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31.
32.
阐述了微型计算机串行通信中20mA电流环方式较之电平驱动方式的优点,提出了一种基于通用串行接口实现电流环方式通信的设计方案。设计了合理的接线图和电路原理图,并就有关电路设置、工作原理进行了详细说明。 相似文献
33.
对于采用三相不控整流桥作为前级的变换器,自然条件下其输入电流波形系数不高,使得输入功率因数委低,降低了电源的利用率。为此需要采用功率因数提高技术,其中无源PFC是一类重要的功率因数校正技术,在某些场合非常具有应用价值。本文介绍了几种三相无源AC-DC变换器的高功率因数方案,如采用LC滤波器、移相电抗器,谐振电抗器,移相变压器,相间变压器,相间电抗器等,在进行简单的工作原理描述后,给出了部分方案的MATLAB/SIMULINK仿真结果。 相似文献
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A novel passive dual energy recovery snubber circuit is presented where energy trapped in the snubber inductor and capacitor is recovered into the both DC rail and load, without any active devices or resistors. The maximum over-shoot voltage on the switch is fixed, peak switch current is low, circuit reset is fast and the operational range of load current is wide. This circuit is suitable for use in high frequency, single ended power gate turn-off (GTO) thyrister choppers. Main design equations, some simulations and practical results are included. 相似文献
36.
The concept of model-based test was developed in order to reduce the production test effort for data converters (Cherubal
and Chatterjee (IEEE Trans Circuits Syst part I 50(3):317–327, 2003); Stenbakken and Souders (1985) Modelling and test point selection for data converter testing. In: ITC, Int Test Conf, pp 813–817; Wegener and Kennedy (IEEE
Trans Circuits Syst I 51(1):213–217, 2004); Wrixon and Kennedy (IEEE Trans Instrum Meas IM-48(5):978–985, 1999)). In applying this concept, a vector of model parameters is determined for each device under test (DUT). Typically, this
model parameter vector is merely used to calculate the DUT performance characteristic which is then subject to specification-oriented
testing. However, each element of the model parameter vector represents an independent error source which contributes to performance
degradations; thus, the model parameter vector can be viewed as a signature of the error sources. In this work, analyzing
the error source signature is used to devise a model-based methodology for hard-fault detection and diagnosis. We investigate
conditions under which hard-faults are detectable/diagnosable in spite of masking effects due to manufacturing process variations.
In particular, we show that taking the model parameter vector as the fault signature is optimal as it minimizes the masking
effects and thus maximizes detectability/diagnosibility.
Carsten Wegener has been awarded the academic degree of a “Diplom-Ingenieur” in Electronic Circuits and Systems by the Technical University of Dresden, Germany, in 1997. During a period of two years, 1996 through 1998, he attended the lecture series for the “Vordiplom” in Mathematics at Humboldt-University at Berlin, Germany. In Spring 1998, he moved permanently to Ireland, where he started to work with the Test Department of Analog Devices B.V. in Limerick. In Autumn of the same year he took up his PhD-studies with Dr M.P. Kennedy in the area of model-based testing of mixed-signal integrated circuits. He has been awarded the PhD degree by the National University of Ireland in December 2003. In 2006, Carsten moved to Germany working with Infineon Technologies AG as an Analog Mixed-signal Design-for-Test Engineer on innovative data converter test approaches. He has contributed to numerous conferences, publishing works in areas of nonlinear oscillator dynamics and mixedsignal testing. In Ireland, he has taught MATLAB courses to design and test engineers at Analog Devices B.V., and graduate courses on “Digital Design-for-Test” and “Mixed-signal Test and Testability” at the Department of Microelectronic Engineering, University College Cork. Michael Peter Kennedy received the B.E. degree in electronics from the National University of Ireland in 1984, and the M.S. and Ph.D. degrees from the University of California at Berkeley (UC Berkeley) in 1987 and 1991, respectively, for his contributions to the study of neural networks and nonlinear dynamics. He worked as a Design Engineer with Philips Electronics, a Postdoctoral Research Engineer with the Electronics Research Laboratory, UC Berkeley, and as a Professeur Invite with the EPFL, Switzerland. He returned to University College Dublin in 1992 as a College Lecturer in the Department of Electronic and Electrical Engineering. He was appointed Professor of Microelectronic Engineering in 2000 and Vice-President for Research in 2005 at University College Cork. He has published 200 articles in the area of nonlinear circuits and systems and has taught courses on nonlinear dynamics and chaos. His research interests are nonlinear circuits and systems for applications in communications and signal processing. Since 1995 he has been active in research into algorithms for mixed-signal testing. Since 1994, he has led international basic and applied research projects on chaotic communications valued at over USD 2M. Dr. Kennedy was elected a Fellow of the IEEE in 1998. He received the Third Millenium Medal from the IEEE in 2000, the IEEE Circuits and Systems Society Golden Jubilee Medal, and the inaugural Parson’s Award for excellence in Engineering Sciences from the Royal Irish Academy in 2001. 相似文献
Michael Peter KennedyEmail: |
Carsten Wegener has been awarded the academic degree of a “Diplom-Ingenieur” in Electronic Circuits and Systems by the Technical University of Dresden, Germany, in 1997. During a period of two years, 1996 through 1998, he attended the lecture series for the “Vordiplom” in Mathematics at Humboldt-University at Berlin, Germany. In Spring 1998, he moved permanently to Ireland, where he started to work with the Test Department of Analog Devices B.V. in Limerick. In Autumn of the same year he took up his PhD-studies with Dr M.P. Kennedy in the area of model-based testing of mixed-signal integrated circuits. He has been awarded the PhD degree by the National University of Ireland in December 2003. In 2006, Carsten moved to Germany working with Infineon Technologies AG as an Analog Mixed-signal Design-for-Test Engineer on innovative data converter test approaches. He has contributed to numerous conferences, publishing works in areas of nonlinear oscillator dynamics and mixedsignal testing. In Ireland, he has taught MATLAB courses to design and test engineers at Analog Devices B.V., and graduate courses on “Digital Design-for-Test” and “Mixed-signal Test and Testability” at the Department of Microelectronic Engineering, University College Cork. Michael Peter Kennedy received the B.E. degree in electronics from the National University of Ireland in 1984, and the M.S. and Ph.D. degrees from the University of California at Berkeley (UC Berkeley) in 1987 and 1991, respectively, for his contributions to the study of neural networks and nonlinear dynamics. He worked as a Design Engineer with Philips Electronics, a Postdoctoral Research Engineer with the Electronics Research Laboratory, UC Berkeley, and as a Professeur Invite with the EPFL, Switzerland. He returned to University College Dublin in 1992 as a College Lecturer in the Department of Electronic and Electrical Engineering. He was appointed Professor of Microelectronic Engineering in 2000 and Vice-President for Research in 2005 at University College Cork. He has published 200 articles in the area of nonlinear circuits and systems and has taught courses on nonlinear dynamics and chaos. His research interests are nonlinear circuits and systems for applications in communications and signal processing. Since 1995 he has been active in research into algorithms for mixed-signal testing. Since 1994, he has led international basic and applied research projects on chaotic communications valued at over USD 2M. Dr. Kennedy was elected a Fellow of the IEEE in 1998. He received the Third Millenium Medal from the IEEE in 2000, the IEEE Circuits and Systems Society Golden Jubilee Medal, and the inaugural Parson’s Award for excellence in Engineering Sciences from the Royal Irish Academy in 2001. 相似文献
37.
V. Kerzérho S. BernardF. Azaïs M. ComteO. Potin C. ShanG. Bontorin M. Renovell 《Microelectronics Journal》2013
The histogram-based technique is commonly used for testing of Analog-to-Digital Converters (ADC). One of the parameters measured thanks to this technique is the Integral Non Linearity (INL). INL is also used as an initial data related to the ADC performances for the computation of a correction table in case of a LUT-based correction technique. In this context of embedded INL measurement and embedded computation of the table for LUT-based correction of ADC, we propose a new implementation establishing what we consider the best trade-off between silicon area overhead and computing time. We compare our solution with the state of the art: (a) with VHDL-level simulation we compare time performance, and (b) with FPGA placer we estimate the final surface head-out. 相似文献
38.
掌握变频器的控制,具有十分重要的现实意义。提出了基于欧姆龙CP1H-XA-40DTD型号PLC的台达VFD系列变频器组合的调速控制方案,包括模拟方式控制和无协议串口方式控制。给出了变频调速系统原理框图,调试了对应的硬件和软件,总结了两种控制方式的优缺点及适用场合。 相似文献
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40.
M. Meinhardt V. Leonavicius J. Flannery S. C.
Mathúna 《Microelectronics Reliability》1999,39(10):1461
This paper deals with thermal and reliability aspects of converters for grid connected photovoltaic applications (rate power approximately 100 W) which can be integrated into solar modules. The use of these Module Integrated Converters (MIC) promises a reduction of costs due to mass production. It improves behaviour of the whole photovoltaic system, as there is no voltage mismatch caused by shading effects. The electronic components of the MIC are exposed to extreme environmental conditions. Lifetime limiting factors are described. Methods to increase the lifetime of the most crucial components in the MIC, electrolytic capacitors, are described. The presented 1st generation Low Profile MIC with “optimised design” is capable of running in very high ambient temperatures. This design maximises availability of the photovoltaic system, which consequently leads to a cost reduction of the electrical energy delivered to the grid. Different realisations of how to integrate the designed Low Profile MIC into the solar module are discussed. A detailed thermal simulation is used to optimise the MIC design according to temperature and reliability issues. The models used for thermal simulation are described. 相似文献