高速采样示波器中的时基失真及其估计

介绍了时基失真的概念及产生原理。改进了美国NIST提出的时基失真的数学模型，据此模型仿真出时基失真的数据，进而仿真出测量数据。给出了为估计采样示波器的时基失真所采取的方法——最小二乘法。这种方法需要在多相位、多频率上测量信号，可以精确地估计谐波模型的阶数。最后介绍了如何根据已经得到的估计值来修正时基失真。     

ISA法铜电解槽槽面水平误差的控制

本文介绍了通过采用找平装置来控制ISA法铜电解槽槽面水平误差的方法,通过现场测量及工艺操作证明是行之有效的。     

Escapable Conclusions: Toomela (2003) and the Universality of Trait Structure.

A. Toomela (2003) concluded that personality structure may be shaped by a cultural mechanism, word meaning structure, and that the apparent universality of the Five-Factor Model (FFM) was the result of inadequate sampling of concrete thinkers. A reanalysis using targeted rotation showed that the intended structure was generally replicated; small deviations in the most concrete thinkers were probably due to measurement error. The reanalysis authors found no evidence of structural differences in a second sample of adults classified as concrete or abstract thinkers. The FFM structure has been replicated in many samples containing individuals with cognitive or educational limitations; observer ratings may be preferred if these limitations are severe. To date, there is no compelling evidence that culture affects personality structure. (PsycINFO Database Record (c) 2010 APA, all rights reserved)     

使用夹具加工工件时定位误差分析与计算探讨

本文概述了定位误差产生的原因，综合分析了各种定位误差计算方法的优缺点，提出了用“调整法”在斜面上钻孔时，特定的工序尺寸标注情况下，计算定位误差出现的新问题，从而导出了定位误差更为广泛的概念。     

直读式测钙仪电计电位校准方法研究

介绍了直读式测钙仪电计电位的校准方法,包括电计电位示值误差和重复性测量方法,以及对仪器电计电位示值误差测量不确定度的评定等。     

750 kV CVT现场检验误差影响因素分析

为了提高采用比较法进行750 kV CVT现场误差检验的准确性,通过大量的出厂试验与现场检验数据的对比,对检测数据进行统计分析,首次全面系统地分析了750 kV CVT现场检验的误差影响因素,归纳出750 kV CVT现场检验误差的主要影响因素,计算出了各主要影响因素对750 kV CVT比值差和相位差的影响量,总结出750 kVCVT在不同的影响因素下,其比值差和相位差的变化趋势,对现场检验测试和生产厂家出厂试验提出相应的建议和修正值,从而给同类检验工作提供了现场测试方法和经验数据.     

对流方程的交替分组显示方法

提出了求解对流方程初边值问题绝对稳定的二阶精度交替分组显示方法.模型问题的数值结果表明,本方法忧于陈景良和陆金甫的分组显示方法.     

Structural scheme and theory behind feedback compensation of new parallel machine tools

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基于高海拔地区的大气中子单粒子效应实时测量试验研究

开展65 nm高速大容量静态随机存取存储器（SRAM）大气中子单粒子效应特性及试验评价技术研究,基于4 300 m高海拔地区大面积器件阵列实时测量试验,突破效应甄别、智能远程测控等关键技术,在153 d的试验时间内共观测到错误43次,其中器件内单粒子翻转39次,多单元翻转（MCU）在单粒子翻转中占比23%,最大的MCU为9位。对高能中子、热中子和封装α粒子的贡献比例进行了分析,并基于多地中子通量数据,推演得到北京地面和10 km高空应用时的单位翻转（SBU）和MCU失效率（FIT）。发现地面处软错误的主要诱因为封装α粒子,随着海拔的增高,大气中子对软错误的贡献比例明显增大;MCU全部由高能中子引起,北京10 km高空处的MCU FIT值明显增大,其占比由地面的8%增大至26%。结合器件版图布局,对MCU产生机理进行了深入分析。最后,提出一种目标导向的存储器软错误加固策略优化方法。     

Exponentially Weighted Moving Average Chart and Two‐Component Measurement Error

The two‐component measurement error (TCME) model effectively quantifies both the additive and multiplicative errors in analytical measurements. The performance of control charts in presence of TCME model has been investigated by researchers in recent past, but these studies are based on only considering fixed levels for the two‐component model parameters. In this study, we investigated the exponentially weighted moving average chart's performance in presence of TCME for varying levels of two‐component model parameters. A cost function analysis is also presented to determine the optimal number of multiple measurements and the sample size for reducing the effect of TCME. Copyright © 2015 John Wiley & Sons, Ltd.