Cluster-based delta-QMC technique for fast yield analysis

Monte Carlo (MC) analysis is often considered a golden reference for yield analysis because of its high accuracy. However, repeating the simulation hundreds of times is often too expensive for large circuit designs. The most widely used approach to reduce MC complexity is using efficient sampling methods to reduce the number of simulations. Aside from those sampling techniques, this paper proposes a novel approach to further improve MC simulation speed with almost the same accuracy. By using an improved delta circuit model, simulation speed can be improved automatically due to the dynamic step control in transient analysis. In order to further improve the efficiency while combining the delta circuit model and the sampling technique, a cluster-based delta-QMC technique is proposed in this paper to reduce the delta change in each sample. Experimental results indicate that the proposed approach can increase speed by two orders of magnitude with almost the same accuracy, which significantly improves the efficiency of yield analysis.     

集成电路生产中成品率的有效管理

本文分析了在集成电路制造过程中,使用的基础材料、设备、工艺技术所产生的污染粒子,随机缺陷对IC产品成品率的影响。并主要介绍了从经典学习曲线概念中推导出来的成品率提高模型已被用于追踪产品成品率的提高,该模型建立在能优先迅速解决影响成品率诸多问题的基础上。实际成品率与模型化成品率的比较充分证明了成品率提高模型的实际意义。     

晶圆测试探针新的测试价值

晶圆测试探针曾被认为是节约废芯片封装成本的一种方法,现今它却成为工艺控制、成品率管理、产品质量以及总测试成本的一个关键因素。此外,随着组装相关的故障测试之后,封装水准晶圆分选的完全测试不久将会来临。     

Statistical timing and power analysis of VLSI considering non-linear dependence

Majority of practical multivariate statistical analysis and optimizations model interdependence among random variables in terms of the linear correlation. Though linear correlation is simple to use and evaluate, in several cases non-linear dependence between random variables may be too strong to ignore. In this paper, we propose polynomial correlation coefficients as simple measure of multi-variable non-linear dependence and show that the need for modeling non-linear dependence strongly depends on the end function that is to be evaluated from the random variables. Then, we calculate the errors in estimation resulting from assuming independence of components generated by linear de-correlation techniques, such as PCA and ICA. The experimental results show that the error predicted by our method is within 1% error compared to the real simulation of statistical timing and leakage analysis. In order to deal with non-linear dependence, we further develop a target-function-driven component analysis algorithm (FCA) to minimize the error caused by ignoring high order dependence. We apply FCA to statistical leakage power analysis and SRAM cell noise margin variation analysis. Experimental results show that the proposed FCA method is more accurate compared to the traditional PCA or ICA.     

影响葡萄产量,品质的冠幕指标分析

对2 个酿酒品种,5 种整形方式的16 个冠幕指标分析,认为影响产量的主要指标是每株果穗数、穗重和每穗果粒数;影响含糖量的主要指标是叶果比和到达叶片的平均相对光强(即叶幕叶片平均受光状况);影响含酸量的主要指标是叶果比     

基于干扰力矩辨识的高精度非线性姿态控制方法

弹道式航天飞行器末修闭路制导飞行段通常采用具有非线性特性的固定姿控喷管进行姿态跟踪和稳定控制,此时姿态控制精度直接影响闭路制导效果。传统斜线开关线控制方法存在系统性姿态角偏差,导致末修推力方向与待增速度方向始终存在差异,进而影响到飞行器落点精度。提出的基于干扰力矩辨识的高精度非线性姿态控制方法,通过干扰力矩在线辨识,实时设计姿控喷管开关线,将极限环调整至环绕原点,从而提高姿控精度。基于某型飞行器的仿真结果表明,与传统设计方法相比,基于干扰力矩辨识的高精度非线性姿态控制方法可将闭路制导段姿态控制精度提高约90%,减小姿态偏差对闭路制导的影响,飞行器落点精度提高约25%。     

变频控制系统前馈PID功能浅谈

本文主要介绍了JX-G系列变频器改进的前馈PID功能原理及实现,浅析了前馈PID功能实现的具体过程,与单纯PID控制作了简单的对比,体现出前馈PID控制的优越性。     

一种提升树脂、阻焊塞孔良率新工艺方法应用推广

随着越来越多客户要求采用Via in Pad(盘内导通孔)工艺,树脂塞孔凹馅问题在制作上是一个非常让人头疼的问题,一旦产生树脂凹馅,直接影响客户SMT贴片而遭投诉,目前虽然有关于改善树脂凹陷的文献,但大多局限于理论分析及综述。因成本因素考虑,PCB厂家普遍采用铝片树脂塞孔,因铝片钻孔后易出现孔口批锋及打折,从而出现树脂凹馅现象,影响树脂塞孔效果。本文将推广一种可以提高树脂塞孔良率新工艺方法,采用0.25 mm(不含铜)基板钻孔后蚀刻铜皮制作塞孔网版,替代铝片塞孔网版进行树脂塞孔,改善树脂塞孔凹陷,提升树脂塞孔良率,此工艺方法同样可提升阻焊塞孔良率。     

VLSI容错设计研究进展(2)——功能成品率与可靠性的研究

带冗余的集成电路的成品率的估计对制造者来说是一个非常重要的问题。文中将集中分析和讨论带冗余的成品率模型和可靠性,给出了该领域研究进展的最新结果,并指出了进一步研究的方向和策略。     

XD－YES：IC功能成品率模拟器的实现

首先建立缺陷空间分布和粒径分布的模型，并讨论了缺陷通过版图产生电路错误的过程，给出了ＩＣ功能成品率模拟器ＸＤ－ＹＥＳ的实现。用ＸＤ－ＹＥＳ对微电子测试图和实际ＩＣ的功能成品率模拟和分析表明，其结果与实际符合很好，从而表明ＸＤ－ＹＥＳ的可行性和实用性。