动态应力下MOS器件热载流子效应研究

研究了 MOS器件中的热载流子效应 ,在分析了静态应力下 MOSFET寿命模型的基础上 ,提出了动态应力条件下 MOSFET的寿命模型。此外 ,还研究了沟道热载流子的产生和注入与器件偏置条件的关系 ,讨论了热载流子效应对电路性能的影响。通过对这些失效因素的研究和通过一定的再设计手段 ,可以减少热载流子效应导致的器件退化     

高分散的CoWO4或CuWO4提高WO3的光催化性能

本文采用原位浸渍与固相反应结合,成功地合成了CoWO4或CuWO4高度分散在WO3表面的复合CoWO4/WO3或CuWO4/WO3光催化剂。通过XRD,SEM,TEM,EDS,HR-TEM,UV-vis DRS,SPV和活性物种实验研究了CoWO4/WO3和CuWO4/WO3样品的结构,形貌,光物理性质和光催化降解机理。XRD,SEM和TEM结果表明,当CoWO4或CuWO4的负载量较小时,CoWO4或CuWO4高度分散在WO3表面上。但是当CoWO4或CuWO4的负载量增加时,WO3表面的CoWO4或CuWO4颗粒发生明显的团聚。可见光光催化降解RhB的实验结果表明,所有CoWO4/WO3或CuWO4/WO3样品的光催化活性都优于WO3的活性。这主要是因为WO3和CoWO4或CuWO4之间形成的II型异质结能够显著促进光生电子和空穴的分离。此外,CoWO4/WO3和CuWO4/WO3系列样品中,0.2％CoWO4/WO3和0.2％CuWO4/WO3分别显示了最优异的光催化活性,与WO3相比,其光催化活性分别提高了约9.1倍和6.8倍。此外,活性物种实验表明,光催化过程中在0.2％CoWO4/WO3和0.2％CuWO4/WO3催化剂上产生的?OH,h+和?O2?都是光催化降解RhB的活性物种。本文为设计高活性的光催化剂提供了一种思路。     

水电枢纽下游河床下切问题的分析研究

河床演变过程极为复杂，影响因素较多，但尽管它们的表现形式不同，归根结底，是由于水流的输沙不平衡所引起的，当来沙量小于输沙能力时，河床发生冲刷：当来沙量大于输沙能力时，河床发生淤积，河床演变的结果是力图恢复水流输沙平衡，也就是说河床变形总是朝着使变形终止的方向发展。     

Effect of voltage sweep direction on the performance evaluation of P3HT : PCBM solar cells

Investigations on the effect of direction of voltage sweeps, on the current density–voltage (J–V) characteristics in polymer bulk‐heterojunction solar cells, based on the blend of poly(3‐hexylthiophene) (P3HT) and phenyl [6,6] C₆₁ butyric acid methyl ester (PCBM), are reported with time. On the freshly prepared device, the direction of the voltage sweep did not have any effect; however, as the device started degrading, the change in direction of the voltage sweep resulted into different characteristics. Analysis beyond complete degradation, when all the photovoltaic parameters reduced to zero, revealed some interesting results. The J–V characteristics, measured with voltage sweep from −ve to +ve voltage, both in the dark and under illumination, were observed to pass through the second quadrant. On the other hand, with the change in the direction of voltage sweep, viz. from +ve to −ve voltage, the characteristics both in the dark and under illumination passed through the fourth quadrant. These results have been explained on the basis of polarization of the degraded active layer due to applied external voltage. This is an important effect and is observed to depend on the applied voltages during performance evaluation and becomes more prominent with time. This effect puts a question mark on the correctness of the method for calculation of the parameters of a degraded device. Studies on degradation of P3HT : PCBM solar cells showed that both the short circuit current density (J_sc) and the power conversion efficiency (η) decay exponentially, whereas the open circuit voltage (V_oc) decays almost linearly with time. Copyright © 2012 John Wiley & Sons, Ltd.     

Photovoltaic module reliability model based on field degradation studies

Crystalline silicon photovoltaic (PV) modules are often stated as being the most reliable element in PV systems. This presumable high reliability is reflected by their long power warranty periods. In agreement with these long warranty times, PV modules have a very low total number of returns, the exceptions usually being the result of catastrophic failures. Up to now, failures resulting from degradation are not typically taken into consideration because of the difficulties in measuring the power of an individual module in a system. However, lasting recent years PV systems are changing from small isolated systems to large grid‐connected power stations. In this new scenario, customers will become more sensitive to power losses and the need for a reliability model based on degradation may become of utmost importance. In this paper, a PV module reliability model based on degradation studies is presented. The main analytical functions of reliability engineering are evaluated using this model and applied to a practical case, based on state‐of‐the‐art parameters of crystalline silicon PV technology. Relevant and defensible power warranties and other reliability data are obtained with this model based on measured degradation rates and time‐dependent power variability. In the derivation of the model some assumptions are made about the future behaviour of the products—i.e. linear degradation rates—although the approach can be used for other assumed functional profiles as well. The method documented in this paper explicitly shows manufacturers how to make reasonable and sensible warranty projections. Copyright © 2008 John Wiley & Sons, Ltd.     

Degradation of starch by incubation with rumen fluid. A comparison of different starch sources

The degradability of starch from various feedstuffs was investigated in vitro by incubation of 500-mg amounts in 50 ml of a 3:1 rumen fluid/buffer solution at 39°C for 6 h. The rumen fluid was obtained from one of three cows fed on hay or hay and concentrate. The degree of degradation after 6 h incubation varied strongly for the 23 feedstuffs investigated. The degradation of starch from the same feedstuff in rumen fluid from a hay-fed cow was significantly lower than in rumen fluid from a concentrate-fed cow. It seemed that differences in degradability between feedstuffs were not determined by the ration of the donor cow, but merely by the properties of the starch. Processed feedstuffs showed a higher degradation of their starch than the unprocessed feedstuffs, independent of the ration of the donor cow. Particle size influenced degradation, but not of the starch of tapioca meal. A fairly constant ranking in degradability between the various feedstuffs was found. Fermentation of mixtures of feedstuffs showed about the same rate of degradation as found for the single products. Only when great differences in the degree of degradability existed was the degradation of the total starch enhanced. The time of collection of rumen fluid strongly influenced the in-vitro degradation of starch.     

基于果蝇算法优化广义回归神经网络的机枪枪管初速衰减建模与预测

机枪枪管初速衰减预测是一个复杂的非线性问题。广义回归神经网络方法被广泛应用于非线性问题的建模,但其平滑因子取值对神经网络的预测性能有较大影响。采用果蝇算法对广义回归神经网络的参数进行优化选取,提出了基于果蝇算法优化广义回归神经网络的机枪枪管初速衰减建模方法。基于机枪枪管初速衰减试验数据,建立在不同使用环境下随着累计射弹量的增加,以初速降为特征量的机枪枪管初速衰减预测模型,预测结果与试验结果基本一致,证实了所提方法的可行性。通过与未经优化的广义回归神经网络方法和反向传播神经网络方法建立的预测模型进行比较,其性能明显优于另外两种方法,验证了基于果蝇算法优化的广义回归神经网络方法在建立机枪枪管初速衰减模型中的有效性。     

Graceful Degradation FEC Layer for Multimedia Broadcast/Multicast Service in LTE Mobile Systems

This paper proposes an additional forward error correction (FEC) layer to compensate for the defectiveness inherent in the conventional FEC layer in the Long Term Evolution specifications. The proposed additional layer is called a graceful degradation (GD)‐FEC layer and maintains desirable service quality even under burst data loss conditions of a few seconds. This paper also proposes a non‐delayed decoding (NDD)‐GD‐FEC layer that is inherent in the decoding process. Computer simulations and device‐based tests show a better loss recovery performance with a negligible increase in CPU utilization and occupied memory size.     

Temperature influence on performance degradation of hydrogenated amorphous silicon solar cells irradiated with protons

This paper reports temperature influence on radiation degradation of hydrogenated amorphous silicon (a‐Si : H) solar cells. Degradation behaviors of a‐Si : H solar cells irradiated with protons at 331 K are compared with that at 298 K (room temperature). Variations with time in the post‐irradiation electrical properties are also investigated. It is found that the radiation degradation of the electrical properties at 331 K is significantly smaller than that at room temperature. Also, all the electrical properties (short‐circuit current, open‐circuit voltage, output maximum, and fill factor) recover with time after irradiation even at room temperature. The characteristic time of thermal annealing of short‐circuit current is larger as the temperature is higher. These results indicate that temperature during irradiation and elapsed time from irradiation to measurement is an important parameter for radiation degradation of a‐Si : H solar cells. Therefore, these parameters should be controlled in conducting the ground radiation tests. Copyright © 2012 John Wiley & Sons, Ltd.     

聚合物发光二极管中可逆的不稳定行为

研究了存在于聚合物发光二极管 ( PL ED)中的一种可逆的“负阻”现象及短期衰退行为 .当加在 PLED上的正向偏压大于 1 0 V之后 ,其电流和发光强度将在某偏压下出现突然的转折 ,即电流或光强骤增而器件上压降减小 .“负阻”现象将随测量次数的增加而逐渐消失 .采用 CCD摄像头摄取发光象素上发光的变化情况的图像 ,发现光强的突变与电流的突变是相对应的 .对以不同极性脉冲偏置观察发光光强的短期衰退情况时发现 ,反向偏置有助于抑制正向的发光衰退行为 .我们初步认为这些现象可能与 PLED中存在的缺陷态及其上电荷的填充状况有关