拉伸速率对PP/GB复合材料力学性能的影响

应用Instron材料试验机考察了室温下拉伸速率对玻璃微珠填充聚丙烯复合材料的弹性模量和屈服强度的影响，结果表明，随着微珠含量的增加，试样的弹性模量（Ec）增大，且与拉伸应变速率呈近乎幂律函数关系，而屈服强度（бyc）则随着微珠体积分数（Φf）的增加呈线性函数形式下降，并随着拉伸应变速率的增加呈幂律函数形式提高，此外，讨论了Ec、Φf与бyc三者之间的关系。     

一种新型冰箱测试系统设计与应用

介绍了一种用于冰箱检测的新型测试系统，并在WIN98环境下用VB6．0实现该系统软件。该系统可以同时对四台冰箱的温度参数及其中一台冰箱的耗电量进行检测，该系统具有成本低，性能稳定的优点。     

电火花铣削钛合金加工工艺研究

在全面试验的基础上，对电火花铣削钛合金进行了初步研究，给出了电火花铣削钛合金的影响因素及其指标的关系曲线。并对其进行了数据分析。试验表明，冲油电火花铣削是加工钛合金的有效方法。     

A Novel UWB Pulse Shape Modulation System

In this paper novel modified Hermite polynomial functions for use in impulse radio (ultra-wideband) communications are proposed. With these functions pulse shapes which are orthogonal and have nearly constant pulse width regardless of the pulse order are generated. These properties hold under the effects of differentiation. An M-ary communication system is constructed using these pulse shapes. A Matlab model for generating the pulses is designed and the effect of timing jitter on the performance of the system is investigated by computer simulation.     

钛合金的银脆,镉脆敏感性及其控制

利用慢应变速率拉伸技术（ＳＳＲＴ），并结合恒载实验，较全面地研究了Ｔｉ－６Ａｌ－４Ｖ合金的银脆行为、固态与液态镉脆行为，确定了应变速率、接触条件、热处理制度、试样取向、温度等因素对Ｔｉ－６Ａｌ－４Ｖ合金银脆与镉脆敏感性的影响，探讨了Ｎｉ阻挡层对控制Ｔｉ－６Ａｌ－４Ｖ合金和ＴＣ１１合金银脆开裂的作用。     

专用集成电路CAT技术的进展

本文简单地回顾了提高VLSI测试效率所采用的一些手段,讨论了在ASIC测试问题研究中出现的一些新观点、新方法、新动向,以及所取得的成果。在此基础上,文章阐明了ASIC测试技术的发展方向,并着重论述了可望在未来得到发展的,针对ASIC的功能测试方法。     

由1,4-萘醌催化合成1,4-二烷氧基萘-2,3-二甲腈

研究了以 1 ,4-萘醌为原料 ,通过溴代、氰化和 O-烷基化三步合成 1 ,4-二烷氧基萘 -2 ,3 -二甲腈。在溴代反应中以溴化试剂代替液溴 ;在氰化和 O-烷基化反应中以溴化十二烷基三甲基铵 (DTMAB)和聚乙二醇(PEG)作为相转移催化剂 ,并采用正交设计法考察了相转移催化剂、固体碱、反应温度等因素对反应的影响 ,其中氰化产物收率达 88.7%。     

Trade-offs in scan path and BIST implementations for RAMs

In this article we propose efficient scan path and BIST schemes for RAMs. Tools for automatic generation of these schemes have been implemented. They reduce the design effort and thus allow the designer to select the more appropriate scheme with respect to various constraints.     

Techniques for estimating test length under random test

When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901.     

Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.