65 Mn热轧带钢表面裂纹分析

分析了热轧带钢表面裂纹产生的原因，介绍了采取的工艺措施及其效果。     

热带钢连轧机工作辊温度场和热凸度预报模型

采用一种具有较高精度的样条有限条法对轧制过程中工作辊的温度场和热凸度进行计算和预报。结果证明，该模型理论计算值与现场实测值吻合较好，可以较准确地计算和预报热带钢连轧机工作辊的热凸度。     

国内CSP产品质量与控制

分析了国内CSP厂生产热轧薄板的产品主要质量问题及产生原因 ,对生产过程中的质量控制措施进行了概述。     

HART协议物理层设备的测试（II）

本文介绍HART协议物理层设备的测试要求、测试设备、测试方法及测试时的一些特别说明。     

RAID技术综述

通过对各种RAID级别的实现原理进行描述，综合分析了各种模式的性能、优缺点以及应用范围。     

Hemispheric contributions to nonverbal abstract reasoning and problem solving.

Hemispheric involvement in reasoning abilities has been debated for some time, and it remains unclear whether the right hemisphere's involvement in problem solving is modality specific or dependent on the type of spatial reasoning required. In the current study, 2 types of nonverbal reasoning abilities were examined, spatial reasoning and proportional reasoning, in 109 patients with cerebrovascular disease that was confined to either the right or the left hemisphere or was diffuse in nature. Results indicated that no lateralizing effects were present based on type of spatial reasoning. Findings are consistent with the suggestion that higher order cognitive processes involved in nonverbal abstraction and problem solving are not strongly lateralized to the right hemisphere but rather are more generally distributed throughout the cortex. (PsycINFO Database Record (c) 2010 APA, all rights reserved)     

孔径法测量铜带残余应力的试验研究

介绍了用于薄板残余应力测量的新方法——孔径法,该方法是通过测量冲孔直径的变化来间接求出各方向的残余应力;文中详细阐述了残余应力的标定方法;由于可针对不同材料建立了被测材料的平均应力(σ_l)与被测板材宽度(B)、厚度(H)以及冲孔后直径变化率(△D_i/D)之间的数学模型,因而使薄板残余应力测量变得简便而经济;此外还对该方法的分辨率与测量精度进行了实验、计算与分析。     

岩心PI值试验研究及应用

主要论述了在多功能采油化学用剂评价仪上进行的岩心ＰＩ值试验的步骤，现象及结论。重点考察了岩心ＰＩ值与渗透率、流量及注入截面面积的关系；平行管岩心复合ＰＩ值和其中单管岩心ＰＩ值的关系。     

平面条形药包控制大爆破在马鞭洲工程中的应用

在硐室爆破工程中应用平面条形药包可以有效地实现对抛掷的控制。本文论述了平面条形药包的作用机理及特征，并结合马鞭洲第二炮——１３５０ｔ大爆破工程实践，就平面条形药包的布置、起爆方法等进行了总结和探讨。     

Suitable test structures for submicron ion beam analysis

For the precise determination of the sizes of submicron beam spots test structures with an excellent edge definition are required. For this purpose a semiconductor heterostructure consisting of an 1.62 μm GaInP epi-layer grown on (0 0 1) GaAs has been made, which provides atomically sharp edges for beam spot size measurements. Since the sample has been thinned down by standard transmission electron microscope (TEM) preparation techniques, it can be used for both PIXE and STIM. The sample has been investigated with a TEM and the ion nanoprobe LIPSION. A one-dimensional beam profile in the low current mode was determined by a STIM measurement using 2 MeV protons and yielded a FWHM of (41±4) nm, which is the smallest value reported so far for high energy nuclear micro- and nanoprobes. Furthermore we present nickel nanowhiskers produced at the GSI Darmstadt by electrochemical preparation of etched ion track membranes that have been used to obtain two-dimensional images of the shapes of submicron beam spots. For these measurements a scan over a single nickel nanowhisker having a diameter of 220 nm and a height of about 6 μm was performed.