基于BOOSt结构下不连续导电模式的PFC电路

采用现代高频功率变换技术的有源功率因数校正（Power Factor Corrector,PFC)技术是解决高频开关变换器谐波污染的有效手段。与传统的PFC电路相比，有源PFC电路的输入电流接近正弦波且与输与电压同相位，能有效抑制电流波形畸变和谐波，因此避免了对同一电网设施的干扰。在PFC电路中，Boost变换器是研究和应用得最多的一种变换器。本文着重分析了Boost电路在不连续导电模式状态下，PFC电路的临界条件，对实际电路结构的设计有很好的指导意义。     

微型计算机的接触电流和接地线电流的测量

介绍了微型计算机的两种不同类型的泄漏电流的危害及其测量方法。     

一种在Kalman滤波中引入径向速度测量的新方法

研究在距离和径向速度测量噪声统计相关的情形下把径向速度测量引入Kalman滤波的新方法。分析了径向速度测量噪声与位置测量更新后状态滤波误差的统计相关性,根据Gauss-Markov定理导出了对应于径向速度测量的滤波方程由此而得到一种序贯滤波算法。两个不同的蒙特卡罗仿真表明,通过采用这一新算法引人径向速度测量,不仅可以大大提高状态估计的精度,而且其估计性能和计算效率优于传统的EKF。     

Precision equipment for symmetrical bending— Part 1. The loading system

The design and performance of precision bending equipment for testing straight beams with constant rectangular section under a pure bending moment is described. Part 1 deals with the loading arrangements and Part 2 with the rig for measuring beam deflection. The methods for recording deflection of strain gauges applied on the beam have been described elsewhere.^1–4
The reactions to the deadweight gravity loads are taken via ball bearings. The total bending moment inaccuracy, i.e. the sum of estimated systematic errors and random errors, the latter expressed as the 2Ga confidence interval about the mean (2G_cim), is about ± 25 x. 10^-4%, for 23 tests with a steel beam with 15 mm × 75 mm cross sectional dimensions, loaded to 1-1.5 mm/m strain.
The measuring rig stands on the beam via hardened and polished spherical segment feet and uses a capacitive transducer system with less than 5nm resolution. Various application tasks are described. The total inaccuracy of the measured deflection, i.e. apart from bending moment inaccuracy, is about ± 35 times 10^4% for about 10 reproduced, not repeated, tests with the same steel beam. The deflection for such a beam is of the order of 2 to 4 mm.     

Effect of refraction on optical microscopic measurement of internal blood-vessel diameter and its correction

In optical microscopic measurement of internal blood-vessel diameters, the effect of refraction must be taken into account to ensure accuracy of the result. This effect is discussed and an analytical correction formula derived. Phantom blood vessels with known internal and external diameters were used to test the validity of the correction formula. The errors obtained prior to correction were reduced significantly after correction.     

The solution of the inverse problem of gravitational potential using a set of measurements of different field elements

A numerical solution of the inverse problem of the gravitational field at a single point is obtained using six field elements for a point, a spherical cap, a differential spherical sector and a vertical segment. In the system of six equations obtained, the unknowns are the mass of the body, the depth of its center, and the second, third, and fourth degree moments. The accuracy of the solution of this system is ten times higher than when using three field elements. __________ Translated from Izmeritel’naya Tekhnika, No. 5, pp. 3–8, May, 2007.     

Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary

This paper is a report on the effect of a single perpendicular grain boundary on the hot-carrier and high current stability in high performance polycrystalline silicon (poly-Si) thin film transistors (TFTs). Under a hot carrier stress condition (Vg = Vth + 1 V, Vd = 12 V), the poly-Si TFT with a single grain boundary is superior to the poly-Si without any grain boundary because of the smaller free carriers available for electric conduction. The shift of transconductance in poly-Si TFT with a single grain boundary is less than 5% after hot carrier stress during a period of 1000 s. The shift of transconductance is about 25% in the case of the poly-Si TFTs without a grain boundary in the channel. On high current stress, the poly-Si TFT without the grain boundary is less degraded than the poly-Si TFT with the grain boundary because the concentrated electric field near the drain junction is lower.     

Feasibility study of absolute activity measurement with metallic magnetic microcalorimeters

We report on a feasibility study on precise determination of mass-specific activity of low-energy emitting radioisotopes. Conventional methods of activity measurement suffer from source self-absorption and a strong decrease in detection efficiency for low-energy electrons and photons. We propose a new method based on metallic magnetic microcalorimeters with the source embedded in the detector target in a 4π geometry. First results with a ⁵⁵Fe source show that electrons and photons are detected with a detection efficiency close to unity and with little loss of energy for electrons. The aim of this study is to provide standards of activity with very low uncertainties in the framework of radiation metrology.     

Modeling and Analysis of a Long Thin Conducting Stripline

A long thin conducting stripline embedded in a dielectric and centered between two large conducting plates, i.e., the stripline environment, is considered. The stripline is modeled as infinitely long, infinitely thin, and perfectly conducting by first considering a stripline of finite length, thickness, and conductivity in a dielectric layer. Starting from Maxwell's equations and assuming that the current on the stripline is a propagating wave in length direction, asymptotic expressions for the fields inside and in the neighbourhood of the stripline are deduced. These expressions are used to model the stripline in the stripline environment, which leads to a boundary-value problem for the electric potential. This problem is solved by two different approaches, leading to integral equations for the current and for an auxiliary function describing the electric potential. A relation between the current and the auxiliary function is deduced, which is used to obtain asymptotic expressions for current and impedance. Results are compared with a numerical solution of the integral equation for the current and with results in literature.     

纳米颗粒的测量与表征

介绍了用于纳米颗粒测量的电镜观察法、X射线衍射线宽法、激光粒度分析法、比表面积法、颗粒沉降法、扫描探针显微术以及小角X射线散射等,并对其测量原理、测量过程、适用范围及测量方法的优缺点进行了讨论。