Electrochemical growth and characterization of iron doped cadmium sulfide thin films

Cadmium Sulfide and Ferrous doped Cadmium Sulfide thin films have been prepared on different substrates using an electrodeposition technique. Linear sweep voltammetric analysis has been carried out to determine deposition potential of the prepared films. X-ray diffraction analysis showed that the prepared films possess polycrystalline nature with hexagonal structure. Surface morphology and film composition have been analyzed using Scanning electron microscopy and Energy dispersive analysis by X-rays. Optical absorption analysis showed that the prepared films are found to exhibit Band gap value in the range between 2.3, 2.8 eV for Cadmium Sulfide and Ferrous doped Cadmium Sulfide.     

Growth modes of solution-grown CdS thin films

The growth modes of CdS thin films on glass in a chemical bath were analysed using scanning electron microscopy and optical microscopy. The results of these studies show that the film growth occurs by ion-by-ion condensation and by colloidal particles of CdS adhering to the substrate. Both mechanisms are operative from the initial stages of film growth. The predominance of one or other of these two growth modes depends on the abundance of Cd and S ions present in the solution, which is determined by the amount of complexing and sulphurising agents and ammonia used for the controlled release of Cd and S ions into the solution. The growth mode influences the optical properties of the films.     

Preparation and characterization of new window material CdS thin films at low substrate temperature (<300 K) with vacuum deposition

Low-temperature vacuum deposition instead of the commonly used vacuum deposition at high substrate temperatures has been applied to prepare new window material CdS thin films. The structural, optical and electrical properties of vacuum-evaporated CdS thin films were investigated as a function of substrate temperature (100–300 K) and the post-deposition annealing temperature (at 473, 573 and 673 K). It was determined that films deposited at all substrate temperatures were polycrystalline in nature with hexagonal structure and a strong (0 0 2) texture. The AFM and SEM studies showed that the microstructures of the as-deposited films agreed with the expectations from structure zone model. X-ray diffraction studies showed that the crystallinity of the CdS films was improved on annealing. Optical spectroscopy results of the films indicated that the optical band gap value increased from 2.40 to 2.42 eV with decreased substrate temperature. Increasing the annealing temperature sharpened the band edge. The dark resistivity increased from 4.5×10³ to 7.3×10³ Ω cm and the carrier concentration decreased from 4.7×10¹⁷ to 3.5×10¹⁵ cm⁻³ as the substrate temperature decreased from 300 to 100 K.     

Enhancement in the optical and electrical properties of CdS thin films through Ga and K co-doping

In the presented work, Ga-doped CdS and (Ga-K)-co-doped CdS thin films are grown on glass substrates at a temperature of 400 °C through spray pyrolysis. Influence of K-doping on structural, morphological, optical and electrical characteristics of CdS:Ga thin films are examined. K level is changed from 1 at% to 5 at% for CdS:Ga samples just as Ga concentration is fixed 2 at% for all CdS thin films. It is observed from the X-ray diffraction data that all the samples exhibit hexagonal structure and an increase level of K in Ga-doped CdS samples causes a degradation in the crystal quality. Energy-dispersive X-ray spectroscopy measurements illustrate that the best stoichiometric film is acquired when K content is 2 at% in Ga-doped CdS films. Optical transmission curves demonstrate that CdS:Ga thin films exhibit the best optical transparency in the visible range for 4 at% K content compared to other specimens. A widening in the optical bandgap is unveiled after K-dopings. It is obtained that maximum band gap value is found as 2.45 eV for 3 at%, 4 at% and 5 at%. K -dopings while Ga-doped CdS thin films display the band gap value of 2.43 eV. From photoluminescence measurements, the most intensified peak is observed in the deep level emission after incorporation of the 4 at% K atoms. As for electrical characterization results, the resistivity reduces and the carrier density improves with the increase of K concentration from 1 at% to 4 at%. Based on all the data, it can be deduced that 4 at% K-doped CdS:Ga thin films show the best optical and electrical behavior, which can be utilized for solar cell devices.     

Cu掺杂对ZnO量子点光致发光的影响

通过溶液法合成了Cu掺杂ZnO量子点。X射线衍射(XRD)和高分辨电子透射电镜(HRTEM)图像显示Cu掺杂ZnO量子点具有六角纤锌矿结构,晶粒大小为4～5nm。Cu掺杂抑制了ZnO量子点颗粒长大。室温光致发光(PL)谱观察到紫外带边和可见区两个发射峰。随着Cu掺杂浓度的增大,紫外荧光峰位发生缓慢红移,由366nm移到370nm;可见区发射峰位发生蓝移,由525nm移到495nm;同时,两个发射峰强度降低。光谱结果表明:Cu的掺入,一方面抑制表面与O空位有关的缺陷,在495nm出现了与Cu1+有关的发射峰;另一方面,Cu离子掺入ZnO量子点引入一些非辐射中心,降低了自由激子发射。     

ZnCdS films for solar cell and photodetector applications deposited by In Situ chemical doping of CdS with Zn

ZnCdS films were formed by in situ chemical doping of CdS with Zn in a chemical bath. The X-ray diffraction (XRD) patterns of CdS films after Zn doping showed a more disordered nature, consisting of reflections from Zn_0.049Cd_0.951S (JCPDS 40-834) as well as CdS greenockite (hexagonal, JCPDS 41-1049) and hawleyite (cubic, JCPDS 10-0454) phases. A comparison of the optical transmittance spectra for undoped and Zn-doped films showed that the cut-off wavelength was modified after Zn doping, indicating the presence of impurity states in the band gap. Zn-doped films showed an increase in dark conductivity after annealing at about 200°C. These films exhibit promising characteristics for application in solar cell and photodetector structures.     

Structural,optical, and photocatalytic properties of the spray deposited nanoporous CdS thin films; influence of copper doping,annealing, and deposition parameters

Nanoporous thin films of Cd_1−xCu_xS (0≤x≤0.06) were grown on a heated glass substrate employing a home-made spray pyrolysis technique. The influences of [Cu]/[Cd] and the annealing in the range 300–500 °C on the structural and morphological properties of the films were investigated by X-ray diffraction (XRD), Fourier transformation infrared spectroscopy (FTIR), field emission scanning electron microscope (FE-SEM) and atomic force microscopy (AFM). The influences of Cu doping ratio, solution flow rate, and the deposition time on the optical properties and photocatalytic activity of these films are also reported. The films are of polycrystalline nature and hexagonal structure. Increasing the Cu doping ratio and annealing temperature improve the (1 0 1) preferential orientation. The crystallite size is ranged from 23.82 to 32.11 nm. XRD and FTIR reveal the formation of CdO in the 6% Cu-doped CdS film annealed at 400 °C and in all films annealed at 500 °C. The pure CdS film is of a porous structure and the close-packing and porosity of the films increase with increasing Cu%. Also, the pore diameter can be controlled from 50 to 15 nm with the increase of Cu content. The films showed transmittance below 70%. The optical band gap of the films is decreased from 2.43 to 1.82 eV with increasing Cu% and flow rate/deposition time. Additionally, the refractive indices and dispersion parameters of the films are also affected by the deposition conditions. Cu doping enhanced the films' photostability as well as the photocatalytic removal of methylene blue (MB).     

Overcoming the poor short wavelength spectral response of CdS/CdTe photovoltaic modules via luminescence down‐shifting: ray‐tracing simulations

The short‐wavelength response of cadmium sulfide/cadmium telluride (CdS/CdTe) photovoltaic (PV) modules can be improved by the application of a luminescent down‐shifting (LDS) layer to the PV module. The LDS layer contains a mixture of fluorescent organic dyes that are able to absorb short‐wavelength light of λ < 540 nm, for which the PV module exhibited low external quantum efficiency (EQE), and re‐emit it at a longer wavelength (λ > 540 nm), where the solar cell EQE is high. Ray‐tracing simulations indicate that a mixed LDS layer containing three dyes could lead to an increase in the short‐circuit current density from J_sc = 19.8 mA/cm² to J_sc = 22.9 mA/cm² for a CdS/CdTe PV module. This corresponds to an increase in conversion efficiency from 9.6% to 11.2%. This indicates that a relative increase in the performance of a production CdS/CdTe PV module of nearly 17% can be expected via the application of LDS layers, possibly without any making any alterations to the solar cell itself. Copyright © 2006 John Wiley & Sons, Ltd.     

Electrospinning of P3HT-PEO-CdS fibers by solution method and their properties

Homogeneous composite fibers of poly(3-hexylthiophene) (P3HT)-polyethylene oxide (PEO)-Cadmium Sulfide (CdS) were manufactured by electrospinning technique using chloroform as solvent. The incorporation of CdS in the composite fibers was determined by SEM, FTIR and TGA techniques. SEM and confocal microscopy have been used to determine size, surface morphology and distribution of the fluorescence phase in the fibers. A morphology change in P3HT/PEO fibers was caused by the presence of CdS: porous morphology was obtained for low CdS concentration (3.8 wt% and less) and when the content of CdS nanoparticles is higher, they were concentrated at the center of the fibers. The photoluminescence response was modified with CdS inside the P3HT-PEO fibers. By XRD it was determined that the introduction of CdS nanoparticles in the P3HT-PEO fibers caused disorder in P3HT chains. The obtained composite fibers are promising materials for optic and electronic applications.     

On the influence of light on dislocation motion in compound semiconductors

The influence of light on dislocation motion and the associated flow stress is examined for CdS and (Hg_0.3Cd_0.7)Te semiconductors. For CdS, a large increase in flow stress is observed for slip on the basal planes during irradiation. In contrast, (Hg_0.3Cd_0.7)Te exhibits a smaller photoplastic effect with a time delay. Results of experiments on the effect of light, slip direction, strain rate, and temperature are presented with emphasis on CdS. Possible mechanisms of photoplasticity, along with methods of exploiting the photoplastic effect to reduce dislocation densities in semiconductor devices, are also discussed.