KCl与NaCl在低盐固态法酱油发酵中的应用比较

对KCl与NaCl在低盐固态酱油发酵中的应用进行了比较研究。结果表明：用KCl代替NaCl，KCl的浓度要高于NaCl才能抑制发酵期间杂茵的污染，且使用KCl的发酵效果比NaCl要好。     

Validation of a Method of Determination of Apparent Diffusivity Versus Composition in Solids

A method is presented for computing the values of apparent diffusivity in solids with respect to the concentration of the diffusing substance (water or sodium chloride). This method does not require any assumption upon the mathematical relationship between diffusivity and concentration. It can be applied to experimental measurements of local concentration versus position within the solid (profiles) with relatively few measurements (circa 10) and a mathematical smoothing of the experimental data by using an artificial neural network model. The method was first validated on simulated data obtained by using a constant diffusivity value and on experimental profiles when the relation between diffusivity and concentration was given. It was then applied to original experimental moisture profiles obtained by putting gelatin gels with different initial moisture contents into contact for up to 14 days. The method was also successfully applied to five sets of experimental moisture and sodium chloride profiles taken from the literature and obtained from different food products. Apparent diffusivities calculated by our method were found in agreement with those obtained by authors using different numerical methods to compute the diffusivity values.     

示波极谱滴定法测定工业氯化钙主要成份

在氯化铵-氨水(pH=11)支持电解质中用微银汞膜电极进行试验,锰、铁不干扰测定,用EDTA滴定氯化钙获得令人满意的结果。对三种样品进行分析,变异系数为0.08％—0.11％。该法快速准确,适用于氯化钙主要成份的测定。     

飞行时间二次离子质谱--强有力的表面、界面和薄膜分析手段

二次离子质谱（Secondary ion mass spectrometry，简称SIMS）是一种对表面灵敏的质谱技术，建立在表面各种类型带正、负电荷原子或分子发射的基础上。用飞行时间（Time of flight，简称TOF）仪器对这些二次离子进行质量分析，能确保并行质量登录、高质量范围、高流通率下的高分辨和精确质量测定这些优异性能。配合细聚焦扫描一次离子束，可在优于1nm的高深度分辨和优于50nm的横向分辨本领下，实现对表面优于单层ppm(百万分之一）量级的极高检测灵敏度。当今TOF－SIMS已发展为一种成熟且完善的表面分析技术。极高的灵敏度，再加上即使对大分子及不易挥发性分子都独具的敏感性，使它成为很多高技术领域不可缺少的分析手段，这些领域包括微电子学、化学和材料科学以至纳米技术和生命科学等。本文简述了TOF－SIMS的原理、仪器及其多方面的应用和展望。     

锂离子电池正极材料锂锰氧化物的固相合成研究进展

阐述了固相合成反应的原理，综述了锂锰氧化物的几种固相合成方法，并着重介绍了熔融渍法，多步加热法，机械化学法和微波化学法等在锂锰氧化物合成中的研究进展。     

助催化剂对TiCl_4/MgCl_2催化丙烯高温聚合的影响

研究了助催化剂种类(三甲基铝、三异丁基铝、三正己基铝、三乙基铝和甲基铝氧烷)及其含量对无内、外给电子体的TiCl4/MgCl2催化剂催化丙烯高温(100℃)聚合性能的影响,并用结晶分级分析、示差扫描量热和凝胶渗透色谱等方法分析了所得聚丙烯的结晶熔融行为和微观结构。实验结果表明,聚合温度从70℃升至100℃时,TiCl4/MgCl2催化剂的定向能力基本不变;100℃聚合时,以烷基化能力较弱的三异丁基铝为助催化剂时TiCl4/MgCl2催化剂的活性最高,而采用烷基化能力最强的三甲基铝为助催化剂时TiCl4/MgCl2催化剂的活性最低;100℃聚合时,助催化剂的种类对TiCl4/MgCl2催化剂的定向能力影响很小。     

硫脲树脂对Cu~(2+)吸附性能研究

考察了不同吸附时间、pH值和吸附温度下,聚对苯甲酰基硫脲树脂和聚酯基硫脲树脂对Cu2+的吸附性能影响;并对吸附动力学和热力学进行了研究。     

Ion implantation effect on atomic structure of deformed Si, Ir, W, Ni and Cu

It has been revealed, that in Ir subjected to severe plastic deformation, an ultrafine grained structure (UFG) is formed (the grain size of 20-30 nm). Practically no defects have been detected within the grains, while, in the case of Ar⁺ implantation, the subgrain structure with characteristic sizes of about 3-5 nm is formed; defects have been detected within subgrains.The subgrain structure was also revealed in UFG Ni and Cu after severe plastic deformation (SPD) (subgrain size of 3-15 nm), but in the latter case the observed boundary region is broader and subgrain is highly disoriented.     

Diffusion-controlled size-selective chloride ion sensing in the presence of bromide ion using a thin, nanoporous, plasma-polymerized coating on an Ag/AgCl electrode

We have developed a diffusion-controlled size-selective method for sensing chloride ion in the presence of bromide ion, based on a thin, nanoporous, plasma-polymerized coating of hexamethyldisiloxane on an Ag/AgCl electrode. Sub-nanometer-sized pores responsible for a highly cross-linked polymer network in the plasma-polymerized coating allowed diffusion-controlled permeation of chloride ion while blocking the larger bromide ion. An electrode coating of thickness greater than 70 nm enabled chloride detection in the concentration range 1-10 mM in the presence of 0.63 mM bromide ion. Advantages of this approach are: (1) simple design compared with ionophore-based strategies and (2) compatibility with microfabrication and mass production processes.     

Secondary ion emission from Ti and Si targets induced by medium energy Ar ion bombardment - Experiment and computer simulation

The paper presents experimental results of secondary ion energy distributions obtained for Ti and Si targets bombarded by 20-30 keV monoisotope Ar⁺ ion beam. The influence of the extraction voltages between target and a slit of the electrostatic energy analyzer entrance on the energy distributions of secondary ions was investigated. After optimization of the secondary ion extraction system, the mass spectra of secondary ions were also measured. The investigations were done using recently built experimental system. Experimental data are compared with the computer simulation results obtained using TRQR and SATVAL codes.