单轴-平面W型复合锶铁氧体的制备及其吸波特性研究

用草酸盐共沉淀和微量掺杂法研制六角晶系W型Ni,Zn,Co,Al多元复合锶铁氧体，通过调节Ni2W同Co2W的摩尔比例，可使该种铁氧体易磁化方向从C单轴型向垂于C轴的平面型转化，控制置换锶铁氧体中部分Fe3 的微量掺杂Al3 ，可以调整4πMs值，提高磁晶各向异性场，测试分析了5种不同含Co量的W型复合锶铁氧体粉料涂层的吸波特性，发现其自然共振吸收峰随Co含量增加向低频方向偏移，最高吸收峰可达32．8dB，是适用于电子隐形技术的高品位的微波吸收剂。     

Effect of bismuth replacement at barium site in Y-Ba-Cu-O system

X-ray diffraction, electron paramagnetic resonance, microwave absorption and resistivity measurements were carried out on YBa_2−x Bi _x Cu₃O₇ (0≤x≤0·5) superconductors in order to study the effect of bismuth on the structural and superconducting properties. A decrease in sintering temperature increased the amount of impurity phase. Transition from an orthorhombic (superconducting) phase to tetragonal structure produced no significant change in EPR zero-field signal at liquid nitrogen temperature (LNT). The non-resonance signal height decreased on higher concentration of bismuth. Sintered YBa_2−x Bi _x Cu₃O₇ superconductor had a strong EPR zero-field signal at LNT. We have evaluated particle size from XRD and EPR studies. The average particle size was about 0·4μm.     

Al,Ga取代Bi：DyIG薄膜的磁和磁光特性的研究

本文报道用热分解法在玻璃衬底上制备了Ａｌ和Ｇａ取代的Ｂｉ：ＤＹＩＧ薄膜，对其磁和磁光特性做了详细研究．Ａｌ和Ｇａ取代的薄膜均可获得好的矩形比和高的矫顽力．对于Ｂｉ１．２Ｄｙ１．８Ｆｅ５－ｘＭＸＯ１２（Ｍ＝Ａ１，ＧＺ）薄膜，Ａ１和Ｇ２的最佳替代成份分别为１．０和Ｇ．７；最佳晶化温度分别为７００ｏ℃和６７５℃．在波长５１０ｎｍ附近，法拉第旋转角可达８°／ｕｍ左右．光学吸收和品质因子的研究结果表明，Ａｌ和Ｇａ取代能够影响光学吸收和品质因子，其中Ｇａ取代对光学吸收和品质因子的影响较大．     

飞行时间二次离子质谱--强有力的表面、界面和薄膜分析手段

二次离子质谱（Secondary ion mass spectrometry，简称SIMS）是一种对表面灵敏的质谱技术，建立在表面各种类型带正、负电荷原子或分子发射的基础上。用飞行时间（Time of flight，简称TOF）仪器对这些二次离子进行质量分析，能确保并行质量登录、高质量范围、高流通率下的高分辨和精确质量测定这些优异性能。配合细聚焦扫描一次离子束，可在优于1nm的高深度分辨和优于50nm的横向分辨本领下，实现对表面优于单层ppm(百万分之一）量级的极高检测灵敏度。当今TOF－SIMS已发展为一种成熟且完善的表面分析技术。极高的灵敏度，再加上即使对大分子及不易挥发性分子都独具的敏感性，使它成为很多高技术领域不可缺少的分析手段，这些领域包括微电子学、化学和材料科学以至纳米技术和生命科学等。本文简述了TOF－SIMS的原理、仪器及其多方面的应用和展望。     

Structural Description of Polyaromatic Nucleus in Residue

The proton nuclear magnetic resonance spectroscopy （1H-NMR）, the synchronous fluorescence spectrometry （SFS） and the ruthenium ions catalyzed oxidation （RICO） method were used to determine the chemical structure of polyaromatic nucleus in Oman residue fractions. The results of 1H-NMR analyses showed that the average numbers of aromatic rings in the aromatics, resins and asphaltenes units were 3.2, 5.6 and 8.2, respectively. SFS was used to investigate the distribution of aromatic rings in residue fractions, the main distribution range of aromatic rings in aromatics, resins and asphaltenes were 3 4 rings, 3--5 rings and more than 5 rings, respectively. The aromatic network in residue fractions was oxidized to produce numerous carboxylic acids. The types and content of benzenepolycarboxylic acids, such as phthalic acid, benzenetricarboxylic acids, benzenetetracarboxylic acids, benzenepentacarboxylic acid and benzenehexacarboxylic acid disclosed the condensed types of aromatic nuclei in the core. The biphenyl fraction （BIPH）, the cata-condensed fraction （CATA）, the peri-condensed fraction （PERI） and the condensed index （BCI） were calculated based on the benzenepolycarboxylic acids formed. The results implied that there was less biphenyl type structures in all residue fractions. The aromatics fraction was almost composed of the cata-condensed type system, and the asphaltenes fraction was wholly composed of the peri-condensed type system, while in the resins fraction co-existed the two types, herein the peri-con- densed type was predominant over the cata-condensed type. Based on the analytical results obtained in the study, the components --aromatics, resins and asphaltenes -- were given the likely structural models.     

新型涂料增稠剂的化学成分鉴定

本文用红外光谱法对一种新型涂料增稠剂进行了化学成分鉴定,其主要成分为羟丙基甲基纤维素与蒙脱土。     

Variations in Spectral Slope in Lake Taihu,a Large Subtropical Shallow Lake in China

Spectral slope (S), describing the exponential decrease of the absorption spectrum over a given wavelength range, is an important parameter in the study of of chromophoric dissolved organic matter (CDOM) dynamics, and also an essential input parameter in remote sensing models. Furthermore, S is often used as a proxy for CDOM composition, including the ratio of fulvic to humic acids and molecular weight. The relative broad range in S values reported in the literature can be explained by the different spectral ranges and fitting methods used. A single exponential model is used to fit the S values for 17 investigations involving 458 samples in Lake Taihu from January to October in 2004. The average S value was 15.18 ± 1.39 μm⁻¹ for the range of 280–500 nm, which fell within the range reported in the literature. The frequency distribution of S value basically obeyed a normal distribution. Significant differences in S values between summer and other seasons showed that phytoplankton degradation was one of the important sources of CDOM in summer, whereas CDOM mainly came from the river input in other seasons. Furthermore, the estimated S value decreased with increasing wavelength range used in regression. The maximum and minimum values derived from the regression were 17.89 ± 1.25 μm⁻¹ and 13.62 ± 2.11 μm⁻¹ for the wavelength ranges of 280–380 nm and 400–500 nm, respectively, a decrease of 23.9%. S values significantly decreased with the increase of CDOM absorption coefficients. CDOM absorption coefficients could be more appropriately estimated from exponential model introducing the variation of S with absorption coefficients, making them useful for a remote sensing bio-optical model of Lake Taihu. DOC-specific absorption coefficient a*(λ) and the parameter M describing molecular size of the humic molecules could also be used as a proxy for the sources and types of CDOM. A general relationship was found between S and a*(λ), and M values. S increased with the decrease of DOC-specific absorption coefficient and the increase of M corresponding to the decrease of molecular weight.     

火焰原子吸收法测定高铋物料中的铅

本文介绍了在以高铋物料为基体 ,5 %的HNO3 介质中 ,波长 2 17nm处进行火焰原子吸收法测定铅的试验 ,采用标准加入法进行回收率的试验 ,回收率大于 98% ,特征浓度为 0 .0 7μg/ml,结果令人满意 ,能满足炉前样分析的要求     

Use of a neural network to link AFM etch patterns to plasma parameters

Plasmas play a critical role in depositing thin films or etching fine patterns while manufacturing integrated circuits. A new model for plasma diagnosis is presented. This was accomplished by linking atomic force microscopy (AFM) to plasma parameters using a neural network. Experimental AFM data were collected during the etching of silicon oxynitride films in C₂F₆ inductively coupled plasma. Surface roughness of etched patterns was characterized by means of discrete wavelet transformation. This led to the construction of three vertical (type I), diagonal (type II), and horizontal (type III) wavelet coefficient-based models. The performance of diagnosis models was evaluated in terms of the prediction and recognition accuracies. Both accuracies were optimized as a function of the number of hidden neurons. Comparisons revealed that the type I model yielded the largest recognition and the smallest prediction error. This was demonstrated even under stricter monitoring conditions. More improved diagnosis is expected by enhancing AFM resolution.     

源气体流量比对F-DLC薄膜结构的影响

以高纯石墨作靶，CHF3/Ar作源气体采用反应磁控溅射法制备出了氟化类金刚石（F-DLC）薄膜。拉曼光谱表明，CHF3相对流量的增加会引起薄膜的D峰与G峰强度之比I（D）/I（G）减小，晶粒增大，芳香环结构出例下降。红外吸收光谱分析证实了这些推论，指出这是由于薄膜中氟含量上升的结果。