我国宏观经济与证券市场关系的实证分析--基于名义 GDP 和上证指数发展速度的视角

宏观经济和证券市场的关系一直受到人们的关注,由于数据的选取和研究方法上的不同,导致宏观经济与证券市场的关系存在不同的结论或解释。从名义 GDP 和上证指数发展速度的视角,运用 HP 滤波以及 SVAR 等方法实证研究了宏观经济和证券市场的关系。研究发现：宏观经济和证券市场存在显著的因果关系;短期证券市场的波动是经济偶然性波动的预期,两者之间的滞后期效应与当期效应相互影响;方差分解表明宏观经济对于证券市场的长期贡献度很大。     

Effect of surface coating on the screw loosening of dental abutment screws

Regardless of the type of performed restoration, in most cases, a screw connection is employed between the abutment and implant. For this reason, implant screw loosening has remained a problem in restorative practices. The purpose of this study was to compare the surface of coated/plated screws with titanium and gold alloy screws and to evaluate the physical properties of coated/plated material after scratch tests via FE-SEM (field emission scanning electron microscopy) investigation. GoldTite, titanium screws provided by 3i (Implant Innovation, USA) and TorqTite, titanium screws by Steri-Oss (Nobel Biocare, USA) and gold screws and titanium screws by AVANA (Osstem Implant, Korea) were selected for this study. The surface, crest, and root of the abutment screws were observed by FE-SEM. A micro-diamond needle was also prepared for the scratch test. Each abutment screw was fixed, and a scratch on the surface of the head region was made at constant load and thereafter the fine trace was observed with FE-SEM. The surface of GoldTite was smoother than that of other screws and it also had abundant ductility and malleability compared with titanium and gold screws. The scratch tests also revealed that teflon particles were exfoliated easily in the screw coated with teflon. The titanium screw had rough surface and low ductility. The clinical use of gold-plated screws is recommended as a means of preventing screw loosening.     

国外武器装备电磁环境适应性试验与评价技术及能力发展综述

武器装备的电磁环境适应性已成为制约武器装备能打仗、打胜仗的一个重大问题;西方军事强国非常重视面向复杂电磁环境的武器装备试验与评价技术研究和能力建设,通过相关投资计划的长期持续投入,支持突破其中的关键技术、方法,以及构建相应的试验与评价设施能力;文章从标准规范和研制程序、技术方法、试验设施、科研和能力建设投资计划等几方面综述了国外武器装备复杂电磁环境适应性试验与评价技术和能力发展情况,并在此基础上,提出了对我国武器装备电磁环境适应性试验与评价能力的发展建议.     

开关电源加速贮存寿命方法研究

开关电源具有体积小、重量轻、效率高等诸多优点,凭借其自身的诸多优势,开关电源已经广泛应用于航空航天、通信、以及电子类。由于应用领域的广泛性,开关电源的可靠性引起了人们的重视。论文以阿伦尼斯(Arrhenius)模型为基础,设计了一整套针对开关电源的可靠性评价和寿命预计的试验方案。该方案对试验器件施加温度应力,加速器件的失效过程,并通过一定的加速模型和统计分析方法,外推出正常工作条件下产品的寿命特征。     

An extension of likelihood-ratio-test for testing linear hypotheses in the baseline-category logit model

A new family of test statistics for testing linear hypotheses in baseline-category logit models is introduced and its asymptotic distribution is obtained. The new family is a natural extension of the classical likelihood ratio test. A simulation study is carried out to find new test statistics that offer an attractive alternative to the classical likelihood ratio test in terms of both exact size and exact power.     

Small sample improvements in the threshold cointegration test using residual-based moving block bootstrap

A residual-based moving block bootstrap procedure for testing the null hypothesis of linear cointegration versus cointegration with threshold effects is proposed. When the regressors and errors of the models are serially and contemporaneously correlated, our test compares favourably with the Sup LM test proposed by Gonzalo and Pitarakis. Indeed, shortcomings of the former motivated the development of our test. The small sample performance of the bootstrap test is investigated by Monte Carlo simulations, and the results show that the test performs better than the Sup LM test.     

基于切片技术获取系统测试用例的方法

针对如何获取局部和全部的系统测试用例,确保其正确性和完备性以及与需求的一致性问题,提出利用先进的建模技术,建立可模拟验证的过程模型,并应用切片技术获取测试用例,并利用基于过程模型结构分析的归纳法证明了该法的正确性,根据过程模型切片准则获取系统测试用例的算法,介绍了实现工具的构成和应用实例。     

基于MAF模型的串扰时延故障的测试矢量生成

随着深亚微米技术,串扰噪声问题越来越严重。利用MAF模型的基本思想,探讨了一种串扰时延最大化算法,并且利用被修改的FAN算法,生成测试矢量。对于一条敏化通路,利用被修改的FAN算法适当地激活相应的攻击线和受害线,使电路在最恶劣情况下引起最大通路时延,从而实现更有效的时延测试。在标准电路ISCAS’85上进行实验验证,结果表明:该算法对于多攻击线的串扰时延故障的测试矢量产生是有效的。     

采用动态邻域扩展算法的非一致CA低功耗确定TPG

针对确定内建自测试向量发生器设计中常存在着对冗余向量依赖,导致测试应用时间增长,并产生额外的测试功耗等问题,提出一种新的低功耗确定测试向量发生器的综合算法.该向量发生器采用非一致细胞自动机的结构实现,利用基于模拟退火的动态邻域扩展算法寻找优化的细胞自动机的拓扑连接关系.对标准组合电路仿真实验的结果表明,所综合出的向量发生器可有效地产生给定的低功耗确定向量集,并且不影响原有的故障覆盖率和测试时间.     

用扫描链重构来提高EFDR编码的测试压缩率和降低测试功耗

为了解决系统芯片测试中日益增长的测试数据和测试功耗的问题,提出一种不影响芯片正常逻辑功能的扫描链重构算法--Run-Reduced-Reconfiguration(3R).该算法针对扩展频率导向游程(EFDR)编码来重排序扫描链和调整扫描单元极性,重新组织测试数据,减少了游程的数量.从而大人提高了EFDR编码的测试压缩率并降低测试功耗;分析了扫描链调整对布线长度带来的影响后,给出了权衡压缩率和布线长度的解决方案.在ISCAS89基准电路上的实验结果表明,使用3R算法后,测试压缩率提高了52%,测试移位功耗降低了53%.