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91.
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Jiaoyi Ning Yanan Zhu Zhao Hu Yuhao Shi Muhammad Umair Ali Junpeng He Yaowu He Feng Yan Shihe Yang Jingsheng Miao Hong Meng 《Advanced functional materials》2020,30(35)
Ion migration induced interfacial degradation is a detrimental factor for the stability of perovskite solar cells (PSCs) and hence requires special attention to address this issue for the development of efficient PSCs with improved stability. Here, an “S‐shaped, hook‐like” organic small molecule, naphthalene diimide derivative (NDI‐BN), is employed as a cathode interface layer (CIL) to tailor the [6,6]‐phenylC61‐butyric acid methylester (PCBM)/Ag interface in inverted PSCs. By realizing enhanced electron extraction capability via the incorporation of NDI‐BN, a peak power conversion efficiency of 21.32% is achieved. Capacitance–voltage measurements and X‐ray photoelectron spectroscopy analysis confirmed an obvious role of this new organic CIL in successfully blocking ionic diffusion pathways toward the Ag cathode, thereby preventing interfacial degradation and improving device stability. The molecular packing motif of NDI‐BN further unveils its densely packed structure with π–π stacking force which has the ability to effectually hinder ion migration. Furthermore, theoretical calculations reveal that intercalation of decomposed perovskite species into the NDI clusters is considerably more difficult compared with the PCBM counterparts. This substantial contrast between NDI‐BN and PCBM molecules in terms of their structures and packing fashion determines the different tendencies of ion migration and unveils the superior potential of NDI‐BN in curtailing interfacial degradation. 相似文献
94.
Maged Abdelsamie Junwei Xu Karsten Bruening Christopher J. Tassone Hans‐Georg Steinrück Michael F. Toney 《Advanced functional materials》2020,30(38)
Understanding crystallization processes and their pathways in metal‐halide perovskites is of crucial importance as this strongly affects the film microstructure, its stability, and device performance. While many approaches are developed to control perovskite formation, the mechanisms of film formation are still poorly known. Using time‐resolved in situ grazing incidence wide‐angle X‐ray scattering, the film formation of perovskites is investigated with average stoichiometry Cs0.15FA0.85PbI3, where FA is formamidinium, using the popular antisolvent dropping and gas jet treatments and this is contrasted with untreated films. i) The crystallization pathways during spin coating, ii) the subsequent postdeposition thermal annealing, and iii) crystallization during blade coating are studied. The findings reveal that the formation of a nonperovskite FAPbI3 phase during spin coating is initially dominant regardless of the processing and that the processing treatment (e.g., antisolvent dropping, gas jet) has a significant impact on the as‐cast film structure and affects the phase evolution during subsequent thermal treatment. It is shown that blade coating can be used to overcome the nonperovskite phase formation via solvothermal direct crystallization of perovskite phase. This work shows how real‐time investigation of perovskite formation can help to establish processing–microstructure–functionality relationships. 相似文献
95.
96.
J. Osenbach A. Amin M. Bachman F. Baiocchi D. Bitting D. Crouthamel J. DeLucca D. Gerlach J. Goodell C. Peridier M. Stahley R. Weachock 《Journal of Electronic Materials》2009,38(2):303-324
The thermal stability of flip-chip solder joints made with trilayer Al/Ni(V)/Cu underbump metalization (UBM) and eutectic
Pb-Sn solder connected to substrates with either electroless Ni(P)-immersion gold (ENIG) or Pb-Sn solder on Cu pad (Cu-SOP)
surface finish was determined. The ENIG devices degraded more than 50 times faster than the Cu-SOP devices. Microstructural
characterization of these joints using scanning and transmission electron microscopy and ion beam microscopy showed that electrical
degradation of the ENIG devices was a direct result of the conversion of the as-deposited Ni(V) barrier UBM layer into a porous
fine-grained V3Sn-intermetallic compound (IMC). This conversion was driven by the Au layer in the ENIG surface finish. No such conversion
was observed for the devices assembled on Cu-SOP surface finish substrates. A resistance degradation model is proposed. The
model captures changes from a combination of phenomena including increased (1) intrinsic resistivity, (2) porosity, and (3)
electron scattering at grain boundaries and surfaces. Finally, the results from this study were compared with results found
in a number of published electromigration studies. This comparison indicates that degradation during current stressing in
the Pb-Sn bump/ENIG system is in part due to current-crowding-induced Joule heating and the thermal gradients that result
from localized Joule heating. 相似文献
97.
多步联合检测技术在SCDMA系统中的应用 总被引:1,自引:1,他引:1
同步CDMA系统接近满码道工作时,由于信噪比恶化,联合检测技术不能满足系统性能的要求。多步联合检测(MSJD)有效地解决了这个问题,大大提高了系统的性能。本文研究了多步联合检测技术,在多步联合检测算法的基础上提出了改进的并行多步联合检测算法,减小了系统的延时;并把天线的接收分集和多用户检测技术相结合,提高了多径衰落信道下的传输可靠性。 相似文献
98.
99.
This work presents about the study of inorganic oxidants assisted sonocatalytic degradation of Resazurin (RZ) dye in the presence of β-SnWO4 nanoparticles. The catalysts were synthesized via a surfactant free sonochemical method. Physical properties of the as-prepared β-SnWO4 nanoparticles were analyzed by XRD and FE-SEM. The dispersion property and particle size were analyzed by Zeta potential and Particle size analyzer. The degradation of RZ was analyzed in the presence and absence of common oxidants such as PMS (peroxymonosulfate) and H2O2 (hydrogen peroxide). The result shows that the RZ was first mineralized to Resorufin and it was degraded to simple molecule in the presence of β-SnWO4. 75% of degradation efficiency was achieved in presence of β-SnWO4, while in addition of H2O2 and PMS, the efficiency was increased up to 93% and 85% respectively. Our results will pave a new opening in degradation of poisonous dye using inorganic common oxidants. 相似文献
100.
Miguel García Luis Marroyo Eduardo Lorenzo Javier Marcos Miguel Prez 《Progress in Photovoltaics: Research and Applications》2014,22(2):242-247
To date, the majority of quality controls performed at PV plants are based on the measurement of a small sample of individual modules. Consequently, there is very little representative data on the real Standard Test Conditions (STC) power output values for PV generators. This paper presents the power output values for more than 1300 PV generators having a total installed power capacity of almost 15.3 MW. The values were obtained by the INGEPER‐UPNA group, in collaboration with the IES‐UPM, through a study to monitor the power output of a number of PV plants from 2006 to 2009. This work has made it possible to determine, amongst other things, the power dispersion that can be expected amongst generators made by different manufacturers, amongst generators made by the same manufacturer but comprising modules of different nameplate ratings and also amongst generators formed by modules with the same characteristics. The work also analyses the STC power output evolution over time in the course of this 4‐year study. The values presented here could be considered to be representative of generators with fault‐free modules. Copyright © 2012 John Wiley & Sons, Ltd. 相似文献