隔离开关二次回路防误闭锁改造与应用

分析泉州电业局220kV老式变电站原隔离开关二次防误闭锁回路存在的隐患,针对改造前存在的安全问题,提出了改造措施。     

一种NTC热敏电阻校正方程的试验研究

为了校正NTC热敏电阻的校正方程,提高测温精度。通过对传统的指数方程进行线性变换,得到一种新的NTC热敏电阻温度计R-T特性关系,对此关系进行多阶最小二乘拟合,利用误差评判原理,确定最适合的NTC热敏电阻的校正方程。并且实际验证了此校正方程的测温精度可以满足更高精度要求的需要。     

针对语音变换的语音篡改检测

针对使用语音变换技术的语音篡改,提出一种自动检测方法。在分析语音变换基本模型和变换语音失真的基础上,提取语音信号的声道参数以及相关的信号统计量,并通过支持向量机递归特征消除法,选择出对语音变换比较敏感的特征作为分类特征,使用支持向量机进行语音变换检测和变换语音的说话人性别判别。对于一种语音变换软件的实验结果表明,该方法具有较高的检测准确率,其中语音变换检测的平均准确率为94.90%,变换语音的说话人性别判别平均准确率为92.09%。     

基于科学工作流的组织层级比较分析

基于一个专门程序环境的科学工作流,对组织层级的比较分析进行了研究。结合科学工作流在s．P树变换与测度中的运用,为组织层级的比较分析提供了系统科学的处理办法：通过对不同组织层级之间的最小变换进行测度,为组织变革的代价提供一定程度的参考。     

基于AUPF的TDOA几何定位跟踪算法研究

使用无源时差（TDOA）定位技术确定无人机等小型辐射源目标的位置是当前研究的热点,针对时差定位算法较为复杂的实际情况,推导了时差双曲线的几何解,并提出了一种基于自适应无迹粒子滤波（AUPF）技术的移动目标定位跟踪方法。通过仿真对该方法在不同场景的应用效果进行了验证,进一步比较分析了算法的定位精度。结果表明,基于自适应无迹粒子滤波的时差几何定位跟踪算法可以在多种情况下较好地拟合出目标真实运动轨迹,实现对运动目标的定位跟踪,同时拥有更低的定位误差和更高的轨迹包容度,使用该方法可以显著提高对非合作移动辐射源目标的位置估计性能。     

Transformation of semantic knowledge into simulation-based decision support

Simulation is capable to cope with the uncertain and dynamic nature of industrial value chains. However, in-depth system expertise is inevitable for mapping objects and constraints from the real world to a virtual model. This knowledge-intensity leads to long development times of respective projects, which contradicts the need for timely decision support. Since more and more companies use industrial knowledge graphs and ontologies to foster their knowledge management, this paper proposes a framework on how to efficiently derive a simulation model from such semantic knowledge bases. As part of the approach, a novel Simulation Ontology provides a standardized meta-model for hybrid simulations. Its instantiation enables the user to come up with a fully parameterized formal simulation model. Newly developed Mapping Rules facilitate this process by providing guidance on how to turn knowledge from existing ontologies, which describe the system to be simulated, into instances of the Simulation Ontology. The framework is completed by a parsing procedure for an automated transformation of this conceptual model into an executable one. This novel modeling approach makes model development more efficient by reducing its complexity. It is validated in a use case implementation from semiconductor manufacturing, where cross-domain knowledge was required in order to model and simulate the impacts of the COVID-19 pandemic on a global supply chain network.     

煤矿监控图像增强算法的分析与实现

针对煤矿井下粉尘多、光照差的恶劣环境使得矿井监控图像偏暗、对比度低、视觉效果差的特点,提出了一种基于小波变换和模糊理论的图像增强算法。该算法选择小波变换为工具分解图像,应用新的模糊隶属度和增强算子对高频信息进行模糊处理,利用直方图均衡化对低频信息进行处理,最后对图像进行重构。处理结果较好地增强了图像细节信息,从整体上改善了图像效果。     

Higher-Order and Modal Logic as a Framework for Explanation-Based Generalization

Certain tasks, such as formal program development and theorem proving, fundamentally rely upon the manipulation of higher-order objects such as functions and predicates. Computing tools intended to assist in performing these tasks are at present inadequate in both the amount of knowledge they contain (i.e., the level of support they provide) and in their ability to learn (i.e., their capacity to enhance that support over time). The application of a relevant machine learning technique—explanation-based generalization (EBG)—has thus far been limited to first-order problem representations. We extend EBG to generalize higher-order values, thereby enabling its application to higher-order problem encodings.Logic programming provides a uniform framework in which all aspects of explanation-based generalization and learning may be defined and carried out. First-order Horn logics (e.g., Prolog) are not, however, well suited to higher-order applications. Instead, we employ Prolog, a higher-order logic programming language, as our basic framework for realizing higher-order EBG. In order to capture the distinction between domain theory and training instance upon which EBG relies, we extend Prolog with the necessity operator of modal logic. We develop a meta-interpreter realizing EBG for the extended language, Prolog, and provide examples of higher-order EBG.     

On problem transformability in VLSI

The two basic performance parameters that capture the complexity of any VLSI chip are the area of the chip,A, and the computation time,T. A systematic approach for establishing lower bounds onA is presented. This approach relatesA to the bisection flow, . A theory of problem transformation based on , which captures bothAT ² andA complexity, is developed. A fundamental problem, namely, element uniqueness, is chosen as a computational prototype. It is shown under general input/output protocol assumptions that any chip that decides ifn elements (each with (1+)lognbits) are unique must have =(nlogn), and thus, AT²=(n ²log² n), andA= (nlogn). A theory of VLSI transformability reveals the inherentAT ² andA complexity of a large class of related problems.This work was supported in part by the Semiconductor Research Corporation under contract RSCH 84-06-049-6.     

Electron beam deposition and characterization of thin film Ti-Ni for shape memory applications

Thin film of Ti-Ni alloy has a potential to perform the microactuation functions required in the microelectromechanical system (MEMS).It is essential, however, to have good uniformity in both chemical composition and thickness to realize its full potential as an active component of MEMS devices.Electron beam evaporation technique was employed in this study to fabricate the thin films of Ti-Ni alloy on different substrates.The targets used for the evaporation were first prepared by electron beam melting.The uniformity of composition and microstructure of the thin films were characterized by electron probe microanalysis (EPMA), Auger electron spectroscopy (AES), X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and transmission electron microscopy (TEM).The mechanical property of the thin films was evaluated by the nano-indentation test.The martensitic transformation temperature was measured by differential scanning calorimetry (DSC).It is confirmed that the chemical composition of deposited thin films is identical to that of the target materials.Furthermore, results from depth profiling of the chemical composition variation reveal that the electron beam evaporation process yields better compositional homogeneity than other conventional methods such as sputtering and thermal evaporation.Microstructural observation by TEM shows that nanometer size precipitates are preferentially distributed along the grain boundaries of a few micron size grains.The hardness and elastic modulus of thin films decreases with an increase in Ti contents.