Marvelous self-assembly of hierarchically nanostructured porous zirconium phosphate solid acids with high thermal stability

A hierarchical structure of thermally stable macroporous zirconium phosphate solid acids with supermicroporous walls was prepared by a simple self-assembly process from the precursors of zirconium propoxide and orthophosphoric acid solution. The macroporous structures are uniform with the diameters ranging from 300 to 800 nm, one-dimensional channel-like. The effect of surfactant Brij 56 on the formation of macroporous structures has been studied. The frameworks of the synthesized hierarchical zirconium phosphates are amorphous with Zr–O–P bonding, exhibiting remarkably high thermal stability (at least 800 °C), on the basis of the X-ray diffraction (XRD), N₂ adsorption, X-ray photoelectron spectroscopy (XPS) analysis, Fourier transform infrared (FT-IR) and ³¹P nuclear magnetic resonance (NMR) spectra. Larger quantities of Zr–OH and P–OH groups are observed besides surface hydroxyl groups, suggesting the presence of acidity and the possibility of surface functionalization for practical applications including catalysis. The macroporous zirconium phosphates with hierarchical structures could also be the potential and efficient catalyst supports for the design of the structured catalysts and reactors.     

电感耦合等离子体发射光谱法测定锆材中的铪、铁、铬

建立了电感耦合等离子体发射光谱法(ICP-AES)同时测定锆材中铪、铁、铬元素含量的方法。样品用硝酸-氢氟酸溶解,探讨了基体锆对元素铪、铁、铬以及铪、铁、铬相互之间的干扰情况,确定了铪、铁、铬元素最佳分析谱线分别为264.141nm,238.204nm,267.716nm。线性相关系数r≥0.9999,加标回收率均为95%~105%,铪、铁、铬的相对标准偏差小于3%(n=11)。该方法简便、快速、准确,满足锆材日常生产的检测要求。     

Design of Lu2O3-reinforced Cf/SiC-ZrB2-ZrC ultra-high temperature ceramic matrix composites: Wetting and interfacial reactivity by ZrSi2 based alloys

The wettability and infiltration of molten ZrSi₂ and ZrSi₂-Lu₂O₃ alloys into C_f/SiC and B₄C-infiltrated C_f/SiC composites were investigated to understand the interfacial interactions that occur during the development of C_f/SiC-ZrC and C_f/SiC-ZrB₂-ZrC-Lu₂O₃ materials. A significant evaporation of Si from the liquid affected the wetting behaviour of the alloy when tested in a vacuum at 1670 °C. The better wetting and spreading of the alloy over the surface was observed for the composites with lower overall porosity (12 %). On the other hand, the formation of an outer dense layer, followed up by the uniform infiltrated region up to ～ 1 mm was observed for the C_f/SiC with higher porosity (21 %). The infiltrated alloy reacted with SiC matrix to form ZrC or with B₄C-infiltrated SiC matrix to form ZrB₂-ZrC-SiC. The Lu₂O₃ particles were not wetted by the melt, and were pushed away of the reaction zone by the solidification front.     

锆在镁及镁合金中的作用

镁合金作为一种新型的工程材料具有许多独特的优点,锆作为微量元素加入到镁合金中,可以细化合金的微观组织,显著提高材料的力学性能,减少夹杂,改善镁合金的抗腐蚀性能等。论述了锆元素对镁合金各项性能的作用机理、锆元素细化镁合金晶粒的机制,提出合金制备过程中的加锆方式应是含锆镁合金今后研究的重点。     

Self-organized porous TiO2 and ZrO2 produced by anodization

The present work investigates the electrochemical formation of self-organized high aspect ratio TiO₂ and ZrO₂ nanotube layers. The formation and growth of a self-organized porous layer can be achieved directly by anodization without any templates in fluoride containing electrolytes. The morphology of the porous layers is affected by the electrochemical conditions such as the electrolyte composition, the pH and the exact polarization treatment (such as the potential sweep rate from the open-circuit potential to the anodizing potential). For Ti, nanotube layers are formed with diameters varying from approx. 20 nm to 100 nm and lengths from approx. 0.25 μm to 2.5 μm depending on the electrolytes and pH. On the other hand, for Zr, tubes of 50 nm in diameter and up to approx. 17 μm in length can be grown—a key parameter in this case is the potential sweep rate. The large difference between Ti and Zr in the achievable thickness of nanotube layers indicates a difference in the growth mechanism which may be based on the different chemical dissolution rates of electrochemically formed oxides.     

基于图像处理的锆管端面缺陷检测

对核用锆管端面缺陷进行检测是保证锆管尺寸具有高度的一致性和稳定性的重要手段之一,该文采用计算机图像处理技术对锆管端面的缺陷进行自动检测,在VC6.0的开发平台,运用mil库函数,对锆管端面的宽度,内外倒角进行了快速、实时检测,并通过实例验证了检测系统的可行性。     

Microstructure,Phase Composition,and Thermal Stability of Two Zirconium Alloys Subjected to High‐Pressure Torsion at Different Temperatures

The structure, phase composition, and thermal stability of the industrial zirconium alloys, namely, E110 (Zr–1% Nb) and E635 (Zr–1% Nb–0.3% Fe–1.2% Sn), which are subjected to high‐pressure torsion (HPT) at room temperature (RT), 200, and 400 °С have been studied. HPT of Zr‐alloys at RT (10 revolutions) leads to the formation of grain–subgrain nano‐sized structure and to increase the microhardness by 2.1…2.8 times. The increase in the HPT temperature to 200–400 °С leads to the increase in the structural‐element average size. The structural‐element size in the complexly alloyed E635 alloy in all cases is lower compared with the E110 alloy. The hardening of the alloys after HPT at RT and 200 °С is close, and at 400 °С is much less. HPT initiates the α‐Zr → (ω‐Zr + β‐Zr) transformation, which is the main factor for alloys hardening. The α‐Zr → (ω‐Zr + β‐Zr) transformation in the E635 alloy occurs less quickly. The maximum amount (ω‐Zr + β‐Zr) phase in the structure of the alloys is observed after HPT at RT and 200 °C, and the minimum ? at 400 °C. During heating, the alloys undergo the reverse (ω‐Zr + β‐Zr) → α transformation which depends on both the alloy composition and HPT temperature.

     

Synthesis and characterisation of nanosized TiO2-ZrO2 binary system prepared by an aqueous sol-gel process: Physical and sensing properties

Nanostructured TiO₂-ZrO₂ thin films and powders were prepared by a straightforward aqueous particulate sol-gel route. Titanium (IV) isopropoxide and zirconium (IV) acetate hydrate were used as precursors, and hydroxypropyl cellulose was used as a polymeric fugitive agent in order to increase the specific surface area. X-ray diffraction (XRD) and Fourier transform infrared (FTIR) spectroscopy revealed that the powder were crystallised at the low temperature of 500 °C, containing anatase-TiO₂ and tetragonal-ZrO₂ phases. Furthermore, it was found that ZrO₂ retarded the anatase-to-rutile transformation up to 900 °C. The activation energies for crystallite growth of TiO₂ and ZrO₂ components in the binary system were calculated 10.16 and 3.12 kJ/mol, respectively. Transmission electron microscope (TEM) image showed that one of the smallest crystallite sizes was obtained for TiO₂-ZrO₂ binary mixed oxide, being 5 nm at 500 °C. Field emission scanning electron microscope (FESEM) analysis revealed that the deposited thin films had nanostructured morphology with the average grain size of 20 nm at 500 °C and 36 nm at 900 °C. Thin films produced under optimised conditions showed excellent microstructural properties for gas sensing applications. They exhibited a remarkable response towards low concentrations of CO and NO₂ gases at low operating temperature of 150 °C, resulted in an increase of thermal stability of sensing films as well as a decrease in the power consumption. Furthermore, calibration curves revealed that TiO₂-ZrO₂ sensor follows the power law, S = A[gas]^B (where S is sensor response, coefficients A and B are constants and [gas] is gas concentration) for the two types of gases, and it has excellent capability for the detection of low gas concentrations.     

Raman spectra and structural analysis in ZrOxNy thin films

Raman spectroscopy has been used as a local probe to characterize the structural evolution of magnetron-sputtered decorative zirconium oxynitride ZrO_xN_y films which result from an increase of reactive gas flow in the deposition. The lines shapes, the frequency position and widths of the Raman bands show a systematic change as a function of the reactive gas flow (a mixture of both oxygen and nitrogen). The as-deposited zirconium nitride film presents a Raman spectrum with the typical broadened bands, due to the disorder induced by N vacancies. The recorded Raman spectrum of the zirconium oxide film is typical of the monoclinic phase of ZrO₂, which is revealed also by X-ray diffraction. Raman spectra of zirconium oxynitride thin films present changes, which are found to be closely related with the oxygen content in films and the subsequent structural changes.