Highly reliable a‐IGZO TFTs on a plastic substrate for flexible AMOLED displays

We have successfully reduced threshold voltage shifts of amorphous In–Ga–Zn–O thin‐film transistors (a‐IGZO TFTs) on transparent polyimide films against bias‐temperature stress below 100 mV, which is equivalent to those on glass substrates. This high reliability was achieved by dense IGZO thin films and annealing temperature below 300 °C. We have reduced bulk defects of IGZO thin films and interface defects between gate insulator and IGZO thin film by optimizing deposition conditions of IGZO thin films and annealing conditions. Furthermore, a 3.0‐in. flexible active‐matrix organic light‐emitting diode was demonstrated with the highly reliable a‐IGZO TFT backplane on polyimide film. The polyimide film coating process is compatible with mass‐production lines. We believe that flexible organic light‐emitting diode displays can be mass produced using a‐IGZO TFT backplane on polyimide films.     

Human error identification in human reliability assessment. Part 2: Detailed comparison of techniques

This is the second part of a two-part review of human error identification (HEI) approaches in human reliability assessment (HRA). Part 1 reviewed the probabilistic risk assessment (PRA) context in which HRA occurs, and then detailed 12 HEI techniques which have evolved in the field of HRA. Part 2 attempts to compare the way these techniques perform against a range of criteria relevant to HEI theoretical and empirical validity, and practical usefulness in applied HRA. It is hoped that these comparisons will help assessors in the selection of techniques for practical applications. The comparisons also point to research and development needs in the area of applied HEI.     

基于多模型变权重组合的软件可靠性仿真研究

研究提高软件可靠性预测精度问题,对软件可靠性研究已成为当前软件工程的一个研究热点,传统的单一软件可靠性模型由于使用的技术及提取的信息有限,软件可靠性预测精度不高。为提高软件可靠性预测精度,在建立多种单一软件可靠性预测模型的基础上,提出一种样本点的多模型变权重组合模型。将多种预测技术有效地聚合在一起,取长补短,在样本数据有限的情况下,不仅改善了样本内学习能力也增强了样本外的泛化能力,提高了综合预测精度。仿真验证模型无论在样本内还是样本外都较优于经过模拟退火算法优化的BP神经网络(SA-BP)及经过遗传算法优化的最小二乘支持向量机(GA-LSVM),说明变权重组合模型是一种精度更高的软件可靠性失效数据预测模型,具有较好的应用推广价值。     

极大规模并行计算系统趋势分析

高性能计算技术以加速度迅猛发展,继千万亿次系统研制成功以后,超级计算机的性能又快速提升至数万万亿次,国际学术界与工业界普遍预期在2018年左右将出现极大规模并行的百万万亿次系统(Exascale Computing,简称E级系统)。本文从最新一届TOP500榜单入手分析了超级计算领域的技术动态,在此基础上,探讨了未来E级系统的发展趋势及其所面临的能耗、可扩展、可靠性和可编程性等关键技术问题。     

人工神经网络技术在电工产品可靠性实验中的应用(理论部分)

本文简要介绍了人工神经网络，BP神经网络的结构、训练和学习规则以及人工神经网络非线性时间序列预测的应用概况。     

可靠性技术在继电器控制中的应用

本文以可靠性技术,针对继电器在使用时主要失效模式触点失效故障进行分析,从触点材料、控制负载、抑制触点电弧,并对触点在常用环境下不合理使用等问题一并进行了较详细的阐述。     

基于主动学习Kriging模型的地下管线抗震可靠度分析

为提升地下承插式接口铸铁管线抗震可靠度的计算效率,提出基于主动学习Kriging代理模型的Monte Carlo模拟方法(AK-MCS)进行地下管线抗震可靠度计算。采用梁单元模拟管线结构,均布弹簧反映管土相互作用,接口弹簧模拟邻接管道约束作用,建立了地下管线地震响应分析模型;考虑管线接口允许位移、管线埋深、土体容重和内摩擦角等模型参数随机性的影响,以管线接口位移量为安全准则,采用主动学习Kriging模型方法建立管线接口位移响应与随机变量参数关系的代理模型,从而获得管线接口安全状态。算例结果表明,AK-MCS法计算得到的管线失效概率与传统Monte Carlo模拟计算的结果相对误差在5%以内,且AK-MCS法计算时间约为传统Monte Carlo模拟计算时间的2%。因此在进行管线可靠度计算时,主动学习Kriging代理模型方法具有准确性与高效性。     

新型高温合金700℃时效组织及力学性能

利用微观组织分析和高温力学性能测试方法，研究了1种新型Ni—Cr—Co基高温合金在700℃长期时效过程中的组织稳定性及其一些力学性能。结果表明：试验合金在700℃时效过程中，析出物有MC，M23C6和γ’；晶内和晶界碳化物MC和M23C6的稳定性好，γ'的粗化为扩散控制的生长过程；在700℃时效初期，室温硬度变化小，随时效时间的增加而减小，这与γ'的粒度、形貌和分布有关；合金的高温拉伸强度和持久强度比Nimonic 263显著提高，且韧塑性好；试验合金在700℃具有稳定的显微组织和较高的高温力学性能。     

On certain aspects of strain rate sensitivity of sheet metals

The formability of a material depends upon the strain hardening and strain rate hardening of the material. In this study, constitutive parameters using the power law constitutive equation are determined for six different strength steels and two aluminum alloys over different strain ranges, including approximations of the postuniform elongation range. Constitutive parameters are found to be different at different strain ranges. The strain hardening of steels increases with strain at low strain levels (less than 5%) and decreases at high strain levels (greater than 10%). Strain rate hardening decreases with strain for all steels and aluminum alloys. Uniform elongation depends only on strain hardening, and postuniform elongation depends only on strain rate hardening. However, the total elongation depends on both strain hardening and strain rate hardening.     

X射线衍射-拉伸法测薄膜应力

薄膜应力的测量一直是一个困难的问题。本文尝试用一种新的方法——X射线衍射-拉伸法,对薄膜的应力进行检测,与侧倾法实验结果相比较,X射线衍射-拉伸法更为准确与可靠。