Structural Aspects of P2-Type Na0.67Mn0.6Ni0.2Li0.2O2 (MNL) Stabilization by Lithium Defects as a Cathode Material for Sodium-Ion Batteries

A known strategy for improving the properties of layered oxide electrodes in sodium-ion batteries is the partial substitution of transition metals by Li. Herein, the role of Li as a defect and its impact on sodium storage in P2-Na_0.67Mn_0.6Ni_0.2Li_0.2O₂ is discussed. In tandem with electrochemical studies, the electronic and atomic structure are studied using solid-state NMR, operando XRD, and density functional theory (DFT). For the as-synthesized material, Li is located in comparable amounts within the sodium and the transition metal oxide (TMO) layers. Desodiation leads to a redistribution of Li ions within the crystal lattice. During charging, Li ions from the Na layer first migrate to the TMO layer before reversing their course at low Na contents. There is little change in the lattice parameters during charging/discharging, indicating stabilization of the P2 structure. This leads to a solid-solution type storage mechanism (sloping voltage profile) and hence excellent cycle life with a capacity of 110 mAh g^-1 after 100 cycles. In contrast, the Li-free compositions Na_0.67Mn_0.6Ni_0.4O₂ and Na_0.67Mn_0.8Ni_0.2O₂ show phase transitions and a stair-case voltage profile. The capacity is found to originate from mainly Ni³⁺/Ni⁴⁺ and O^2-/O^2-δ redox processes by DFT, although a small contribution from Mn⁴⁺/Mn⁵⁺ to the capacity cannot be excluded.     

Maskless pendeo-epitaxial growth of GaN films

High-resolution x-ray diffraction (XRD) and atomic force microscopy (AFM) of pendeo-epitaxial (PE) GaN films confirmed transmission electron microscopy (TEM) results regarding the reduction in dislocations in the wings. Wing tilt ≤0.15° was due to tensile stresses in the stripes induced by thermal expansion mismatch between the GaN and the SiC substrate. A strong D°X peak at ≈3.466 eV (full-width half-maximum (FWHM) ≤300 μeV) was measured in the wing material. Films grown at 1020°C exhibited similar vertical [0001] and lateral [11 0] growth rates. Increasing the temperature increased the latter due to the higher thermal stability of the GaN(11 0). The (11 0) surface was atomically smooth under all growth conditions with a root mean square (RMS)=0.17 nm.     

ZnAl_2O_4/α-Al_2O_3衬底上GaN的生长

研究了直接在 Zn Al2 O4/α-Al2 O3 衬底上用 MOCVD法一步生长 Ga N薄膜 .利用脉冲激光淀积法在α-Al2 O3衬底上淀积了高质量 Zn O薄膜 ,对 Zn O/α-Al2 O3 样品在 110 0℃退火得到了具有 Zn Al2 O4覆盖层的 α-Al2 O3 衬底 ,并在此复合衬底上利用光加热低压 MOCVD法直接生长了纤锌矿结构 Ga N. X射线衍射谱表明反应得到的Zn Al2 O4层为 ( 111)取向 .扫描电子显微镜照片显示随退火时间从小于 3 0 min增加到 2 0 h,Zn Al2 O4表面由均匀的岛状结构衍变为突起的线状结构 ,相应的 Ga N X射线衍射谱表明 Ga N由 c轴单晶变为多晶 ,单晶 Ga N的摇摆曲线半高宽     

无铅压电陶瓷(Bi1/2Na1/2)TiO3-KNbO3制备工艺研究

采用传统陶瓷工艺制备了(1-x)(Bi1/2Na1/2)TiO3-xKNbO3(x=0.01,0.02,0.04,0.6,0.08,0.12)无铅压电陶瓷。利用热重-差热(TG-DSC)、X-射线衍射(XRD)和扫描电镜(SEM)等分析技术,研究了(1-x)(Bi1/2Na1/2)TiO3-xKNbO3无铅压电陶瓷的制备工艺条件对陶瓷晶体结构、压电性能的影响。TG-DSC、XRD的结果表明,该体系的的最佳预合成温度在800~850℃;SEM及性能测试的结果表明,该体系随KNbO3含量的增加,烧结温度提高,烧结的温度范围变窄,当x>0.1时,烧结的温度范围只有5~10℃。     

用SiH2Cl2沉积MEMS中的多晶硅薄膜研究

用SiH2Cl2在3种温度下进行了多晶硅薄膜的沉积,根据膜厚计算出了沉积速率,用SEM、XRD和薄膜应力测试仪对薄膜进行测试分析.证明用SiH2Cl2在950℃时可以快速沉积用于MEMS的多晶硅.     

Ni(Pt)Si硅化物温度稳定性的研究

对比研究了夹层结构N i/P t/N i分别与掺杂p型多晶硅和n型单晶硅进行快速热退火形成的硅化物薄膜的电学特性。实验结果表明,在600~800°C范围内,掺P t的N iS i薄膜电阻率低且均匀,比具有低电阻率的镍硅化物的温度范围扩大了100~150°C。依据吉布斯自由能理论,对在N i(P t)S i薄膜中掺有2%和4%的P t样品进行了分析。结果表明,掺少量的P t可以推迟N iS i向N iS i2的转化温度,提高了镍硅化物的热稳定性。最后,制作了I-V特性良好的N i(P t)S i/S i肖特基势垒二极管,更进一步证明了掺少量的P t改善了N iS i肖特基二极管的稳定性。     

ZnO薄膜的XPS研究

利用等离子体增强型MOCVD设备,在C面蓝宝石上生长出了C轴取向的未退火、生长后一次退火和生长过程中多次退火的ZnO薄膜样品,并通过X光衍射和X光电子能谱对样品进行了表征,结果表明生长过程中多次退火的样品具有较高的质量,O/Zn原子比较大,且受空气中氧和水汽的影响最小.     

射频磁控溅射法在柔性聚酰亚胺衬底上制备ZnS薄膜及其特性研究

为使Ⅱ-Ⅵ族化合物ZnS薄膜具有可弯曲性,选用柔性的聚酰亚胺作为衬底材料,用射频磁控溅射法沉积ZnS薄膜,对所制备薄膜的结晶结构、组分和光学特性进行分析.实验结果表明,所制备薄膜为结晶态的闪锌矿ZnS结构,择优取向为(111)晶面,晶粒尺寸为25.6 nm.薄膜组分接近化学计量比,并具有少量的S损失.薄膜在可见光区和近红外光区的平均透射率分别为82.0％和90.5％,透光特性良好.作为对比,在钠钙玻璃衬底上溅射的ZnS薄膜的结晶度高于聚酰亚胺衬底薄膜,但其透射率略低于柔性ZnS薄膜.实验结果表明了用磁控溅射法在柔性聚酰亚胺衬底上制备ZnS薄膜的可行性.     

镍基单晶高温合金短时时效过程中取向变化的原位研究

利用TEM和XRD原位研究了一种镍基单晶高温合金在时效过程中的取向变化.研究发现固溶-时效热处理后的初始样品内部不同γ′相之间存在~4°的小角度晶界.对材料在950℃下进行10 min短时时效处理,原位TEM和XRD结果表明γ′相的取向偏离初始取向~5°,且该取向变化在降温之后也不会完全恢复;该短时升、降温过程使γ′相的取向集中度增加.     

Synthesis and characterization of ceria quantum dots using effective surfactants

The stable and crystalline phase of different surfactants (CTAB, PEG and SDS) capped CeO₂ nanoparticles were directly synthesized by chemical precipitation method at room temperature. The effects of surfactants on the structural and optical properties of nanoparticles are characterized. The optical properties of the nanoparticles were investigated by UV–visible and PL spectroscopy. The effects of surfactants with observed band shifts are due to quantum confinement effect. The optical band gap values are determined by simple energy wave equation and Tauc plot method. The observed particle sizes are very closer to the Bohr exitonic radius. The emission bands such as violet, blue, green and orange are observed in PL spectra. The PL integrated intensity ratio of the UV emission to the deep-level green emission (I_UV/I_DLE) for CTAB, PEG and SDS capped CeO₂ nanoparticles are observed. The XRD measurement shows that CeO₂ has cubic fluorite structure having the particle size 6–10 nm. The lattice strains were detected by Williamson–Hall plot method. The surface morphology of the nanoparticles is studied by SEM and FESEM analysis. TEM images show that the particles are nearly spherical in shape with diameter of 5–10 nm. Using FTIR spectra, the functional groups of the ceria are identified.