一个面向语义的解释器自动生成技术

本文给出从指称语义自动生成解释器后端的一种技术.解释器被表示成PASCAL_like形式.     

Partial scan design and test sequence generation based on reduced scan shift method

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously proposed for generating short test sequences for full scan circuits. In the reduced scan shift method, one determines proch FFs must be controlled and observed for each test vector. According to the results of similar analysis, PARES selects these FFs that must be controlled or observed for a large number of test vectors, as scanned FFs. Short test sequences are generated by reducing scan shift operations using a static test compaction method. To minimize the loss of fault coverage, the order of test vectors is so determined that the unscanned FFs are in the state required by the next test vector. If there are any faults undetected yet by a test sequence derived from the test vectors, then PARES uses a sequential circuit test generator to detect the faults. Experimental results for ISCAS'89 benchmark circuits are given to demonstrate the effectiveness of PARES.     

采用混合物作工质的J—T节流制冷机

报告了国内外采用混合物作工质的Ｊ一Ｔ节流制冷机的实验研究情况。理论计算的两个重要参数（等温节流效应和正常沸点）与这些实验的结果作了对比。另外，给出了工作在不同压力下的一种混合工质及纯氮的焓温图。从理论计算和实验的结果可以看出混合工质Ｊ一Ｔ节流制冷机比单纯工质的Ｊ一Ｔ节流制冷机有更大的制冷量和更高的热效率。     

Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.     

D-10D磨煤机润滑油系统加装冷却器

针对鄂州发电有限责任公司磨煤机夏季轴瓦温度高，容易诱发烧瓦问题，进行深入分析，提出了多种解决方案，对各方案的可操作性及利弊进行了对比，选出了最佳方案并进行了实验，取得了明显的效果。     

通用菜单系统—UMS

下拉菜单作为应用软件系统的用户界面已成为一种趋势。本文提供一种可以在UNIX和DOS操作系统环境下运行的通用菜单系统UMS（Universal Menu System)。文中对UMS中菜单的数据结构、菜单的用户描述、菜单系统程序的自动生成、菜单的初始化、菜单的实现技术和操作以及应用软件的耦合等技术问题都进行了详细的讨论。同时也指出了软件存在的问题。     

一种派生式与创成式相结合的CAPP系统

本文结合为某机械厂开发的实用计算机辅助工艺设计系统(JJCAPP),论述了一种兼有派生式和创成式特点的综合式工艺自动设计方法.     

通讯网的演进

在光纤高速传输技术、光交换与智能光网等与宽带接入、多媒体、3G等网络应用技术的推动下，建设基于IPv6协议的IP基础电信网成为可能。现在IP网正在朝着有序的、可管理的、有QoS保障的、可以支持各类业务的综合业务基础网演进。电信网也正在从网络接入层上、从长途网络层面上、从本地网络层面上、从固定网向含3G在内的移动网络等方面向支持IP技术及其综合业务的方面全面推进。     

催柴加氢装置分馏系统空冷改造方案的探讨

对催柴加氢装置分馏系统空冷存在的问题进行了剖析,认为两塔回流温度不能同时满足工艺需要的主要原因是2台空冷共用风机造成的,并对改造方案进行了比较。     

Determination of generation lifetime fromC-t transients under linear voltage ramp bias

When a linear voltage ramp is applied to the gate of a MOS capacitor, a capacitancetime (C-t) transient is observed. The MOS capacitor is biased into strong inversion before applying the voltage ramp in order to eliminate surface generation. FromC-t transient curve obtained experimentally the minority carrier generation lifetime in semiconductor can be determined. The experimental results show that for the same sample the lifetimes extracted fromC-t curves under varying voltage sweep rates are close each other, and they are consistent with the lifetimes extracted by saturation capacitance method.