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81.
82.
The relative sliding motion of two elastic bodies in contact induces wear process and contact shape evolution. In the case of a punch sliding on a substrate the transient process tends to a steady state for which the fixed contact stress and strain distribution develops in the contact zone. This state usually corresponds to a minimum of the wear dissipation power. The optimality conditions of the wear dissipation functional provide the contact stress distribution and the wear rate compatible with the rigid body punch motion. The present paper is aimed to extend the previous analyses [1], [2], [3], [4], [5] of steady state conditions to cases of periodic sliding of punch, assuming cyclic steady state conditions for both mechanical and thermal fields. 相似文献
83.
唐朝国 《计算机与数字工程》2015,43(4)
为了解决目前光学镜片表面疵病宽度测量主要依赖人工检测而导致弯曲划痕宽度检测精度较低的问题,提出一种基于Rank变换和分段最小外接矩形(MER)的镜片表面划痕宽度测量方法.该方法首先通过改进的Rank变换算法比较像素灰度相对关系来提取疵病目标,然后计算其最小外接矩形,根据矩形长宽比初步判别疵病类型(划痕或麻点),最后将疵病分割为多个小区段,分别计算每段的最小外接矩形并获得其宽度,比较取最大宽度作为疵病宽度值.试验结果表明,该方法具有较高的可行性与精确性,能够有效提取出疵病和计算其特征参数,可以满足工程实际的需要. 相似文献
84.
Critical stress and load conditions for pitting calculations of involute spur and helical gear teeth 总被引:1,自引:0,他引:1
Calculation methods of spur and helical gear drives for preliminary designs or standardization purposes available in technical literature, use the Hertz equation to evaluate the contact stress, assuming the load to be uniformly distributed along the line of contact. However, this model presents some discrepancies with experimental results because the changing rigidity of the pair of teeth along the path of contact produces a non-uniform load distribution, which implies that some load distribution factors are required to compute the contact stress. In this paper, a non-uniform model of load distribution along the line of contact, recently developed, obtained from the minimum elastic potential criterion, has been used. This model combined with the Hertz equation yields more accurate values of the contact stress. As the load per unit of length at any point of the line of contact and any position of the meshing cycle has been described by a very simple analytic equation, a complete study of the location and value of the critical contact stress has been carried out. From this study, a recommendation for the calculation of the pitting load capacity of spur and helical gears is proposed. 相似文献
85.
Barton B Rhinow D Walter A Schröder R Benner G Majorovits E Matijevic M Niebel H Müller H Haider M Lacher M Schmitz S Holik P Kühlbrandt W 《Ultramicroscopy》2011,111(12):1696-1705
We report the implementation of an electrostatic Einzel lens (Boersch) phase plate in a prototype transmission electron microscope dedicated to aberration-corrected cryo-EM. The combination of phase plate, Cs corrector and Diffraction Magnification Unit (DMU) as a new electron-optical element ensures minimal information loss due to obstruction by the phase plate and enables in-focus phase contrast imaging of large macromolecular assemblies. As no defocussing is necessary and the spherical aberration is corrected, maximal, non-oscillating phase contrast transfer can be achieved up to the information limit of the instrument. A microchip produced by a scalable micro-fabrication process has 10 phase plates, which are positioned in a conjugate, magnified diffraction plane generated by the DMU. Phase plates remained fully functional for weeks or months. The large distance between phase plate and the cryo sample permits the use of an effective anti-contaminator, resulting in ice contamination rates of <0.6 nm/h at the specimen. Maximal in-focus phase contrast was obtained by applying voltages between 80 and 700 mV to the phase plate electrode. The phase plate allows for in-focus imaging of biological objects with a signal-to-noise of 5-10 at a resolution of 2-3 nm, as demonstrated for frozen-hydrated virus particles and purple membrane at liquid-nitrogen temperature. 相似文献
86.
We report image blurring and energy broadening effects in energy-filtered XPEEM when illuminating the specimen with soft X-rays at high flux densities. With a flux of 2×1013 photons/s, the lateral resolution in XPEEM imaging with either core level or secondary electrons is degraded to more than 50 nm. Fermi level broadening up to several hundred meV and spectral shift to higher kinetic energies are also systematically observed. Simple considerations suggest that these artifacts result from Boersch and Loeffler effects, and that the electron-electron interactions are strongest in the initial part of the microscope optical path. Implications for aberration corrected instruments are discussed. 相似文献
87.
We discuss a new interpretation of mirror electron microscopy (MEM) images, whereby electric field distortions caused by surface topography and/or potential variations are sufficiently large to create caustics in the image contrast. Using a ray-based trajectory method, we consider how a family of rays overlaps to create caustics in the vicinity of the imaging plane of the magnetic objective lens. Such image caustics contain useful information on the surface topography and/or potential, and can be directly related to surface features. Specifically we show how a through-focus series of MEM images can be used to extract the contact angle of a Ga droplet on a GaAs (001) surface. 相似文献
88.
Rotman lenses are used to obtain multiple beams from a single array. Although the beams produced by the feed antennas at focal points have no path length errors, the beams produced by feed antennas at off focal points may have large path length errors. These path length errors cause deterioration in the multiple beams. In this article, two novel methods are introduced to obtain feed curves which reduce the path length errors of off focal feed points significantly, compared with the commonly used circular and elliptical feed curves. The first method obtains feed curve points based on having zero path length error at three chosen points of the radiating array for each beam direction. The second method uses the particle swarm optimization method for obtaining optimum feed points for each beam direction. The results show that there is a very significant drop in the level of the maximum path length errors (in the order of about 1:4). © 2012 Wiley Periodicals, Inc. Int J RF and Microwave CAE 23: 634–638, 2013. 相似文献
89.
90.
景深效果能够增强计算机生成图像的真实感,因此关于这类效果的绘制已成为计算机图形学中的重要研究方向。针对景深效果的绘制问题,首先研究和分析各种相机镜头模型的光学成像原理,比较各类镜头模型的特点和模拟景深效果的能力;然后分类总结景深效果绘制的基本原理和典型算法,比较各类景深绘制方法的优缺点。最后指出景深效果绘制技术的应用价值,并展望未来的研究方向。 相似文献