Absolute Measurements of the Magnetic Field Generated by Different Coils in the Center of EGYPTOR Tokamak

The present work is devoted to measure the absolute magnetic field produced by different coils in the EGYPTOR tokamak using a calibrated pickup coil. Scaling these measurements in different equations connected with the discharge currents from each supply system are performed. The pickup coil used in the present study is well calibrated with Helmholz coils at the IPP in Prague, Czech Republic. A 0.2% deviation has been found between an evaluation done in the present study and the calibration using Helmholz coils. Experimental measurements of the toroidal magnetic field are in good agreement with calculations to within 2%. Very low values of stray magnetic field components arising from TF and OH coils are recorded which proves that the compensation coils for these components are sufficient.     

多层频率选择表面的分析

本文利用矩量法和广义散射矩阵理论分析了多层频率选择表面的散射特性。通过引入广义波导概念,可以统一分析单元形状为任意的多层频率选择表面。作为示例,计算了几种不同结构频率选择表面的散射特性,结果与文献中给出的数据相符。     

光电摆角动态测量原理及其测量系统

本文阐述了用于测量物体摆角及摆心浮动量的光电动态实时测量原理,以及根据此原理研制的光电导弹喷管摆角动态测量系统。     

排列互比法用于超精测角的研究

作者分析了我互比法现行的两种数据处理方法的缺点，提出了应用最小二乘法原理推导出合理的数据处理方法。本文还首次从理论上阐明了排列互比法测量结果中出现一次谐波系统误差的原因，提出了减少和消除这一些系统误差的方法，并给实验验证。     

旋波媒质基本参数的一种测试方法

本文提出了直接利用旋波材料板的Ｓ参数获得其基本参数的方法。通过自由空间测量旋波材料板的反射场和透射场，可以反演得到媒质的复介电常数、复磁导率、旋波量以及透射场的轴比和旋转角，测试程序简单，结果精度高。     

Novel miniature integrated optical goniometers

A new principle and arrangement for directly determining the angle of incidence of an optical beam on an object are proposed and demonstrated. The novelty of the approach lies in the realization of a ‘smart object’, which extracts a portion of the incident beam's power into an optical waveguide attached to the object's surface or embedded in its body for converting the angle of incidence into the position of a guided beam with finite lateral extent. This ‘integrated optical light pointer’ beam is accomplished by means of creating additional degrees of freedom on the target in two different ways. While a first type is based on introducing spatial variations of the waveguide thickness, a second type makes use of a chirp of the grating periodicity. The feasibility for practical applications has been experimentally demonstrated by a direct comparison with a commercial high-resolution encoder, resulting in an r.m.s. error of <30′'. Measurements have been performed for chips fabricated based on replicated polycarbonate substrates and with no external optics, showing the great potential of this approach for realizing low-cost yet high-performance miniature goniometers.     

小型办公网络组网

通过实例,对小型办公网络组网中涉及到的需求设计、网络连接、网络设备、设备连接等进行了论述。     

Analysis of crack tip plasticity for microstructurally small cracks using crystal plasticity theory

Crack tip plastic zone sizes and crack tip opening displacements (CTOD) for stationary microstructurally small cracks are calculated using the finite element method. To simulate the plastic deformation occurring at the crack tip, a two-dimensional small strain constitutive relationship from single crystal plasticity theory is implemented in the finite element code ANSYS as a user-defined plasticity subroutine. Small cracks are modeled in both single grains and multiple grains, and different crystallographic conditions are considered. The computed plastic zone sizes and CTOD are compared with those found using conventional isotropic plasticity theory, and significant differences are observed.     

Almost k-wise independence versus k-wise independence

We say that a distribution over {0,1}ⁿ is (ε,k)-wise independent if its restriction to every k coordinates results in a distribution that is ε-close to the uniform distribution. A natural question regarding (ε,k)-wise independent distributions is how close they are to some k-wise independent distribution. We show that there exist (ε,k)-wise independent distributions whose statistical distance is at least n^O(k)·ε from any k-wise independent distribution. In addition, we show that for any (ε,k)-wise independent distribution there exists some k-wise independent distribution, whose statistical distance is n^O(k)·ε.