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51.
Mg fi lms of various thicknesses were deposited on Si(111) substrates at room temperature by resistive thermal evaporation method, and then the Mg/Si samples were annealed at 40 ℃ for 4 h. The effects of Mg fi lm thickness on the formation and structure of Mg2Si fi lms were investigated. The results showed that the crystallization quality of Mg2Si fi lms was strongly infl uenced by the thickness of Mg fi lm. The XRD peak intensity of Mg2Si(220) gradually increased initially and then decreased with increasing Mg fi lm thickness. The XRD peak intensity of Mg2Si(220) reached its maximum when the Mg fi lm of 380 nm was used. The thickness of the Mg2Si fi lm annealed at 400 ℃ for 4 h was approximately 3 times of the Mg fi lm. 相似文献
52.
王建军 《工程地球物理学报》2014,11(5):609-613
采用相关性回归分析和聚类分析优选出三种地震属性:瞬时频率算术平均值、总振幅、总能量。应用线性回归方法建立了瞬时频率算术平均值、总振幅、总能量和煤层厚度之间的回归模型。通过对三元三次回归模型与三元一次、三元二次回归模型预测结果的对比分析,选用三元三次回归模型预测了山西宁武某煤矿的煤层厚度。 相似文献
53.
Rongbin Li Qiyu Huang Dongxu Zhang Xiangrui Zhu Jinxu Shan Zhimin Li 《American Institute of Chemical Engineers》2021,67(1):e17077
In this study, the thickness and wax content of wax deposits were found to be thinner and lower in the polyethylene (PE) pipe than in the stainless steel (SS) pipe using a flow loop apparatus. The diffusivity of wax, radial thermal gradient, and wax precipitation rate in the PE and SS pipes were calculated and compared. It was found the diffusivity of wax in the PE pipe was higher and tended to enhance the wax deposition in the PE pipe, while the radial thermal gradient and wax precipitation rate were lower in the PE pipe and had the opposite effects. These factors are shown to be comparable with each other and the effect of the thermal gradient dominates the mass flux of wax from bulk to the oil-deposit interface and into the deposits finally, thus causing differences in thickness and wax content of deposits between the PE and SS pipes. 相似文献
54.
During the Physical Vapour Deposition of coatings, the orientation of cemented carbides insert surfaces to the plasma flux direction affects the occurring film thickness distribution on the rake and flank, which in turn might influence the wear propagation in cutting processes. In the present paper the cutting performance in milling of PVD coated cemented carbides inserts with variable film thickness on the rake and flank is introduced and with the aid of FEM-supported calculations explained. The investigation results revealed that a thicker film on the tool rake in comparison to the existing one on the flank and moreover a thick and uniformly deposited film in the cutting wedge region significantly enhances the cutting performance in milling. 相似文献
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56.
0IntroductionRecently,the development of bonding technique ofhigh temperature structure ceramic Si3N4becomes a hottopic in the field of ceramic bonding[1].Partial transientliquid phase bonding(PTLP)has been applied in the fieldof high temperature ceramic bonding and made some pro-gress.The selection of interlayer materials is key to PTLPbonding.Since Bender discovered that Ag-based brazingmaterial including Ti could wet ceramic in1954,morestudies have shown that Ti has good wetting prope… 相似文献
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59.
Effects of coating thickness and residual stresses on the bond strength of ASTM C633-79 thermal spray coating test specimens 总被引:1,自引:0,他引:1
D. J. Greving J. R. Shadley E. F. Rybicki D. J. Greving J. R. Shadley E. F. Rybicki 《Journal of Thermal Spray Technology》1994,3(4):371-378
Wire-arc-sprayed nickel-aluminum is widely used in the aircraft industry for dimensional restoration of worn parts and as
a bond coat for thermal barrier coatings and other top coats. Some repair applications require thick coatings, which often
result in lower bond strength. A mechanism being investigated to ex-plain this decrease in bond strength is the free edge
effect, which includes both coating residual stresses and coating thickness. The layer-removal method was used to determine
experimentally the residual stresses in wire-arc-sprayed nickel-aluminum coatings of different thicknesses. Bond strength
evalu-ations were performed using an improved ASTM C 633-79 test specimen. Finite-element analysis and fracture mechanics
were used to investigate the effects of coating thickness and residual stress state on coating bond strength. 相似文献
60.
Characterisation of n-type GaAs, etched in a 5:1:1 mixture of H2SO4:H2O2:H2O, was performed using X-ray photoelectron spectroscopy (XPS) and electrochemical AC impedance. Quantitative XPS analysis of GaAs indicated that the as-received wafers had a gallium-rich native oxide which was not affected by solvent degreasing treatments. Subsequent, oxidative etching formed a thinner arsenic-rich oxide. It is suggested that etching causes initial thinning of the native oxide; subsequently, transport of Ga and As ions occurs through the film by high-field ionic conduction. Arsenic enrichment in the resultant oxide film arises from the greater mobility of Ga3+ ions compared with As3+ ions as well as the relative solubility of Ga2O3 compared with As2O3. The as-received oxide film thickness, determined from the ratio of the oxide to substrate XPS peaks, was approximately 1.1 nm. After etching this was reduced to about 0.7 nm. This thickness is consistent with the driving voltage for oxide formation being provided by the electrochemical potential difference between hydrogen peroxide and the GaAs wafer (i.e. between 0.4 V, for As, and 1.2 V, for Ga, at a nm V−1 ratio of 2). Capacitance measurements, derived from electrochemical impedance data, combined with film thickness data, gave a value of about 5 for the dielectric constant of As2O3. 相似文献