CCD应用中的高速图象数据采集技术

介绍了一种可用于精密光学测量的高速线阵ＣＣＤ图象数据采集系统，给出了系统组成、各单元设计考虑和主要技术指标。     

多传感器检测中的数据溶合技术

多传感器检测是使用多种(或多个)传感器对同一被测对象进行广泛的测量。应用多传感器检测技术和多传感器数据溶合技术对车削加工中的零件外圆尺寸检测进行了实验研究,结果表明,多传感器检测技术能够满足现代检测技术对信息的精确要求,使得检测监控系统更加准确、可靠。     

多丝正比室中电子的最大漂移时间

多丝正比室中电子的最大漂移时间是逃逸门电路中的一个重要参数。这个参数的选择将影响逃逸门工作方式的多丝正比室的整体性能。通过实验测量得到了多丝正比室中电子的最大漂移时间的实际值和最大漂移时间随多丝正比室工作状态的变化，测量结果在实际中得到应用。     

CROSS-SPECTRAL MOMENT AND SVD METHODS ESTIMATING THE PARAMETERS OF CLOSE SINUSOIDS IN COLORED NOISE

The cross-spectral estimation methods are efficient in estimating the parameters of sinusoidal signals embedded in colored noise. But up to now, only FPT and cross-periodogram methods are used in this field, the modern auto-spectral estimation method is introduced into cross-spectral estimation in this paper, meanwhile the cross-correlation based Yule-Walker equation is proposed theoretically and the moment and singular-value decomposition (SVD)) algorithms for cross-spectral estimation have been developed. Finally, a numerical example is given for comparing the presented methods with the well-known Cadzow's SVD method.     

Thermal stability of interfaces between metals and InP-based materials

The thermal stability of interfaces between metals (Ni, Pt, Ti, Mo) and III-V compound semiconductors has been investigated by the application of Rutherford backscattering spectrometry. Metal diffusion and interfacial lattice disorder of the semiconductors were analyzed for various metal/semiconductor samples annealed at temperatures up to 500°C. The interfaces of Ni/GaAs and Ti/GaAs were found to be more stable than those of Ni/In-based semiconductors and Ti/ In-based semiconductors, respectively. Faster diffusion of Pt atoms was ob-served in In-and As-containing materials than in P-containing materials. Mo/ semiconductor interfaces were the most stable.     

1，2─双（二乙基膦基）乙烷的合成

以二乙基氯化膦为原料，经乙炔化及加氢两步合成了１，２－双（二乙基膦基）乙烷，产率超过文献值。用红外光谱和核磁共振波谱分别测定了结构。     

Pyrolysis of tertiarybutylphosphine at low pressure

The pyrolysis of tertiarybutylphosphine (TBP) has been studied in the low pressure conditions used for chemical beam epitaxy (CBE). The pyrolysis studies were carried out in low pressure reactors of two different configurations, one of which is a cracker cell designed for use in a CBE system. The reaction products were studied using a quadrupole mass spectrometer. The products observed are accounted for by a reaction mechanism involving homolysis of the parent TBP molecule to produce PH₂ and C₄H₉ radicals. These undergo subsequent reactions to form the stable products C₄H₈, PH₃ and H₂, with smaller amounts of P and P₂ being produced. The production of the sub-hydride PH₂ using this cracker cell design indicates that the use of partially cracked TBP may be a promising technique for reducing the amount of carbon incorporated into the growing epitaxial layer.     

On the Realization of Current－Mode Continuous－Time Operational Transconductance Capacitance Filter

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