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191.
基于DSP+CPLD的高精度信号发生器 总被引:2,自引:0,他引:2
介绍了基于直接数字式频率合成(DDS)原理的全数字信号发生器(DSP),利用DSP芯片快速、高精度的运算优势以及CPLD芯片灵活的编程逻辑、大容量存储功能的特点,采用通用可编程芯片以及数字波形合成技术,形成高稳定、高精度、高动态的数字合成信号.该信号发生器可产生0~25 kHz的正弦波、三角波和方波,输出电压峰峰值为0~5 V,频率步进1 Hz,幅度步进0.001 V. 相似文献
192.
193.
Boiling: Size Distribution of Bubbles as Demanded by the Principle of Maximum Information 总被引:1,自引:0,他引:1
The principle of maximum informational entropy is used to find the probability density function for the departure radius of a bubble in boiling on a solid surface. A general relation is derived, which leads to particular expressions. 相似文献
194.
The wettability of the lithium surface by liquid alkali metals Na, K and Rb is investigated for the first time by the sessile drop method in an all-soldered instrument under conditions of a high vacuum. The presence of the temperature threshold of wetting is found in Li–Na and Li–K systems at temperatures of 325°C and 160°C, respectively. A conclusion is drawn that an abrupt decrease in wetting angles in the investigated systems is associated with a marked decrease in the interfacial tension at lithium-lithium, lithium-potassium, and lithium--rubidium interfaces owing to the beginning of a noticeable mutual solubility of the components at relatively high temperatures. 相似文献
195.
We study the stressed state of an inhomogeneous welded joint containing an interlayer of a more high-strength material under the action of tensile loads. It is assumed that the contact boundary has a cracklike defect. We deduce analytic dependences of the fracture load on the mechanical inhomogeneity of the joint, thickness of the interlayer, and depth of the defect. The maximum depth of the defect to which the joint is insensitive is established. The proposed theoretical results are innovative and agree with the experimental data obtained for specimens cut out from a pipe of 14KhGS steel. 相似文献
196.
This study investigates the relationship between the critical surface tension of wetting of celestite and agglomeration recovery as well as the zeta potential in dependence of pH and amount of collector (Na‐Oleate). For this purpose, effects of pH and collector amount on the agglomeration recovery are investigated and zeta potential measurements and Fourier Transform Infrared Spectrophotometer (FTIR) analyses are carried out to determine the adsorption type of Na‐Oleate on celestite surface. The sessile drop technique is used for the measurement of contact angle and determination of the critical surface tension of wetting (YC) of celestite. The maximum agglomeration recovery is obtained at pH 7. The critical surface tension of wetting of celestite is very close to the surface tension of kerosene, which is 25.95 mN/m. Furthermore, at the optimum Na‐Oleate amount of 10 kg/ton, the critical surface tension of wetting of celestite is approximately equal to the surface tension of kerosene. 相似文献
197.
In this paper we present some preliminary results about the coupling of shallow water equations for free surface flows and Darcy equation for groundwater flows. A suitable set of interface conditions is discussed: the Beavers and Joseph formula for the bottom stress is used. An iterative algorithm to solve the coupled problem is proposed and some numerical results are presented. 相似文献
198.
本文研究了具有典型分解特征的Al-Zn-Ce非晶合金的形成和晶化过程,探讨了各种相的生成顺序。XRD和DSC测试结果表明强烈的化合物短程序有利于Al-Zn-Ce非晶合金的形成。在Al-Zn-Ce非晶合金的晶化过程中存在复杂的相选择行为,多种相的竞争形核和有限生长使其具有复杂的结构特点。同时,结果也表明冷速对该体系非晶的形成有很大影响。 相似文献
199.
高分子量丙烯酰胺-DAC共聚物的研制 总被引:7,自引:0,他引:7
采用复合引发体系 ,以丙烯酰胺 (AM)和阳离子单体丙烯酰氧乙基三甲基氯化铵(DAC)为共聚体 ,进行水溶液绝热聚合 ,研制了一种DAC单体含量为 4 0 %~ 5 0 %、相对分子质量大于 1× 10 7的阳离子型聚丙烯酰胺。 相似文献
200.
《Particulate Science and Technology》2007,25(1):77-89
The removal of particulate contamination is a critical issue for many manufacturing processes. It is particularly critical to the electronics industry in which small pieces of microscopic debris remaining after chemical mechanical planarization (cmp) using submicron polishing particles can cause device failure. One way to enhance particle removal following the cmp process is to utilize surfactants. Recent research has shown ways to model the effect of surfactants on enhanced particle removal. However, previous research has not demonstrated the effect of ionic strength on enhanced particle removal associated with surfactant use. Past research has also not shown the combined effects of ionic strength and surfactant concentration on enhanced particle removal using surfactants. This article summarizes the parameters affecting particle removal, and it provides data and analysis on the effect of ionic strength as well as the combined effects of ionic strength and surfactant concentration on particle removal following cmp processing. 相似文献