Interfacial reactions of Cu-containing lead-free solders with Au/NiP metallization

Cu-containing solder alloys have been used to identify their interfacial reactions with electroless NiP. As-reflowed, AuSn₄ intermetallic compounds (IMCs) are formed in the Sn-Cu and Sn-Ag-Cu solders, but in the cases of Sn-Ag-Cu-In, In-Sn-Au IMCs are formed and are uniformly distributed in the solder. Different types of IMCs such as high-Cu (>30 at.%), medium-Cu (30-15 at.%), and low-Cu (<15 at.%) containing IMCs are formed at the interface. High-Cu and medium-Cu containing ternary intermetallic compounds (TIMCs) are found in the Sn-Cu and Sn-Ag-Cu solder joints, respectively. Medium-Cu containing quaternary intermetallic compounds (QIMCs) are found in the Sn-Ag-Cu-In joints. Initially, TIMCs and QIMCs have higher growth rates, resulting in the entrapment of some Pb-rich phase in the high-Cu containing TIMCs and some In-Sn-Au phase in the QIMCs. High-Cu containing TIMCs have a lower growth rate and consume less of the NiP layer. The spalling of medium-Cu containing TIMCs in the Sn-Ag-Cu solder increases both the growth rate of TIMCs and the consumption rate of the NiP layer. Low-Cu containing QIMCs in the Sn-Ag-Cu-In solder are stable on P-rich Ni and reduce the dissolution rate of the NiP layer. Consumption of the NiP layer can be reduced by adding Cu or In, because of the changes of the interfacial IMCs phases, which are stable and adhere well to the P-rich Ni layer during reflow.     

PCB阻焊膜的功能

阻焊膜不仅起着阻焊作用,而且还起着防腐蚀、防潮湿和防霉菌的作用。     

Recent Observations on Tin Pest Formation in Solder Alloys

The most recent observations of the response of bulk samples of several lead-free solder alloys, exposed to temperatures below the allotropic transition for tin for extended periods, are reported. Tin pest has been observed in Sn-0.5Cu, Sn-3.5Ag, Sn-3.8Ag-0.7Cu, and Sn-3.0Ag-0.5Cu alloys at both −18°C and −40°C. The process is slow and inconsistent, usually requiring several years, but may eventually result in complete disintegration of the sample. No tin pest was detected in Sn-Zn-3Bi or in the traditional Sn-37Pb solder alloy after exposure for up to 4 and 10 years, respectively. It is suggested that nucleation is affected by local composition and that extremely small amounts of either intentional solute or impurity are influential. Growth of tin pest is accompanied by a large volume change, and it is likely that stress relaxation ahead of the expanding grey tin front is a controlling factor. A stronger matrix would be more resistant in this case, and at the temperatures of exposure Sn-37Pb is stronger than either Sn-3.5Ag or Sn-0.5Cu. The absence of tin pest, to date, on actual joints is attributed to their restricted free surface area and the greater strength associated with very small samples.     

面罩壳体对显示屏效果的影响

随着LED显示屏控制技术和校正技术的发展,各厂家的显示效果优劣差距在进一步缩小,这个时候,显示屏外观结构件对其的影响就凸显起来,本文将从提高对比度、降低马赛克、增强耐候性三个方面来论述面罩、壳体的设计对LED显示屏在黑屏和亮屏时产生的不同影响。     

分立IGBT的封装技术研究

文章通过对单器件的分立IGBT的封装结构进行分析,针对其结构特点和封装技术要求,特别是封装关键工艺芯片切割的影响,对装片、焊接方面进行工艺研究。并通过试验分析解决实际生产所出现的技术问题,由此形成一套适应于大批量封装生产的IGBT封装工艺技术,成功地应用于分立IGBT器件的批量生产,保证了产品的可靠性,取得了很好的生产效益。     

均匀液滴喷射成球法的射流速度计算

分别通过流体力学计算、数值模拟及实验方法研究在不同压力作用下生产电子封装用锡球时不同喷嘴的射流速度。对比分析表明,理论计算和模拟与实验结果基本相符;理论计算方法较方便、准确计算出射流出口的平均速度,数值模拟方法不但可求得平均速度,而且可得到射流断面的速度分布。保持喷嘴直径不变,射流速度随压力增加而呈抛物线形增加。在相同压力作用下,射流速度随喷嘴直径增加而稍有增加,随过渡段直径增加而减小,并且压力差越大增加值或减小值也越大。     

非醇醚类助焊剂及其焊膏的研究

研究了多元醇类溶剂及其复配物对Sn0.3Ag0.7Cu焊膏性能的影响。结果表明:四氢糠醇和聚丙二醇对冰白和水白松香都具有较强的溶解性。当四氢糠醇和聚丙二醇以质量比9:1复配时,获得的焊膏平均铺展率可达87%以上,焊点完整、饱满、无焊球和桥连等缺陷,储存时间较长,是一种综合性能良好的焊膏。     

论波峰焊接质量控制方法

从印制板的设计、印制板和元器件的可焊性、波峰焊机的调整、助焊剂的选用等方面探讨了提高波峰焊质量的有效方法。     

Morphological stability of solder reaction products in flip chip technology

We have studied two kinds of solder reactions between eutectic SnPb and Cu. The first is wetting reaction above the melting point of the solder, and the second is solid state aging below the melting point of the solder. In wetting reaction, the intermetallic compound (IMC) formation has a scallop-type morphology. There are channels between the scallops. In solid state aging, the IMC formation has a layer-type morphology. There are no channels but grain boundaries between the IMC grains. Why scallops are stable in wetting reactions has been an unanswered question of fundamental interest. We have confirmed that the scallop-type morphology is stable in wetting reaction by re-wetting the layer-type IMC by molten eutectic SnPb solder. In less than 1 min, a layer-type Cu₆Sn₅ is transformed back to scallops by the molten solder at 200 C. In analyzing these reactions, we conclude that the scallop-type morphology is thermodynamically stable in wetting reaction, but the layer-type morphology is thermodynamically stable in solid state aging, due to minimization of interfacial and grain boundary energies.     

板级立体组装侧板垂直互联技术

通过对板级立体组装的侧板垂直互联技术进行研究,找到了板级垂直互联的一种可靠的理论途径,很好地解决了板间垂直互联的问题,实现了板级立体组装的侧板垂直互联工艺技术.