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71.
生产电子工业用高纯氮的制氮装置 ,其要点和难点是一氧化碳和氢的清除。采用一氧化碳转换炉和特殊的冷箱内流程组织 ,可以生产纯度为 99 9999%以上的高纯氮。对制取电子工业用高纯氮制氮装置与常规制氮装置加氮终端净化器两种流程进行了比较。 相似文献
72.
73.
74.
Frank J. Owens 《Materials Letters》2007,61(10):1997-1999
Molecular orbital calculations of the ionization potential of single wall carbon nanotubes having donor NH2 and acceptor NO2 groups bonded to the side walls and ends and boron and nitrogen substituted for carbon show substantial increases in ionization potential compared to carbon nanotubes with no functional groups and no carbon substitutions. The presence of a carbon vacancy on the side wall also causes a substantial increase in the ionization potential. The effect of tube length on the ionization energy is also calculated. The calculations also suggest that at appropriate levels of boron and nitrogen doping the armchair carbon nanotubes could be high temperature organic ferromagnetic materials. 相似文献
75.
Veena Misra Xiaoli Xu Brian E. Hornung Richard T. Kuehn Donald S. Miles John R. Hauser Jimmie J. Wortman 《Journal of Electronic Materials》1996,25(3):527-535
In the present study, we have performed electrical characterization of oxides deposited via rapid thermal chemical vapor deposition using SiH4 and N2O. We have investigated the effect of temperature, pressure, and SiH4 to N2O ratio on the electrical and material properties of as-deposited films. We have found that as-deposited oxides deposited at low temperatures, low pressures, and with a low silane to nitrous oxide ratio of ~0.5% give good material and electrical properties. The as-deposited films are stoichiometric in nature and have high deposition rates. As-deposited films had very low Dit values, high breakdown fields, and excellent subthreshold swing. The leakage currents and metal oxide semiconductor field effect transistor current drive, although lower than thermal oxides, were found to be quite acceptable. We have also investigated the thickness dependence of the films and found that as the film thickness is reduced below 50Å, the reliability improves for all oxides including the silicon-rich deposited oxides. 相似文献
76.
Zakaria Chajar Michel Primet Hélène Praliaud Michèle Chevrier Catherine Gauthier Frédéric Mathis 《Catalysis Letters》1994,28(1):33-40
The role of nitrogen dioxide in the selective reduction of NO by propane over a Cu-MFI zeolite is investigated. NO2 and NO reductions were carried out under similar conditions of reaction. In the presence of oxygen, the reduction of NO by C3H8 does not differ significantly from that of NO2. In the absence of oxygen, the reduction of NO2 by propane occurs with a partial decomposition of the nitric dioxide molecule. Such a decomposition leads to the formation of oxygen, which is responsible for the increase in catalytic activity by comparison with the same reaction performed with NO. NO2 formed and released in the gas phase during the reduction of NO by propane in the presence of oxygen does not play a predominant role in the catalytic process. 相似文献
77.
R. Niebuhr K. H. Bachem U. Kaufmann M. Maier C. Merz B. Santic P. Schlotter H. Jürgensen 《Journal of Electronic Materials》1997,26(10):1127-1130
Oxygen doped GaN has been grown by metalorganic chemical vapor deposition using N2O as oxygen dopant source. The layers were deposited on 2″ sapphire substrates from trimethylgallium and especially dried
ammonia using nitrogen (N2) as carrier gas. Prior to the growth of the films, an AIN nucleation layer with a thickness of about 300? was grown using
trimethylaluminum. The films were deposited at 1085°C at a growth rate of 1.0 μm/h and showed a specular, mirrorlike surface.
Not intentionally doped layers have high resistivity (>20 kW/square). The gas phase concentration of the N2O was varied between 25 and 400 ppm with respect to the total gas volume. The doped layers were n-type with carrier concentrations
in the range of 4×1016 cm−3 to 4×1018 cm−3 as measured by Hall effect. The observed carrier concentration increased with increasing N2O concentration. Low temperature photoluminescence experiments performed on the doped layers revealed besides free A and B
exciton emission an exciton bound to a shallow donor. With increasing N2O concentration in the gas phase, the intensity of the donor bound exciton increased relative to that of the free excitons.
These observations indicate that oxygen behaves as a shallow donor in GaN. This interpretation is supported by covalent radius
and electronegativity arguments. 相似文献
78.
The equilibrium reaction 3'(Fe, Co)O'( ss ) +1/2O2 ( g ) ⇄ (Fe, Co)3 O4 ( ss ) was studied in the temperature range 970 to 1370 K for seven different total compositions of molar ratios 0.5 < Fe/(Fe + Co) ≤ 1.0. The equilibrium pressures of oxygen were determined by using galvanic cells incorporating calcia stabilized zirconia as solid electrolyte and the Fe/Co ratios in the solid-solution phases by wavelength dispersive spectrometry microprobe analyses. The activities of 'FeO' in the cobaltowüstite phase were then derived from the experimental results obtained. 相似文献
79.
Solomon Sundar Manoharan Swati Sigamani John Prasanna Manju Lata Rao Ranjan Kumar Sahu 《Journal of the American Ceramic Society》2002,85(10):2469-2471
Interaction of electromagnetic radiation with a physical mixture of metal nitrates and amides/hydrazides is observed to initiate high-temperature reactions, useful for realizing several high-temperature ceramic materials. A judicious choice of such redox mixtures undergoes exothermic reactions when they couple with microwave radiation. The coupling of electromagnetic radiation with metal salts and amides/hydrazides depends on the dielectric properties of the individual components in the reaction mixture. The approach has been used to prepare γ-Fe2 O3 , Fe3 O4 , MgCr2 O4 , α-CaCr2 O4 , and La0.7 Ba0.3 MnO3 . 相似文献
80.
Vacuum deposited MoO3-V2O5 films of different molar concentrations have been used for DC electrical conductivity studies at different temperatures.
The optical absorption spectra of MoO3-V2O5 films of different molar concentrations have been measured. From these measurements it is found that optical band gap and
activation energy vary with molar concentration of MoO3-V2O5 films. 相似文献