陶瓷及陶瓷基复合材料微缺陷的超声检测

为研究陶瓷及陶瓷基复合材料微缺陷的超声检测能力，针对一些人工缺陷试样进行了超声检测试验。试验主要采用了纵波垂直入射法和泄漏瑞利波法。通过试验结果，比较了两种方法的检测能力。     

软件集成测试技术研究

首先分析了集成测试的原理和特点，并指出了集成测试的重要性。然后结合传统软件与面向对象软件开发的方法和技术，详细介绍了传统软件的集成测试方法和策略，并深入分析了面向对象软件集成测试的原理和方法。     

数值试井在白6-2井测试资料分析评价中的应用

数值试井是在近来发展的一项新的试井解释技术，具有处理非均质，复杂边界油气藏问题的优点，弥补了常规解析试井技术的不足。运用数值试井解释技术，结合动、静态资料，通过对白6-1断块白6-2井测试资料的综合分析评价，确定了储层渗流参数，落实了该气藏的边界情况，为该断块下一步开发提供可靠依据。     

复合材料手动扫描超声特征成像检测

研究了复合材料手动扫描超声特征成像检测，通过对超声检测信号的全波列采集与处理，实现了A，B，C扫描成像；相位特征成像；当量特征成像；超声层析技术和超声频谱分析技术。该系统已经在复合材料的检测上得到了良好的应用。     

Test Case Generation as an AI Planning Problem

While Artificial Intelligence techniques have been applied to a variety of software engineering applications, the area of automated software testing remains largely unexplored. Yet, test cases for certain types of systems (e.g., those with command language interfaces and transaction based systems) are similar to plans. We have exploited this similarity by constructing an automated test case generator with an AI planning system at its core. We compared the functionality and output of two systems, one based on Software Engineering techniques and the other on planning, for a real application: the StorageTek robot tape library command language. From this, we showed that AI planning is a viable technique for test case generation and that the two approaches are complementary in their capabilities.     

埋地管道涂层检测技术现状

文章对各种埋地管道涂层检测技术进行了综述,并指出了各种技术的优缺点及应用前景.     

超声波车辆车轴探头的研制与应用

提出了一种用于检测在役车辆车轴产生疲劳裂纹的超声波方法,设计了中心孔探头与斜角探头一起,完成了对车辆车轴的关键区域探伤。     

地地战术导弹飞行可靠性指标评定方法

在小子样情况下 ,利用系统和分系统试验数据对导弹的飞行可靠性指标进行评定 ,从数学上说是系统可靠性综合问题 .运用MML SR方法对新型号地地战术导弹的飞行可靠性指标进行评定 ,避免了MML方法在遇到无失败单元时不适用的缺陷 ,在利用地面试验信息方面有其明显优势 ;运用Bayes方法对改进型导弹的飞行可靠性指标进行评定 ,将不同试验阶段的多源试验信息作为验前信息 ,扩大了信息量 .最后 ,对两种方法在工程应用上遇到的问题进行了讨论 ,并给出了解决方法 .     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.     

可靠性试验样本量和截尾时间的计算

可靠性寿命试验中，一般都因受到费用和时间的限制，因此要用截尾试验获得信息，再据此对其可靠性进行统计推断，用非参数估计的方法探讨了进行可靠性试验的样本量或截尾时间的估计方法。