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91.
92.
钛合金的银脆,镉脆敏感性及其控制 总被引:4,自引:0,他引:4
利用慢应变速率拉伸技术(SSRT),并结合恒载实验,较全面地研究了Ti-6Al-4V合金的银脆行为、固态与液态镉脆行为,确定了应变速率、接触条件、热处理制度、试样取向、温度等因素对Ti-6Al-4V合金银脆与镉脆敏感性的影响,探讨了Ni阻挡层对控制Ti-6Al-4V合金和TC11合金银脆开裂的作用。 相似文献
93.
本文简单地回顾了提高VLSI测试效率所采用的一些手段,讨论了在ASIC测试问题研究中出现的一些新观点、新方法、新动向,以及所取得的成果。在此基础上,文章阐明了ASIC测试技术的发展方向,并着重论述了可望在未来得到发展的,针对ASIC的功能测试方法。 相似文献
94.
研究了以 1 ,4-萘醌为原料 ,通过溴代、氰化和 O-烷基化三步合成 1 ,4-二烷氧基萘 -2 ,3 -二甲腈。在溴代反应中以溴化试剂代替液溴 ;在氰化和 O-烷基化反应中以溴化十二烷基三甲基铵 (DTMAB)和聚乙二醇(PEG)作为相转移催化剂 ,并采用正交设计法考察了相转移催化剂、固体碱、反应温度等因素对反应的影响 ,其中氰化产物收率达 88.7%。 相似文献
95.
96.
In this article we propose efficient scan path and BIST schemes for RAMs. Tools for automatic generation of these schemes have been implemented. They reduce the design effort and thus allow the designer to select the more appropriate scheme with respect to various constraints. 相似文献
97.
When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901. 相似文献
98.
Yasuhiro Kobayashi Toshiyuki Sawa Toshiyuki Furukawa Shigeru Kawamoto 《Electrical Engineering in Japan》2002,138(2):49-58
This paper describes a load dispatch method which minimizes power cost—[fuel cost]/[electric output]—for a power system with thermal plants and energy storage facilities. The proposed method employs fractional programming to convert a minimization problem with fractional objective function to a series of quadratic minimization problems, and semidefinite programming to solve converted problems. The method provides the optimum time‐dependent power output/input and storage level of energy storage facilities as well as time‐dependent power output of thermal plants. The method has been applied to a power system with five thermal plants, two energy storage facilities of various performances, and five load demands. The optimum load scheme of four time mesh points is obtained for the thermal plants and energy storage facilities. The fractional programming successfully converges the optimal scheme through a few iterations. The semidefinite programming deals with a variable matrix of 164 dimensions, and 185 inequality constraints. © 2001 Scripta Technica, Electr Eng Jpn, 138(2): 49–58, 2002 相似文献
99.
Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test. 相似文献
100.
This paper presents observations regarding the cracking behavior of tensile-loaded structural adhesive joints. Experiments showed that fracture occurred by the development and propagation of a damage zone, rather than a single, sharp crack, and that the presence of the adhesive spew fillet did not affect the fracture load of the adhesive joints studied. For joints bonded with the mineral-filled epoxy Cybond 4523GB (American Cyanamid), there was approximately 5 mm of subcritical crack propagation prior to final fracture. Fracture-load predictions based on the initial uncracked geometry made in previous papers were unaffected by this small change in geometry. For joints bonded with the rubber-toughened epoxy Permabond ESP 310, approximately 50 mm of subcritical crack propagation was observed. It was again found that predictions made in previous papers on the basis of the initial geometry gave a good estimate of the final fracture load even though this subcritical crack propagation significantly altered the geometry, and thus the applied energy release rates. The effect of shear deformations of the adherends was also investigated, and it was found that shear deformations could be neglected in engineering calculations for joints subject to remote tensile loading. 相似文献