A New Approach for Built‐in Self‐Test of 4.5 to 5.5 GHz Low‐Noise Amplifiers

This paper presents a low‐cost RF parameter estimation technique using a new RF built‐in self‐test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using 0.18 μm SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.     

Fatigue limit evaluation of notches,small cracks and defects: an engineering approach

In this paper, the average stress method for the fatigue limit evaluation of stress raising geometrical features is revised and extended. In particular, an analytical close‐form approach was used and the linear elastic stress equations were modified by taking into account the effect of nominal stress on the local stress distribution. Hence, the average tangential stress was correctly evaluated over a distance of 2a₀, where a₀ was El Haddad's short crack constant, for long and small notches as well as for crack‐like notches. When this model is applied to a wide range of geometrical features subjected to mode I fatigue loading, the classical shape of the curves of the Kitagawa–Takahashi diagram was obtained for changes in crack‐like notch size. Similarly, notch sensitivity was estimated by reducing the notch tip radius. The accuracy of the proposed method in predicting fatigue limits was then checked by using experimental data taken from the literature and generated on testing specimens weakened by rounded and sharp notches as well as by small artificial defects.     

邻—(4—乙基苯甲酰基)苯甲酸的研究

本文阐述了通过Friedel-Crafts反应合成邻-(4-乙基苯甲酰基)苯甲酸的方法.研究了影响产物质量的因素,提出了适宜的工艺条件.     

Gamma ray irradiation induced point defects in BaF2

There are some original nonmagnetic point defects in the BaF2 crystallite powder,such as interstitial and vacant F^- which can become paramagnetic centers by γ-ray-irradiation at room temperature,Afterγ-ray irradiation the paramagnetic point defects Vk,H,F and M centers,have been observed in the sample with experiment of electron spin resonance(ESR).Frenkel exciton,a nonmagnetic point defect,can also be induced by the γ-ray irradiation in the sample at room temperature,the existence of the Frenkel exciton is affirmed by an anomalous change of the ESR signal of Vk center with temperature,The signals of the ESR of the H,F and M centers weaken and vanish with the temperature increasing monotonously,But the ESR signal of the Vk enhances when the temperature goes up about 127℃,then weakens and vanishes.An increase in the Vk center follows an annihilation of the Frenkel exciton with heating.     

BEM 系列原油流动性改进剂的应用

对BEM系列原油流动性改进剂的基本原理以及在中洛、濮临、东临、东黄、鲁宁、魏荆等几条原油长输管道工业应用的现场测试情况进行了介绍。结果表明，BEM系列原油流动性改进剂在降低原油凝点和粘度方面性能良好，能满足管道安全，平稳运行的要求。     

中厚板表面质量分析

在对济钢中厚板各种表面缺陷产生原因和几率进行综合分析的基础上 ,将缺陷分为 3类 :A类(折叠、麻点、划伤等 )、B类 (夹杂、结疤、分层 )、C类 (裂纹 ) ,重点对裂纹缺陷进行探讨 ,并提出了相应的改进措施。     

一种有效的优化的多载波通信系统的功率分配算法

本文提出一种关于DMT系统传输纯数据流业务的最佳的功率分配算法，该算法使用了一种有效的表格查手工艺工和拉格朗日乘法器对分搜索办法，能够较快的收敛到最佳的功率点。同时，易于用硬件和软件实现。     

三维施工中SN388炮点表的设置

本文提供了SN388在三维施工中炮点表的几种设置方法，并进行了相应的对比说明，最后给出了改进炮点表设置的有关设想。     

Thermodynamic modeling of native point defects and dopants of GaN semiconductors

A thermodynamic modeling of GaN was carried out to describe the thermodynamic behavior of native defects, dopants, and carriers (free electrons and holes) in GaN semiconductors. The compound energy model (CEM) was used. An unintentionally doped GaN was taken as an example. Oxygen was introduced into the model as the unintentionally doped impurity, according to the practical experimental phenomena. The energies of component compounds in the model were defined based on the results of the ab initio calculations and adjusted to fit experimental data. The thermodynamic properties of the defects and the oxygen doped were calculated to show the facility of the model.     

Display reflectance: Basics,measurement, and rating

Abstract— In this paper, methods and instruments for measurement and evaluation of reflection characteristics are reviewed as needed for research and development of electronic displays and for material and surface modeling with ray‐tracing and rendering software packages. Contrast under ambient illumination and recognizability under daylight illumination are prime development targets in the electronic‐display field, while computation and synthesis of realistic scenes and objects are pushing the need for physical data in computer graphics applications. Three categories of instruments are available for detailed reflection analysis. They are based on (1) gonioscopic (mechanical) and conoscopic (optical) directional scanning, (2) imaging approaches, and (3) on arrangements with variable source or receiver aperture. The capabilities, advantages, and limitations of these methods are introduced and discussed in order to facilitate appropriate selection of methods and instruments. For illustration purposes we present typical results obtained from commercial electronic display screens. A basis for continued widespread implementation and standardization of reflection metrology as required for objective rating and comparison of electronic‐display screen performance under ambient illumination is provided.