B和C对铸造TiAl基合金宏观和显微组织的影响

对比研究了B和C含量的变化对铸造TiAl基合金宏观和显微组织的影响。结果表明 ，B或C含量的增加均能细化TiAl基合金的晶粒，但二者的作用特点不同。B含量对宏观组织和晶粒尺寸的影响是渐进的，而C对其影响存在一个临界含量。显微观察表明，微量的B就能使合金析出TiB2，随着合金中B含量的增加，硼化物颗粒呈不同的形貌。对于含C合金，当C含量低于临界含量时，在光学尺度上观察不到碳化物相，而当C含量高于临界含量时，合金中生成大量的Ti2AlC碳化物颗粒。讨论了B和C细化TiAl基合金的机制。     

纳米晶体Ni－P合金晶粒微观结构的研究

采用非晶晶化法制备出晶粒尺寸不同的Ｎｉ－Ｐ合金复相纳米晶体样品。利用Ｘ射线衍射技术分别对样品中Ｎｉ固溶体和Ｎｉ_３Ｐ的晶格参数随晶粒尺寸的变化进行了测试，发现在Ｎｉ固溶体纳米相中Ｐ的固溶浓度增大，约为平衡固溶度的１０－１５倍，形成超过饱和固溶晶格结构；在Ｎｉ_３Ｐ化合物纳米相中空位浓度增加导致晶格畸变发生，而且随晶粒尺寸减小晶格畸变程度增大。     

多用炉处理圆锥外圈的畸变分析

研究了影响多用炉处理全淬透钢圆锥外圈畸变的因素，并对淬火后工件的锥度变化进行了分析，采用热油淬火和低速搅拌等措施，减少了圆锥外圈的淬火畸变。     

Difference in electron- and gamma-irradiation effects on output characteristic of color CMOS digital image sensors

Changes of the average brightness and non-uniformity of dark output images, and quality of pictures captured under natural lighting for the color CMOS digital image sensors irradiated at different electron doses have been studied in comparison to those from the γ-irradiated sensors. For the electron-irradiated sensors, the non-uniformity increases obviously and a small bright region on the dark image appears at the dose of 0.4 kGy. The average brightness increases at 0.4 kGy, increases sharply at 0.5 kGy. The picture is very blurry only at 0.6 kGy, showing the sensor undergoes severe performance degradation. Electron radiation damage is much more severe than γ radiation damage for the CMOS image sensors. A possible explanation is presented in this paper,     

异型薄壁零件淬火畸变的控制

分析了异型薄壁零件淬火废品率高的主要原因。采取改进工艺、工装设计及淬火后校正3方面措施，有效控制了该零件的淬火畸变，显著降低了零件淬火的废品率。     

Process parameter optimization of lap joint fillet weld based on FEM–RSM–GA integration technique

This study introduces a welding process design tool to determine optimal arc welding process parameters based on Finite Element Method (FEM), Response Surface Method (RSM) and Genetic Algorithms (GA). Here, a sequentially integrated FEM–RSM–GA framework has been developed and implemented to reduce the weld induced distortion in the final welded structure. It efficiently incorporates finite element based numerical welding simulations to investigate the desired responses and the effect of design variables without expensive trial experiments. To demonstrate the effectiveness of the proposed methodology, a lap joint fillet weld specimen has been used in this paper. Four process parameters namely arc voltage, input current, welding speed and welding direction have been optimized to minimize the distortion of the structure. The optimization results revealed the effectiveness of the methodology for welding process design with reduced cost and time.     

基于双导频信号外调制射频光传输技术的研究

M-Z LiNbO₃外调制器最佳偏置点的控制是外调制射频光传输设备中的核心技术。提出了一种新型的基于双导频信号的自动偏置控制方案,先引入双导频信号,并将其送入外调制器,再把调制后的二次分量作为误差信号进行反馈,实现最佳偏置点的自动跟踪和控制。此方案能有效提高外调制器偏置点控制精度,抑制外调制射频光传输信号的偶次非线性失真。该技术现已成功应用于外调制射频光传输模块。     

基于IACPSO算法的摄像机镜头畸变校正

针对摄像机镜头畸变的非线性问题,提出一种基于改进的混沌变异自适应双粒子群优化(IACPSO)算法的畸变校正方法.IACPSO算法用两个独立的粒子群进行协同优化:种群一采用固定的惯性权重,同时利用立方映射混沌因子对进化过程中出现的停滞粒子进行扰动;种群二采用自适应的惯性权重,以适应度值为依据来动态调整惯性权重的大小,取两个种群进化过程中发现的最优粒子作为全局最优解.为了验证IACPSO算法在镜头畸变校正问题上的性能,将其与多种粒子群优化算法进行对比.仿真实验结果表明,IACPSO算法在求解过程中具有较强的鲁棒性,在低噪声下,其校正性能优于其他粒子群算法.最后,运用两组校正实例进一步验证所提出方法的有效性.     

GNSS工程控制网坐标系挂靠问题探讨

分析了工程测绘中出现投影变形的原因及消除投影变形的常用方法。论述了挂靠坐标系的建立方法和应用条件,挂靠坐标系既能有效抵偿基线投影变形,又能解决两种坐标系统的衔接问题,为控制网计算、地形图测绘、工程图与万分图拼接、施工测绘提供了极大的便利。     

Towards high accuracy calibration of electron backscatter diffraction systems

For precise orientation and strain measurements, advanced Electron Backscatter Diffraction (EBSD) techniques require both accurate calibration and reproducible measurement of the system geometry. In many cases the pattern centre (PC) needs to be determined to sub-pixel accuracy. The mechanical insertion/retraction, through the Scanning Electron Microscope (SEM) chamber wall, of the electron sensitive part of modern EBSD detectors also causes alignment and positioning problems and requires frequent monitoring of the PC. Optical alignment and lens distortion issues within the scintillator, lens and charge-coupled device (CCD) camera combination of an EBSD detector need accurate measurement for each individual EBSD system.This paper highlights and quantifies these issues and demonstrates the determination of the pattern centre using a novel shadow-casting technique with a precision of ∼10 μm or ∼1/3 CCD pixel.