerably more
resistant to electromigration than Al. The implications of these results in the fabrication of advanced microelectronic devices
are discussed. 相似文献
45.
125 MW 机高压前轴封漏汽量的测量计算及中压缸效率核算 总被引:2,自引:1,他引:2
介绍了莱芜电厂2号机改造后高压前轴封漏汽量测量原理和方法,计算出高压前轴封漏汽量,并代入热力性能试验计算过程中,核算了除掉轴封漏汽量影响的中压缸效率。此计算方法和图表普遍适用于125MW机组高压前轴封漏汽量的计算。 相似文献
46.
简要叙述了莱芜电厂2号机通流部分节能改造和改造前后的热力性能考核试验。根据改造前试验结果,分析了机组经济性差的原因。对比改造前后试验结果,分析了改造效果。 相似文献
47.
为了研究X100钢级埋弧焊焊管不同区域的局部和整体拉伸行为的差异,通过拉伸试验比较了焊管不同区域的强度和延性性能,分析了其断裂行为及马氏体-奥氏体(M-A)对局部拉伸性能的影响,并结合显微组织、硬度试验及拉伸试验,分析焊后及再加热后热影响区的性能。结果表明,相比埋弧焊第2道焊道,焊道重叠区的热影响区表现出更高的屈服强度、抗拉强度、硬度、应变硬化和整体延性;焊道2和热影响区重叠区的断裂均发生在细晶热影响区(FGHAZ)处,重叠区FGHAZ中较高的M-A分数和较小颗粒间距促进了弥散强化,从而使该区域的强度更高;尽管重叠区试样的FGHAZ表现出比焊道2 FGHAZ高的整体应变,但其局部应变相对更低。 相似文献
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