X射线探测技术

1 引言X射线探测器是用来接收X射线,并把它转化成为可测量或可观察的量的仪器。所有X射线探测器都是基于X射线和物质相互作用的各种特性制成的。根据测量原理,可把X射线探测器分成三类,即：1）零维探测器,包括各种类型的正比计数器和半导体探测器等;2）二维探测器,包括X射线底片、电荷耦合器件（CCD）、X射线成像板、电子变焦管等;3）三维探测器,目前主要是光刻胶。2 X射线零维探测技术所谓零维探测,是指只能探测X射线光子数或X射线强度的技术。零维探测器包含各种计数器,如正比计数器、盖革计数器、闪烁体及半导体探测器等…     

过滤阴极真空电弧法制备四面体非晶碳薄膜

利用离面双弯曲过滤阴极其空电弧沉积系统,在Ф200mm单晶硅片上制备四面体非晶碳薄膜。利用Dectek3型表面轮廓仪检验膜厚均匀性(小于5％),并利用扫描电子显微镜(SEM)、原子力显微镜(AFM)、激光拉曼光谱(Raman)、X射线光电子谱(XPS)以及纳米压痕(Nano—Indenter)仪器测试薄膜的性能和结构。结果表明：试验制备的薄膜是四面体非晶碳薄膜,其中sp^3键含量高达80％以上,薄膜表面纯净,几乎没有大颗粒的污染,表面粗糙度(Rq)小于0．3nm(取样面积1μm^2),薄膜硬度可达50GPa,杨氏弹性模量高于550GPa。     

Correlation of in-situ reflectance spectra and resistivity of GaN/Al<Subscript>2</Subscript>O<Subscript>3</Subscript> interfacial layer in metalorganic chemical vapor deposition

The correlation between the resistivity of an undoped GaN/Al₂O₃ interfacial layer and in-situ reflectance spectrum in metalorganic chemical vapor deposition and the mechanism of this correlation were investigated. The first minimum reflectance during the initial high-temperature GaN growth was found to be a good indicator of the resistivity of the GaN buffer. The background electron concentration and mobility were both higher in the samples with higher indicative reflectance at that point. The resistivity of the GaN buffer layer was predominantly determined by an ∼0.25-μm-thick layer near the GaN/Al₂O₃ interface. Atomic force microscope (AFM) and high-resolution x-ray diffraction (HRXRD) results showed that the samples with higher indicative reflectance had smaller sized but higher density nuclei before the high-temperature GaN growth and lower screw threading dislocation (TD) density in the initially grown GaN. The difference in the background electron concentration and mobility of the interfacial layer was related to the relatively higher concentration of the O and Al diffused from Al₂O₃, which is also dependent on the size and density of the nuclei. These differences were found not to affect the structural and electrical properties or the surface morphology of AlGaN/GaN high electron-mobility transistors (HEMTs, except for the buffer conduction) when the GaN buffer is thick enough (e.g., ∼2.5 μm).     

Hydrogen underground storage—Petrographic and petrophysical variations in reservoir sandstones from laboratory experiments under simulated reservoir conditions

Fluctuating energy production by renewables is one of the main issues in transition times of energy production from conventional power plants to an energy production by renewables. Using excess produced electricity (windy/sunny periods) to convert water to oxygen and hydrogen and storing the hydrogen in depleted oil-, gas fields or sedimentary aquifer structures would provide the option to recover and convert hydrogen to electricity in periods with an energy demand. Research focus is here the pore space in the geological underground where still few studies exist. In static batch experiments up to six weeks long, under different reservoir-specific conditions; regarding pressure, temperature and formation fluid salinity, sandstones were exposed to 100% hydrogen. Before and after these experiments microscopic, petrophysical and computer tomography analyses are conducted. The preliminary results from different scales (μm to cm) and dimensions (2D and 3D) of 21 samples indicate that hydrogen underground storage is likely possible.     

Synchrotron white beam x-ray topography analysis of MBE grown CdTe/CdTe (111)B

The structural quality of CdTe(111)B substrates and MBE grown CdTe epilayers is examined with synchrotron white beam x-ray topography (SWBXT). Reflection SWBXT indicates that CdTe substrates with comparable x-ray double crystal rocking curve full width at half maximum values can have radically different defect microstructures, i.e. dislocation densities and the presence of inclusions. Dislocation mosaic structures delineated by SWBXT are consistent with the distribution of etch pits revealed by destructive chemical etch pit analysis. Direct one-to-one correspondence between distinct features of the topographic image and individual etch pits is demonstrated. Clearly resolved images of individual dislocations are obtained by carrying out transmission SWBXT. Our investigation demonstrates how, the extent of twinning in a CdTe epilayer is strongly influenced by the quality of the defect microstructure, and how dislocations propagate from an inclusion.     

人工神经网络在三维X线头影测量系统中的应用

给出一种三维X线头影测量中图形图像重建的方法;南正侧位两张X线头影片上72个标志点。可以重建出颅颌骨三维透视图;利用人工神经网络LMBP算法。以病人颅颌骨72个标志点的三维坐标集合在某一平面的二维投影为理想输出,以人体颅颌骨标本72个同名标志点在相同平面的二维坐标集合为训练样本,在训练结束后即可建立两者之问的近似线性关系;由于网络具有泛化能力,因此可用该网络对颅颌骨标本上每一像素进行变换。结果表明变换后72个标志点坐标和病人很好吻合,变换图像为病人近似的颅颌骨图像;即满足口腔正畸诊断要求又获得较好图像视觉效果。     

Crystal growth and structure of L-methionine L-methioninium hydrogen maleate—a new NLO material

A new organic nonlinear optical (NLO) crystal from the amino acid family, viz., L-methionine L-methioninium hydrogen maleate (LMMM), has been grown by slow evaporation method from aqueous solution. Bulk crystals were grown using submerged seed solution method. The structure was elucidated using the single crystal x-ray diffraction data. The compound crystallized in the space group P2₁ and the unit cell contains a protonated L-methioninium cation and a zwitterionic methionine residue plus a maleate anion. The backbone conformation angles Ψ¹ and Ψ² are in cis and trans configurations for both the methionine and methioninium residues, respectively. Amino and carboxyl groups of the methioninium and methionine residues are connected through N–H…O hydrogen bonds leading to a ring R₂²(10) motif.     

Calibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy

For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray microscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are produced with STXM data at this scale has not yet been described in the scientific literature, and the calibration procedure has novel problems that have not been encountered by x-ray tomography carried out at a larger scale. In x-ray microtomography, for example, one always has the option of using optical imaging on a section of the object to verify the x-ray projection measurements; with STXM, on the other hand, the sample features are too small to be resolved by light at optical wavelengths. This fact implies that one must rely on procedures with higher resolution, such as atomic force microscopy (AFM), for the calibration. Such procedures, however, generally depend on a highly destructive sectioning of the sample, and are difficult to interpret because they give surface information rather than depth information. In this article, a procedure for calibration is described that overcomes these limitations and achieves a calibration of an STXM tomography image with an AFM image and a scanning electron microscopy image of the same object.A Ge star-shaped pattern was imaged at a synchrotron with a scanning transmission x-ray microscope. Nineteen high-resolution projection images of 200 × 200 pixels were tomographically reconstructed into a three-dimensional image. Features in two-dimensional images as small as 40 nm and features as small as 80 nm in the three-dimensional reconstruction were resolved. Transverse length scales based on atomic force microscopy, scanning electron microscopy, x-ray transmission and tomographic reconstruction agreed to within 10 nm. Toward the center of the sample, the pattern thickness calculated from projection images was (51 ± 15) nm vs (80 ± 52) nm for tomographic reconstruction, where the uncertainties are evaluated at the level of two standard deviations.     

Application of Super High Definition Images in Telemedicine: System Requirements and Technologies for Teleradiology and Telepathology

It was recognized early on that the digitization of medical information would advance the efficiency of diagnostic technology. However, the digitization of image data, which makes up the majority of medical information, is dependent on advances in technologies such as input, processing, transmission, storage, and display. Insufficient advances in such technologies has effectively limited the digitization of image data for medical use. The result of this has been non-networked systems or LANs confined to a single hospital. Such isolated systems integrate only portions of digital medical images such as x-ray computer tomography (CT), magnetic resonance (MR), and computed radiography (CR).Fortunately, recent advances in the areas of super high definition image I/O, high-quality encoding, super high speed transmission, and high-capacity storage has turned the tide in favor of the digitization and networking of all medical information. This paper will focus on the digitization and networking of medical image information used within hospitals and provide a multifaceted study of the technologies necessary for these advances. This will allow us to discuss the present state of related technical developments and the level that has been attained so far. In addition, we have targeted image information that demands the highest level of quality (radiological and pathological images) for application in medical diagnosis using super high definition images, the image technology being developed by the authors of this paper. We will cover the concrete issues and approaches to solutions that must be investigated when building and networking a digital system.