组合聚醚型聚氨酯泡沫塑料的动态力学性能分析

采用动态机械分析(DMA)仪,测试组合聚醚型聚氨酯泡沫塑料在不同温度、不同频率下的动态力学参数.结果显示:采用的频率越高,泡沫塑料的密度越大,存储模量越大,损耗角正切loss tangent(tan δ)出现峰值对应的温度相应滞后.这说明高密度的聚氨酯泡沫塑料能在更宽的温度范围内保持刚性,具有更好的抗变形能力.     

纳米电子器件的研究进展与军事应用前景

首先,分析了纳米电子器件碳纳米管、单电子晶体管的结构特点及其应用;然后,指出了碳纳米管、单电子晶体管应用中有待解决的问题;最后,综合阐述了纳米电子学的纳米技术在军事及航天领域中的应用前景。     

不同磁芯材料对电流探头传输阻抗Zt的影响

通过对铁基、钴基非晶合金与铁氧体软磁材料的性能和实际实验结果的分析、比较，由于非晶合金自身良好的磁性能，将其用于电磁兼容性试验设备中作为低频干扰电流探头的磁芯材料，实验证明选用铁基、钴基非晶合金，可使电流探头的检测灵敏度、精确度大大提高，从而为扩大非晶合金这一功能性材料的应用范围提供了实验依据．     

基于最小二乘拟合的不同探针测量线宽的比较

AFM探针的形貌和尺寸对纳米尺度线宽的测量有较大影响．首先建立了一个基于最小二乘的应用于AFM测量技术的线宽计量模型，并使用三种不同探针在NanoScopeⅢa型AFM上对设计线宽尺寸为1000nm的样本进行了测量．应用该模型和算法对线宽进行计算，揭示出探针尺寸对线宽测量结果的影响以及该模型对探针尺寸的依赖性．     

超精密测量关键技术的研究动态

超精密测量是超精密加工中的重要一环,目前其研究的内容主要涉及光干涉技术、电学测量技术以及扫描探针技术等几个方面,本文主要介绍了几种测量技术的工作原理、设备技术等方面的研究及进展情况.     

Surface modification of AFM silicon probes for adhesion and wear reduction

Tip wear of silicon probes used for an atomic force microscope (AFM) is a critical issue. Wear can result in an increase of tip radius and adhesion between tip and sample, thus reducing the image resolution and introducing artifacts. In order to reduce adhesion, friction, and wear so as to reduce tip related artifacts, liquid lubricant (Z-TETRAOL), self-assembled monolayers (pentafluorophenyltriethoxysilane (PFPTES)), and fluorocarbon polymer (Fluorinert™) were applied on the silicon probe. A comprehensive investigation of adhesion, friction, and wear of the uncoated/coated tips in both ambient air and various humidity levels as well as the influence of the coatings on the image resolution was performed. Experiments showed that the coatings reduced the adhesion, friction, and wear of the silicon tip, improved the initial image resolution, and exhibited less deterioration as compared to that of uncoated tip in the long-term test.     

The Atmospheric Scanning Electron Microscope with open sample space observes dynamic phenomena in liquid or gas

Although conventional electron microscopy (EM) requires samples to be in vacuum, most chemical and physical reactions occur in liquid or gas. The Atmospheric Scanning Electron Microscope (ASEM) can observe dynamic phenomena in liquid or gas under atmospheric pressure in real time. An electron-permeable window made of pressure-resistant 100 nm-thick silicon nitride (SiN) film, set into the bottom of the open ASEM sample dish, allows an electron beam to be projected from underneath the sample. A detector positioned below captures backscattered electrons. Using the ASEM, we observed the radiation-induced self-organization process of particles, as well as phenomena accompanying volume change, including evaporation-induced crystallization. Using the electrochemical ASEM dish, we observed tree-like electrochemical depositions on the cathode. In silver nitrate solution, we observed silver depositions near the cathode forming incidental internal voids. The heated ASEM dish allowed observation of patterns of contrast in melting and solidifying solder. Finally, to demonstrate its applicability for monitoring and control of industrial processes, silver paste and solder paste were examined at high throughput. High resolution, imaging speed, flexibility, adaptability, and ease of use facilitate the observation of previously difficult-to-image phenomena, and make the ASEM applicable to various fields.     

Computational models of a nano probe tip for static behaviors

It is difficult to predict the measurement bias arising from the compliance of the atomic force microscope (AFM) probe. The issue becomes particularly important in this situation where nanometer uncertainties are sought for measurements with dimensional probes composed of flexible carbon nanotubes mounted on AFM cantilevers. We have developed a finite element model for simulating the mechanical behavior of AFM cantilevers with carbon nanotubes attached. Spring constants of both the nanotube and cantilever in two directions are calculated using the finite element method with known Young's moduli of both silicon and multiwall nanotube as input data. Compliance of the nanotube-attached AFM probe tip may be calculated from the set of spring constants. This paper presents static models that together provide a basis to estimate uncertainties in linewidth measurement using nanotubes. In particular, the interaction between a multiwall nanotube tip and a silicon sample is modeled using the Lennard-Jones theory. Snap-in and snap-out of the probe tip in a scanning mode are calculated by integrating the compliance of the probe and the sample-tip interacting force model. Cantilever and probe tip deflections and points of contact are derived for both horizontal scanning of a plateau and vertically scanning of a wall. The finite element method and the Lennard-Jones model provide a means to analyze the interaction of the probe and sample and measurement uncertainty, including actual deflection and the gap between the probe tip and the measured sample surface.     

Improvements in planar feature reconstructions in atom probe tomography

Standard atom probe tomography spatial reconstruction techniques have been reasonably successful in reproducing single crystal datasets. However, artefacts persist in the reconstructions that can be attributed to the incorrect assumption of a spherical evaporation surface. Using simulated and experimental field evaporation, we examine the expected shape of the evaporating surface and propose the use of a variable point projection position to mitigate to some degree these reconstruction artefacts. We show initial results from an implementation of a variable projection position, illustrating the effect on simulated and experimental data, while still maintaining a spherical projection surface. Specimen shapes during evaporation of model structures with interfaces between regions of low- and high-evaporation-field material are presented. Use of two-and three-dimensional projection-point maps in the reconstruction of more complicated datasets is discussed.     

Three-dimensional image correction of tilted samples through coordinate transformation

In scanned probe measurements of micrometer- or nanometer-scale lines, it is nearly impossible to maintain the sample in a perfectly level position, and even a small amount of tilt can contribute to the accuracy of the result of the measure such as linewidth or step height. The current practice in image processing to deal with this problem is to conduct a line-by-line analysis to find the best fit of the substrate profile and subtract this background from all data points, thus describing 3D plane turns as a series of lines and processing them in succession in the x- or y-direction.In this paper a coordinate transformation method is proposed. The new coordinate system can be established on the basis of the inclined angle of the sample as well as the translation of three axes between the old coordinate system and the new coordinate system. The method can mathematically derive and hence correct all tilts around the x-, y- and z-axes and produce a leveled image simultaneously. Feature dimensions such as width, height, sidewall angle and pitch are calculated on the basis of simulated images using the coordinate transformation method and other methods. The result shows the advantage of the proposed method.