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61.
Stress corrosion cracking (SCC) of α-brass in ammonia solution was studied under mode III loading. The results showed that SCC occurred on the principal stress planes where shear stresses are zero. No SCC occurred on the maximum shear stress plane. Ammonia concentration affected fracture behaviour. When the concentration was low, many cracks with spacing of 10–150 μm were found on 45 ° planes, i.e., the principal stress planes. When the concentration was high, the cracks on 45 ° planes were not clearly visible because of serious general corrosion. 相似文献
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Elastic-plastic analytical solution for centric crack loaded by two pairs of point shear forces in finite plate 总被引:2,自引:0,他引:2
1 Introduction A great number of cracks exist in metal materials. Their existence and interaction often lead to high stress concentration and become the source of weakening and failure of metal materials[1- 4]. The elastic-plastic analysis for a cracked p… 相似文献
68.
Analysis of damage localization for ductile metal in process of shear band propagation 总被引:3,自引:0,他引:3
王学滨 《中国有色金属学会会刊》2006,16(1):153-158
1 Introduction Shear localization is an important and often dominating deformation and failure mechanism for Ti and Ti alloy in dynamic loadings[1—10]. The eventual outcome of localized deformation is ductile rupture and material separation. Shear locali… 相似文献
69.
The shear strength and aging characteristics of 63Sn–37Pb solder bumps were characterized with variation in solder ball and
UBM pad sizes. The shear strength increased with shorter effective crack size,a
effs
which was determined with the solder ball and pad sizes. The shear strength of the solder bumps on Au/Ni/Cu and Ni/Cu did
not change significantly with reflow time. Substantial decrease in the shear strength occurred for the solder bumps formed
on Au/Ni/Cu with aging treatment, and the shear strength after aging was also related to the bump shape which was determined
with the solder ball and pad sizes. 相似文献
70.
Copper wire, serving as a cost-saving alternative to gold wire, has been used in many high-end thermosonic ball bonding applications. In this paper, the bond shear force, bond shear strength, and the ball bond diameter are adopted to evaluate the bonding quality. It is concluded that the ef/~cient ultrasonic power is needed to soften the ball to form the copper bonds with high bonding strength. However, excessive ultrasonic power would serve as a fatigue loading to weaken the bonding. Excessive or less bonding force would cause cratering in the silicon. 相似文献