新设备技术在催化裂化装置上的应用

文章介绍了近年来在催化裂化装置上应用的新设备、新技术,如BY型旋风分离器、BSX型旋分式三级旋风分离器、上下拱型三级旋风分离器、下拱型三级旋风分离器、SHS“自蔓延”技术、SWY外取热器、BWJ型喷嘴、自流浇注料、Actehem高耐磨衬里、弓形钢丝纤维、侧拉环锚固钉、分体可拆人孔等的结构特点及实际应用情况。     

软件集成测试技术研究

首先分析了集成测试的原理和特点，并指出了集成测试的重要性。然后结合传统软件与面向对象软件开发的方法和技术，详细介绍了传统软件的集成测试方法和策略，并深入分析了面向对象软件集成测试的原理和方法。     

数值试井在白6-2井测试资料分析评价中的应用

数值试井是在近来发展的一项新的试井解释技术，具有处理非均质，复杂边界油气藏问题的优点，弥补了常规解析试井技术的不足。运用数值试井解释技术，结合动、静态资料，通过对白6-1断块白6-2井测试资料的综合分析评价，确定了储层渗流参数，落实了该气藏的边界情况，为该断块下一步开发提供可靠依据。     

复合材料手动扫描超声特征成像检测

研究了复合材料手动扫描超声特征成像检测，通过对超声检测信号的全波列采集与处理，实现了A，B，C扫描成像；相位特征成像；当量特征成像；超声层析技术和超声频谱分析技术。该系统已经在复合材料的检测上得到了良好的应用。     

丙烯腈－苯乙烯共聚物水解磺化产物对泥浆的稳定作用

在实验室条件下对用丙烯腈－苯乙烯共聚物在硫酸存在下的水解磺化产物（ＨＳＡＳ）处理的泥浆性能进行了评定。ＨＳＡＳ处理的泥浆有较小的滤失性，较好的耐盐和抗高温性。     

Test Case Generation as an AI Planning Problem

While Artificial Intelligence techniques have been applied to a variety of software engineering applications, the area of automated software testing remains largely unexplored. Yet, test cases for certain types of systems (e.g., those with command language interfaces and transaction based systems) are similar to plans. We have exploited this similarity by constructing an automated test case generator with an AI planning system at its core. We compared the functionality and output of two systems, one based on Software Engineering techniques and the other on planning, for a real application: the StorageTek robot tape library command language. From this, we showed that AI planning is a viable technique for test case generation and that the two approaches are complementary in their capabilities.     

埋地管道涂层检测技术现状

文章对各种埋地管道涂层检测技术进行了综述,并指出了各种技术的优缺点及应用前景.     

攀钢1450热轧带钢厂精轧机组电动压下机构带钢压下时的动特性计算和探讨

从理论上和实践上对武钢１７００、鞍钢１７００改造前后、本钢１７００改造前后和攀钢１４５０精轧机组的电动压下机构在带钢压下时的动特性进行计算和探讨，得出有说服力的结论。主题词：     

超声波车辆车轴探头的研制与应用

提出了一种用于检测在役车辆车轴产生疲劳裂纹的超声波方法,设计了中心孔探头与斜角探头一起,完成了对车辆车轴的关键区域探伤。     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.