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941.
942.
943.
Highly Fluorescent and Color‐Tunable Exciplex Emission from Poly(N‐vinylcarbazole) Film Containing Nanostructured Supramolecular Acceptors 下载免费PDF全文
Jong H. Kim Byeong‐Kwan An Seong‐Jun Yoon Sang Kyu Park Ji Eon Kwon Chang‐Keun Lim Soo Young Park 《Advanced functional materials》2014,24(19):2746-2753
Highly fluorescent excited‐state charge‐transfer complexes (exciplexes) formed at the interfacial region between a polymeric donor matrix, here, poly(N‐vinylcarbazole), and embedded nanostructured acceptors are characterized for their photophysical properties. Exciplex‐to‐exciton emission switching is observed after solvent vapor annealing (SVA) due to the size evolution of the nanostructures beyond the exciton diffusion length. Color‐tunable exiplex emission (sky blue, green, and orange) is demonstrated for three different nanostructured acceptors with the same HOMO–LUMO gap (i.e., the same blue excitonic emission) but with different electron affinity. White‐emitting poly(N‐vinylcarbazole) film is also fabricated, simply by incorporating mixed supramolecular acceptors, which provide independent exciplex emissions. This study presents important insights into the excited‐state intermolecular interaction at the well‐defined nanoscale interface and suggests an efficient way to obtain multicolored exciplex emissions. 相似文献
944.
Low‐cost printable field effect transistors (FETs) are typically associated with slow switching characteristics. Dynamic response of polymer field effect transistors (PFETs) is a manifestation of time scales involved in processes such as dielectric polarization, structural relaxation, and transport via disordered‐interfacial states. A range of dielectrics and semiconductors are studied to arrive at a parameter which serves as a figure of merit and quantifies the different processes contributing to the switching response. A cross‐over from transport limiting factors to dielectric limiting factors in the dynamics of PFETs is observed. The dielectric limited regime in the PFET dynamics is tapped in to explore high speed processes, and an enhancement of switching speed by three orders of magnitude (from 300 μs to 400 ns) is observed at channel lengths which can be accessed by low cost printing methods. The device structure utilizes polymer‐ferroelectrics (FE) as the dielectric layer and involves a fabrication‐procedure which assists in circumventing the slow dynamics within the bulk of FE. This method of enhancing the dynamic response of PFETs is universally applicable to all classes of disordered‐FE. 相似文献
945.
A Review of Three‐Dimensional Resistive Switching Cross‐Bar Array Memories from the Integration and Materials Property Points of View 下载免费PDF全文
Jun Yeong Seok Seul Ji Song Jung Ho Yoon Kyung Jean Yoon Tae Hyung Park Dae Eun Kwon Hyungkwang Lim Gun Hwan Kim Doo Seok Jeong Cheol Seong Hwang 《Advanced functional materials》2014,24(34):5316-5339
Issues in the circuitry, integration, and material properties of the two‐dimensional (2D) and three‐dimensional (3D) crossbar array (CBA)‐type resistance switching memories are described. Two important quantitative guidelines for the memory integration are provided with respect to the required numbers of signal wires and sneak current paths. The advantage of 3D CBAs over 2D CBAs (i.e., the decrease in effect memory cell size) can be exploited only under certain limited conditions due to the increased area and layout complexity of the periphery circuits. The sneak current problem can be mitigated by the adoption of different voltage application schemes and various selection devices. These have critical correlations, however, and depend on the involved types of resistance switching memory. The problem is quantitatively dealt with using the generalized equation for the overall resistance of the parasitic current paths. Atomic layer deposition is discussed in detail as the most feasible fabrication process of 3D CBAs because it can provide the device with the necessary conformality and atomic‐level accuracy in thickness control. Other subsidiary issues related to the line resistance, maximum available current, and fabrication technologies are also reviewed. Finally, a summary and outlook on various other applications of 3D CBAs are provided. 相似文献
946.
947.
948.
A single-stage flyback driving integrated circuit (IC) for light-emitting diodes (LEDs) is proposed. With an average primary-side current estimation and negative feedback networks, the driver operates in the boundary conduction mode (BCM), while the output current can be derived and regulated precisely. By means of a simple external resistor divider, a compensation voltage is produced on the ISEN pin during the turn-on period of the primary MOSFET to improve the line regulation performance. On the other hand, since the delay time between the time that the secondary diode current reaches zero and the turn-on time of the MOSFET can be automatically adjusted, the MOSFET can always turn on at the valley voltage even if the inductance of the primary winding varies with the output power, resulting in quasi-resonant switching for different primary inductances. The driving IC is fabricated in a Dongbu HiTek's 0.35μm bipolar-CMOS-DMOS process. An 18 W LED driver is finally built and tested. Results show that the driver has an average efficiency larger than 86%, a power factor larger than 0.97, and works under the universal input voltage (85-265 V) with the LED current variation within ±0.5%. 相似文献
949.
950.
基于硅基波导、十字状波导交叉和基于波导微环的光交换器件的损耗特性,对 Torus结构的芯片上光互连网络建立了损耗模型,利用该模型来对芯片上光互连网络进行光器件级、光路由器级和网络级的损耗特性分析,同时建立芯片上光互连网络损耗自动分析系统。依据该系统可以得到不同网络规模下的最大损耗,并分别分析了基于crossbar、cygnus和crux路由器的torus结构网络的损耗特性。可以得到,传输损耗随着网络规模的扩展而增加,最小的传输损耗出现在M=N时。同时,可以得到采用Crux路由器构成的芯片上光互连网络的传输损耗最小,小于Cygnus构成的芯片上光互连网络约5dB。 相似文献