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71.
《无机及分析化学》在多媒体教学的应用及思考 总被引:1,自引:0,他引:1
对多媒体技术在无机及分析化学教学的应用进行了,阐述和分析,指出使用多媒体教学应注意的问题。 相似文献
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74.
介绍了15kt/a本体苯乙烯-丙烯腈(SAN)装置试生产打火机专用SAN树脂的生产情况,确定了主要工艺配方及参数:进料组成为乙苯浓度为6%-11%、丙烯腈浓度为30%-42%,聚合温度130-145℃、压力0.40-0.46MPa,搅拌转速60-90r/min,脱挥温度215-250℃、压力小于等于4kPa;并对影响打火机志用SAN树脂性能的主要工艺条件及因素进行了讨论。结果表明,聚合温度、结合丙烯腈含量、熔体流动指数、转化率是影响打火机专用SAN树脂生产工艺及产品性能的主要因素。 相似文献
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76.
The Finite Volume Particle Method (FVPM) is a meshless method based on a definition of interparticle area which is closely analogous to cell face area in the classical finite volume method. In previous work, the interparticle area has been computed by numerical integration, which is a source of error and is extremely expensive. We show that if the particle weight or kernel function is defined as a discontinuous top-hat function, the particle interaction vectors may be evaluated exactly and efficiently. The new formulation reduces overall computational time by a factor between 6.4 and 8.2. In numerical experiments on a viscous flow with an analytical solution, the method converges under all conditions. Significantly, in contrast with standard FVPM and SPH, error depends on particle size but not on particle overlap (as long as the computational domain is completely covered by particles). The new method is shown to be superior to standard FVPM for shock tube flow and inviscid steady transonic flow. In benchmarking on a viscous multiphase flow application, FVPM with exact interparticle area is shown to be competitive with a mesh-based volume-of-fluid solver in terms of computational time required to resolve the structure of an interface. 相似文献
77.
In this paper we consider a conservative discretization of the two-dimensional incompressible Navier–Stokes equations. We propose an extension of Arakawa’s classical finite difference scheme for fluid flow in the vorticity–stream function formulation to a high order discontinuous Galerkin approximation. In addition, we show numerical simulations that demonstrate the accuracy of the scheme and verify the conservation properties, which are essential for long time integration. Furthermore, we discuss the massively parallel implementation on graphic processing units. 相似文献
78.
从等离子体的基本特性出发,综述了等离子体技术在氨气合成、有机物合成、高分子合成以及纳米碳管的合成等方面的应用和最新进展,并展望了等离子体技术在化学合成方面的应用前景. 相似文献
79.
一步法生产涤纶FDY工艺的探讨 总被引:1,自引:3,他引:1
利用KV731纺丝设备一步法生产出涤纶FDY,探讨了热辊拉伸和熔体温度对纤维质量的影响。采用高特性粘数的聚酯切片,严格控制纺丝工艺,可以在5000m/min的纺丝速度下纺制高质量的细旦涤纶FDY。 相似文献
80.
《Journal of Parallel and Distributed Computing》2014,74(6):2512-2520
Accurate age modeling, and fast, yet robust reliability sign-off emerged as mandatory constraints in Integrated Circuits (ICs) design for advanced process technology nodes. In this paper we introduce a novel method to assess and predict the circuit reliability at design time as well as at run-time. The main goal of our proposal is to allow for: (i) design time reliability optimization; (ii) fine tuning of the run-time reliability assessment infrastructure, and (iii) run-time aging assessment. To this end, we propose to select a minimum-size kernel of critical transistors and based on them to assess and predict an IC End-Of-Life (EOL) via two methods: (i) as the sum of the critical transistors end-of-life values, weighted by fixed topology-dependent coefficients, and (ii) by a Markovian framework applied to the critical transistors, which takes into account the joint effects of process, environmental, and temporal variations. The former model exploits the aging dependence on the circuit topology to enable fast run-time reliability assessment with minimum aging sensors requirements. By allowing the performance boundary to vary in time such that both remnant and nonremnant variations are encompassed, and imposing a Markovian evolution, the probabilistic model can be better fitted to various real conditions, thus enabling at design-time appropriate guardbands selection and effective aging mitigation/compensation techniques. The proposed framework has been validated for different stress conditions, under process variations and aging effects, for the ISCAS-85 c499 circuit, in PTM 45 nm technology. From the total of 1526 transistors, we obtained a kernel of 15 critical transistors, for which the set of topology dependent weights were derived. Our simulation results for 15 critical transistors kernel indicate a small approximation error (i.e., mean smaller than 15% and standard deviation smaller than 6%) for the considered circuit estimated end-of-life (EOL), when comparing to the end-of-life values obtained from Cadence simulation, which quantitatively confirm the accuracy of the IC lifetime evaluation. Moreover, as the number of critical transistors determines the area overhead, we also investigated the implications of reducing their number on the reliability assessment accuracy. When only 5 transistors are included into the critical set instead of 15, which results in a 66% area overhead reduction, the EOL estimation accuracy diminished with 18%. This indicates that area vs. accuracy trade-offs are possible, while maintaining the aging prediction accuracy within reasonable bounds. 相似文献