X441对数放大器的原理及其应用

本文主要介绍X441单片对数放大器的基本原理和应用,并列举了一些具体应用电路。     

机械定尺飞锯机中的555时基电路

介绍了５５５时基电路在机械定尺飞锯机中的应用及工作原理。     

外焊缝自动跟踪系统

介绍了外焊缝自动跟踪系统的组成及工作原理，简述了传动部分ＧＴＲ－ＰＷＭ调速系统，给出了系统的硬件电路。该跟踪器具有结构简单，体积小，性能稳定等特点，在生产线上获得了成功的应用。     

Parallel feedforward class-AB control circuits for low-voltage bipolar rail-to-rail output stages of operational amplifiers

A new family of class-AB control circuits for bipolar rail-to-rail output stages of operational amplifiers is presented. Step by step, we report the development of five simple class-AB control circuits showing the advantages of using parallel feedforward. The circuits have been designed in such a way that temperature, supply voltage and process parameters have little influence. To test the output stages, one of them has been implemented in a very simple two-stage operational amplifier on a semi-custom chip. Measurements show a bandwidth of 2.5 MHz, a gain of 40 dB, a quiescent current of 23µA and a maximum output current of 250µA. Simulation results of three other simple operational amplifiers with the new class-AB control circuits are shown, which have a higher gain and maximum output current.     

一种提高微电路外壳使用可靠性的方法

简要分析了白瓷双列直插外壳的失效模式和失效机理，并进行了模拟实验，通过对实验结果的分析，提出对成品微电路进行二次电镀能够提高其外壳的使用可靠性。     

混合集成电路激光功能调值技术

本文提出了激光功能微调技术在高精度混合集成电路上的应用，讨论了关键技术问题，并以实例具体说明。该技术的应用为研制高精度混合集成电路开辟了新途径。     

冷轧厂酸洗机组3号横剪大流量中高压液压系统设计方案探讨

在宝钢２０３０ｍｍ冷轧厂酸洗机组中，为了满足厚规格ＩＦ钢的生产，拟将原有的气动式剪切机改成液压式剪切机。为此，设计了一套中高压大流量的液压系统以满足３号横剪大剪切力（最高达７００ｋＮ）和快速剪切（３秒／次）的需要。由于采用了蓄能器增速回路和二通插装阀控制技术，使该液压系统较传统的剪切机液压系统具有响应速度快、体积小、重量轻、发热少和降低电机能耗等优点。     

STN—LCD的新进展

STN-LCD采用新的取向层,消除了残象;采用新的驱动波形,消除了串扰;采用二(口恶)烷、卤化物、链烯基、醚和二苯乙炔,改进了液晶料材的性能,使STN-LCD获得高的对比度、快的响应速度、低的驱动电压;采用有源矩阵驱动方法,消除了帧响应,使STN-LCD获得高的对比度、高的亮度及视频响应速度;使用温度跟踪电路,自动跟踪STN-LCD的阀值电压,使STN-LCD获得宽的工作温度。     

Partial scan design and test sequence generation based on reduced scan shift method

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously proposed for generating short test sequences for full scan circuits. In the reduced scan shift method, one determines proch FFs must be controlled and observed for each test vector. According to the results of similar analysis, PARES selects these FFs that must be controlled or observed for a large number of test vectors, as scanned FFs. Short test sequences are generated by reducing scan shift operations using a static test compaction method. To minimize the loss of fault coverage, the order of test vectors is so determined that the unscanned FFs are in the state required by the next test vector. If there are any faults undetected yet by a test sequence derived from the test vectors, then PARES uses a sequential circuit test generator to detect the faults. Experimental results for ISCAS'89 benchmark circuits are given to demonstrate the effectiveness of PARES.     

异步时序型PAL解析方法的研究及解析结果分析

本文就异步时序现ＰＡＬ的解析，提出了一种状态图遍历算法。