Solder balling of lead-free solder pastes

Solder balling in Sn/Ag/Cu solder pastes was studied in this work. Three different solder pastes, several different reflow profiles and conditions, and two stencil thicknesses were used in the investigation. During the first phase, called the verification phase, the solder pastes were checked to ensure they met the minimum requirements. In the process-screening phase, the reflow profile was varied. Results show that besides flux chemistry, reflow atmosphere plays the major role in solder balling. The average number of solder balls with the best paste was one fifth of that with the worst paste. Furthermore, with all the pastes, the number of solder balls dropped close to zero when nitrogen atmosphere was used. Another finding during the reflow process screening was the influence of the stencil thickness on the solder-balling result. With a thinner stencil, two of the pastes exhibited significant solder balling. This is assumed to be caused by the different ability of fluxes to withstand oxidation during the preheating in the reflow process. In the last phase, the effect of the solder-paste particle size on solder balling was studied more closely. The flux chemistry was kept unchanged, and the solder particle size was varied between type 3 and type 4. The results show that, with type 4 paste, significantly more solder balls are formed compared to type 3 paste. It was also confirmed that, regarding the reflow profile, the ramp-up rate from 150°C to 217°C and the reflow atmosphere were the most significant factors that determine the solder-ball formation for both types of paste.     

Phase identification and growth kinetics of the intermetallic compounds formed during in-49Sn/Cu soldering reactions

For the application of In-49Sn solder in bonding recycled-sputtering targets to Cu back plates, the intermetallic compounds formed at the In-49Sn/Cu interface are investigated. Scanning electron microscopy (SEM) observations show that the interfacial intermetallics consist of a planar layer preceded by an elongated scalloped structure. Electron-probe microanalyzer analyses indicate that the chemical compositions of the planar layer and the scalloped structure are Cu_74.8In_12.2Sn_13.0 and Cu_56.2In_20.1Sn_23.7, respectively, which correspond to the ε-Cu₃(In,Sn) and η-Cu₆(In,Sn)₅ phases. Kinetics analyses show that the growth of both intermetallic compounds is diffusion controlled. The activation energies for the growth of η- and ε-intermetallics are calculated to be 28.9 kJ/mol and 186.1 kJ/mol. Furthermore, the formation mechanism of intermetallic compounds during the In-49Sn/Cu soldering reaction is clarified by marking the original interface with a Ta-thin film. Wetting tests are also performed, which reveal that the contact angles of liquid In-49Sn drops on Cu substrates decline to an equilibrium value of 25°C.     

Microstructure coarsening during static annealing of 60Sn40Pb solder joints: III intermetallic compound growth kientics

The growth of the total (Cu₃Sn+Cu₆Sn) intermetallic compound layer in Cu-60Sn40Pb solder joints during static annealing at 50°C to 150°C was described by the equation hi=h_o+A_o exp(−Q_a/RT)t^p with h_o=0–0.3 μm, p=0.38–0.70, A_o=1.9×10⁻⁴–3.4×10⁻⁴ m/s^p, and Q_a=25.5–30.9 kJ/mole. These constants are within the range of those obtained by others and give values of D_o and Q which are in reasonable accord with those for the diffusion coefficients in Cu₃Sn and Cu₆Sn₅ determined in diffusion couples. The deviation of the values of the time exponent p from the ideal of 0.5 for diffusion growth may be due to inaccuracies or errors pertaining to the measured thickness (especially h_o) and the complex nature of the diffusion process.     

In对Sn9Zn钎料润湿性能的影响

为了提高Sn9Zn共晶钎料的钎焊性能,通过合金化的方法添加了少量元素In,制备了Sn9Zn-xIn钎料。从钎料合金的熔化特性、润湿特性、界面显微结构和母材粗糙度这四个方面评价了不同In含量对Sn9Zn钎料润湿性能的影响。试验结果表明:少量元素In的添加可以降低钎料的熔点;随着In含量的增加,钎料的润湿力增大,润湿时间缩短,润湿性有明显提高;In含量增加,润湿界面层中Cu5Zn8化合物层厚度增加;对母材表面进行毛化处理,通过改变母材表面的微观几何结构,增大钎料与母材的相对接触面积,从而改善钎料的润湿性能。     

Study of interfacial reactions between Sn3.5Ag0.5Cu composite alloys and Cu substrate

For development of a lead-free composite solder for advance electrical components, lead-free Sn3.5Ag0.5Cu solder was produced by mechanically mixing 0.5 wt.% TiO₂ nanopowder with Sn3.5Ag0.5Cu solder. The morphology and growth kinetics of the intermetallic compounds that formed during the soldering reactions between Sn3.5Ag0.5Cu solder with intermixed TiO₂ nanopowder and Cu substrates at various temperatures ranging from 250 to 325 °C were investigated. A scanning electron microscope (SEM) was used to quantify the interfacial microstructure at each processing condition. The thickness of interfacial intermetallic layers was quantitatively evaluated from SEM micrographs using imaging software. Experimental results show that a discontinuous layer of scallop-shaped Cu-Sn intermetallic compounds formed during the soldering. Kinetics analysis shows that the growth of such interfacial Cu-Sn intermetallic compounds is diffusion controlled with an activation energy of 67.72 kJ/mol.     

Reactivity of no-clean pastes and fluxes for the surface mount technology process—part II: Corrosion risk measurements for printed circuit boards and solder joints

The introduction of no-clean pastes and fluxes for the surface mount technology process needs testing methods of high sensitivity and reliability to evaluate the activity of the residues after the reflow process. An electrochemical method is proposed, suitable to ascertain the reactivity and the corrosion risk of these residues. Products of normal use are tested, and their behavior described and compared. Surface morphologies and compositions are examined after reflow and after testing. Local surface oxides are investigated with x-ray photoelectron spectroscopy. Surface analytical results are interpreted and related to the electrochemical behavior of solder joints. Tin is shown to have the most important role toward the onset of possible localized corrosion.     

Pb/Sn凸点的制备

介绍了用电镀法制备Pb / Sn凸点的工艺,包括:凸点的设计,圆片的准备,溅射UBM(凸点下金属层),厚膜光刻,电镀Cu柱, Pb / Sn凸点,回流凸点等。结果表明:采用电镀法可以得到球形Pb / Sn凸点,50μm的厚胶工艺是可行的。     

Impression creep characterization of 90Pb-10Sn microelectronic solder balls at subsolvus and supersolvus temperatures

The creep behavior of Pb-10wt.%Sn, a common high-lead solder used in microelectronic packaging, was studied by impression creep testing of ball-gridarray (BGA) solder balls attached to an organic substrate, both above and below the solvus temperature (408 K). Below the solvus temperature, the solder microstructure consists of roughly equiaxed grains of the Pb-rich solid solution α, which contains <5wt.%Sn in solution, with a coarse dispersion of Sn-rich β precipitates. Here, the creep behavior of the solder is controlled by dislocation climb via dislocation core diffusion, yielding n≈4 and Q≈60 kJ/mole. Above the solvus temperature, where the entire 10wt.%Sn is in solution, the creep mechanism becomes controlled by viscous glide of dislocations, limited by solute drag, with n≈3 and Q≈92 kJ/mole. Based on experimental data, creep equations for the as-reflowed solder in the two temperature regimes are given. Comparison of the present data with those available in the literature showed good agreement with the proposed laws.     

SnAgCuY钎料表面Sn晶须的旋转生长现象

研究了Sn3.8Ag0.7Cu1.0Y钎料表层上YSn3稀土相表面Sn晶须的生长行为。结果表明:室温时效条件下在YSn3的表面会出现Sn晶须的快速生长现象,生长速度最快可达10–10m/s,长度最长可达200μm。YSn3稀土相氧化的不均匀性是导致Sn晶须在生长时产生各种旋转现象的主要原因。     

Microstructural modifications and properties of Sn-Ag-Cu solder joints induced by alloying

Slow cooling (1–3°C/sec) of Sn-Ag-Cu and Sn-Ag-Cu-X (X = Fe, Co) solder-joint specimens, made by hand soldering, simulated reflow in a surface-mount assembly to achieve similar as-solidified joint microstructures for realistic shear-strength testing, using Sn-3.5Ag (wt.%) as a baseline. Consistent with predictions from a recent Sn-Ag-Cu ternary phase-diagram study, either Sn dendrites, Ag₃Sn primary phase, or Cu₆Sn₅ primary phase were formed during solidification of joint samples made from the selected near-eutectic Sn-Ag-Cu alloys. Minor substitution of Co for Cu in Sn-3.7Ag-0.9Cu refined the joint-matrix microstructure by an apparent catalysis effect on the Cu₆Sn₅ phase, whereas Fe substitution promoted extreme refinement of the Sn-dendritic phase. Ambient-temperature shear strength was reduced by Sn dendrites in the joint microstructure, especially coarse dendrites in solute poor Sn-Ag-Cu, e.g., Sn-3.0Ag-0.5Cu, while Sn-3.7Ag-0.9Cu with Co and Fe additions have increased shear strength. At elevated (150°C) temperature, no significant difference exists between the maximum shear-strength values of all of the alloys studied.