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81.
When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901. 相似文献
82.
Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test. 相似文献
83.
In order to study the influence of cerium ion implantation on the aqueous corrosion behavior of zircaloy-4, specimens were implanted by cerium ions with a fluence range from 1×1016 to 1×1017 ions/cm2 at maximum 150°C, using MEVVA source at an extracted voltage of 40 kV. The valence and elements penetration distribution of the surface layer were analyzed by X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) respectively. Glancing angle X-ray diffraction (GAXRD) was employed to examine the phase transformation due to the cerium ion implantation in the oxide films. Three-sweep potentiodynamic polarization measurement was employed to value the aqueous corrosion resistance of zircaloy-4 in a 1 N H2SO4 solution. It was found that a significant improvement in the aqueous corrosion behavior of zircaloy-4 implanted with cerium ions compared with that of the as-received zircaloy-4. The improvement effect will declined with raising the implantation fluence. The bigger is the fluence, the less is the improvement. Finally, the mechanism of the corrosion behavior of the cerium-implanted zircaloy-4 is discussed. 相似文献
84.
The cohesive model is used for the prediction of the crack path during stable crack extension in ductile materials. The problem of crack-path deviation is investigated by means of simulation of crack propagation in a round tensile bar. The respective phenomenon is known as cup-cone fracture. It is shown that the model is able to predict the failure mechanism, which consists of normal fracture in the center and combined normal/shear fracture in the so-called “shear lips” at the specimen’s rim. The damage evolution and crack path predicted by the model are presented. The effect of the normal and shear failure parameters on the crack-deflection point and several aspects of the finite element mesh are discussed. 相似文献
85.
86.
Ozgur Sinanoglu Ismet Bayraktaroglu Alex Orailoglu 《Journal of Electronic Testing》2003,19(4):457-467
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test vector loading techniques result in frequent transitions in the scan chain, which in turn reflect into significant levels of circuit switching unnecessarily. Judicious utilization of logic in the scan chain can help reduce transitions while loading the test vector needed. The transitions embedded in both test stimuli and the responses are handled through scan chain modifications consisting of logic gate insertion between scan cells as well as inversion of capture paths. No performance degradation ensues as these modifications have no impact on functional execution. To reduce average and peak power, we herein propose computationally efficient schemes that identify the location and the type of logic to be inserted. The experimental results confirm the significant reductions in test power possible under the proposed scheme. 相似文献
87.
辽河干流堤防安全泄量为5000m3/s,盘锦城市防洪工程竣工后,其安全泄量为6800m3/s。而盘山闸的设计泄流能力仅为3000m3/s。通过本模型试验研究进一步确定扩建工程方案的合理性。 相似文献
88.
89.
张万贞 《石油化工腐蚀与防护》2006,23(3):22-25
介绍了在湿H2S环境中金属材料的腐蚀试验标准、方法和手段并重点强调了在H2S试验过程中常遇到的一些问题的处理方法.最后,指出了应加强H2S腐蚀的基础性和系统性研究的研究方向. 相似文献
90.
部件试验模态综合的简便方法 总被引:4,自引:1,他引:3
本文将一种基于完备模态基的模态综合技术应用于子结构的试验模态综合,获得成功。这种半试验半理论的模态综合方法是一种较为简便的、要求试验工作量较小的试验模态综合法,因为它只要求测量子结构的振动模态和频率即可。数值仿真结果表明,这种简便的试验模态综合法是行之有效的。 相似文献