一起二次回路接线错误引发的事故分析

通过一起由二次回路接线错误引发的事故分析,阐述二次回路的重要性。从设计、安装、调试和管理上对二次回路进行探讨,提出反事故措施和对策,以防止类似事故的发生。     

An investigation of the relation between the temperature dependences of the initial unbalance and the output signal of resistance strain sensor bridge circuits

The relation between the initial unbalance and the output signal of bridge circuits when acted upon simultaneously by the physical factor being measured and the temperature of the surroundings when the bridge is supplied from a voltage or current source is investigated. Analytic relations are obtained which explain the temperature dependence of the useful output voltage under external physical action. __________ Translated from Izmeritel’naya Tekhnika, No. 1, pp. 48–49, 2007.     

微波电路互联与制造技术

介绍微波电路CAD与优化、微波集成电路及其制造、微波互联材料与工艺、微波MEMS等微波电路互联与制造新工艺、新技术的国内外研究和发展动态。     

时序电路逻辑初始化问题研究

讨论同步时序电路初始化问题,提出了一种基于电路存储元件逻辑定级和可控性分析的同步时序电路逻辑初始化方法。同时也给出了针对ISCAS89电路的一些实验结果。     

DLL23XA双侧向测井仪的研制

以往双侧向测井仪动态范围小，测量精度低，为此开发了DLL23XA双侧向测井仪。该仪器主要单元采用厚膜电路，稳定性、一致性好；深、浅屏流源采用可变功率控制，提高了仪器的动态范围。仪器采用3506P例进行数据传输，可方便地配接各种地面系统。     

X441对数放大器的原理及其应用

本文主要介绍X441单片对数放大器的基本原理和应用,并列举了一些具体应用电路。     

一种提高微电路外壳使用可靠性的方法

简要分析了白瓷双列直插外壳的失效模式和失效机理，并进行了模拟实验，通过对实验结果的分析，提出对成品微电路进行二次电镀能够提高其外壳的使用可靠性。     

混合集成电路激光功能调值技术

本文提出了激光功能微调技术在高精度混合集成电路上的应用，讨论了关键技术问题，并以实例具体说明。该技术的应用为研制高精度混合集成电路开辟了新途径。     

冷轧厂酸洗机组3号横剪大流量中高压液压系统设计方案探讨

在宝钢２０３０ｍｍ冷轧厂酸洗机组中，为了满足厚规格ＩＦ钢的生产，拟将原有的气动式剪切机改成液压式剪切机。为此，设计了一套中高压大流量的液压系统以满足３号横剪大剪切力（最高达７００ｋＮ）和快速剪切（３秒／次）的需要。由于采用了蓄能器增速回路和二通插装阀控制技术，使该液压系统较传统的剪切机液压系统具有响应速度快、体积小、重量轻、发热少和降低电机能耗等优点。     

Partial scan design and test sequence generation based on reduced scan shift method

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously proposed for generating short test sequences for full scan circuits. In the reduced scan shift method, one determines proch FFs must be controlled and observed for each test vector. According to the results of similar analysis, PARES selects these FFs that must be controlled or observed for a large number of test vectors, as scanned FFs. Short test sequences are generated by reducing scan shift operations using a static test compaction method. To minimize the loss of fault coverage, the order of test vectors is so determined that the unscanned FFs are in the state required by the next test vector. If there are any faults undetected yet by a test sequence derived from the test vectors, then PARES uses a sequential circuit test generator to detect the faults. Experimental results for ISCAS'89 benchmark circuits are given to demonstrate the effectiveness of PARES.