CNT对BST陶瓷微波介电性能的影响

采用XRD及SEM研究(Ca0.61Nd0.26)TiO3对微波介质陶瓷Ba4Sm9.33Ti18O54的结构和微波介电性能的影响。获得了一些性能较好的微波介质陶瓷(1–x)Ba4Sm9.33Ti18O54-x(Ca0.61Nd0.26)TiO3,其微波介电性能如下:εr=75,Q·f为8985GHz,τf为–8.2×10–6℃–1(x?=0);εr为75,Q·f为9552GHz,τf为–14.4×10–6℃–1(x?=0.2)。     

陶瓷滤波器及无铅焊接

国际上三大主要组织制定出自己的无铅标准这一国际背景,陶瓷滤波器作为一种必需的元件必须实现无铅化生产,着重介绍了陶瓷滤波器无铅焊接工艺:原材料(引线,陶瓷基片)的无铅化及焊接辅料(助焊剂,焊锡)无铅化;按工艺顺序详细介绍了浸焊锡、浸助焊剂、基片插入、正面焊接和反面焊接,并针对每一个工序的要求提出了可行的解决方案.最后分析了无铅化生产对国内陶瓷滤波器的影响.     

无铅波峰焊钎料抗氧化影响的研究

研究了目前常用的Sn-0.7Cu无铅钎料在手浸锡炉和模拟波峰炉中的抗氧化情况.主要研究了微量P元素的加入对钎料抗氧化性的影响.通过钎料在液态下表面颜色变化和锡渣的产生量的比较可以发现微量P元素的加入可以提高钎料的抗氧化性能.通过比色分析发现微量P元素在钎料表面或亚表面富集,形成"阻挡层",抑制了钎料的进一步氧化.通过实验得出P的最佳质量分数为0.011%.     

Interfacial Intermetallic Growth and Strength of Composite Lead-Free Solder Alloy Through Isothermal Aging

The effects of particle reinforcement of Sn-4.0wt.%Ag-0.5wt.%Cu (SAC405) lead-free solder on interfacial intermetallic layer growth and strength of the ensuing joints through short-term isothermal aging (150°C) were studied. Composite solders were prepared by either incorporating 2 wt.% Cu (3 μm to 20 μm) or Cu₂O (∼150 nm) particles into SAC405 paste. Aggressive flux had the effect of reducing the Cu₂O nanoparticles into metallic Cu which subsequently reacted with the solder alloy to form the Cu₆Sn₅ intermetallic. While all solders had similar interfacial intermetallic growth upon reflow, both of the composite solders’ growth rates slowed through aging to reach a common growth rate exponent of approximately 0.38, considerably lower than that of the nonreinforced solder (n = 0.58). The nanoscale reinforced solder additionally exhibited the highest tensile strength in both the initial and aged conditions, behavior also attributed to its quick conversion to a stable microstructure.     

Morphology of intermetallic compounds formed between lead-free Sn-Zn based solders and Cu substrates

The morphologies of intermetallic compounds formed between Sn-Zn based solders and Cu substrates were investigated in this study. The investigated solders were Sn-9Zn, Sn-8.55Zn-0.45Al, and Sn-8.55Zn-0.45Al-0.5Ag. The experimental results indicated that the Sn-9Zn solder formed Cu₅Zn₈ and CuZn₅ compounds on the Cu substrate, while the Al-containing solders formed the Al_4.2Cu_3.2Zn_0.7 compound. The addition of Ag to the Sn-8.55Zn-0.45Al solder resulted in the formation of the AgZn₃ compound at the interface between the Al_4.2Cu_3.2Zn_0.7 compound and the solder. Furthermore, it was found that the cooling rate of the specimen after soldering had an effect on the quantity of AgZn₃ compound formed at the interface. The AgZn₃ compound formed with an air-cooling condition exhibited a rougher surface and larger size than with a water-quenched condition. It was believed that the formation of the AgZn₃ compound at the interface occurs through heterogenous nucleation during solidification.     

Microstructure, solderability, and growth of intermetallic compounds of Sn-Ag-Cu-RE lead-free solder alloys

The near-eutectic Sn-3.5 wt.% Ag-0.7 wt.% Cu (Sn-3.5Ag-0.7Cu) alloy was doped with rare earth (RE) elements of primarily Ce and La of 0.05–0.25 wt.% to form Sn-3.5Ag-0.7Cu-xRE solder alloys. The aim of this research was to investigate the effect of the addition of RE elements on the microstructure and solderability of this alloy. Sn-3.5Ag-0.7Cu-xRE solders were soldered on copper coupons. The thickness of the intermetallic layer (IML) formed between the solder and Cu substrate just after soldering, as well as after thermal aging at 170°C up to 1000 h, was investigated. It was found that, due to the addition of the RE elements, the size of the Sn grains was reduced. In particular, the addition of 0.1wt.%RE to the Sn-3.5Ag-0.7Cu solder improved the wetting behavior. Besides, the IML growth during thermal aging was inhibited.     

CuO掺杂对BaZn_2Ti_4O_(11)陶瓷微波介电性能的影响

采用固相反应法制备了CuO掺杂的BaZn2Ti4O11陶瓷,研究了所制陶瓷的物相、微观结构和微波介电性能。结果表明,CuO既可以在晶界处形成低共熔体,导致液相烧结,降低烧结温度40℃,又可使部分Cu2+进入晶格取代了部分Zn2+,增加Q.f值。掺杂质量分数0.5%的CuO在1 160℃烧结2 h所制得BaZn2Ti4O11陶瓷的微波介电性能较佳:相对介电常数εr=29.4,Q.f=50 500 GHz,频率温度系数τf=–35.6×10–6/℃。     

无铅焊料十温区回流焊过程的仿真研究

通过对回流焊接工艺参数传输带速度、各个炉区温度设定和焊膏熔化温度曲线的关系研究,建立了大尺寸PCB组件传热过程的数学模型。基于ANSYS平台,模拟了无铅焊料PCB组件在十温区回流焊接过程中的温度场,从而确定了合适的焊接参数。     

Elevated temperature aging of solder joints based on Sn-Ag-Cu: Effects on joint microstructure and shear strength

The shear strength behavior and microstructural effects after aging for 100 h and 1,000 h at 150°C are reported for near-eutectic Sn-Ag-Cu (SAC) solder joints (joining to Cu) made from Sn-3.5Ag (wt.%) and a set of SAC alloys (including Co- and Fe-modified SAC alloys). All joints in the as-soldered and 100-h aged condition experienced shear failure in a ductile manner by either uniform shear of the solder matrix (in the strongest solders) or by a more localized shear of the solder matrix adjacent to the Cu₆Sn₅ interfacial layer, consistent with other observations. After 1,000 h of aging, a level of embrittlement of the Cu₃Sn/Cu interface can be detected in some solder joints made with all of the SAC alloys and with Sn-3.5Ag, which can lead to partial debonding during shear testing. However, only ductile failure was observed in all solder joints made from the Co- and Fe-modified SAC alloys after aging for 1,000 h. Thus, the strategy of modifying a strong (high Cu content) SAC solder alloy with a substitutional alloy addition for Cu seems to be effective for producing a solder joint that retains both strength and ductility for extended isothermal aging at high temperatures.