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31.
F. Goschenhofer J. Gerschütz A. Pfeuffer-Jeschke R. Hellmig C. R. Becker G. Landwehr 《Journal of Electronic Materials》1998,27(6):532-535
N-type Hg1−xCdxTe layers with x values of 0.3 and 0.7 have been grown by molecular beam epitaxy using iodine in the form of CdI2 as a dopant. Carrier concentrations up to 1.1 × 1018 cm−3 have been achieved for x = 0.7 and up to 7.6 × 1017 cm−3 for x=0.3. The best low temperature mobilities are 460 cm2/(Vs) and 1.2 × 105 cm2/(Vs) for x=0.7 and x=0.3, respectively. Using CdI2 as the dopant modulation doped HgTe quantum well structures have been grown. These structures display very pronounced Shubnikov-de
Haas oscillations and quantum Hall plateaus. Electron densities in the 2D electron gas in the HgTe quantum well could be varied
from 1.9 × 1011 cm−2 up to 1.4 × 1012 cm−2 by adjusting the thicknesses of the spacer and doped layer. Typical mobilities of the 2D electron gas are of the order of
5.0 × 104 cm2/(Vs) with the highest value being 7.8 × 104 cm2/(Vs). 相似文献
32.
MBE growth and properties of ZnO on sapphire and SiC substrates 总被引:9,自引:0,他引:9
M. A. L. Johnson Shizuo Fujita W. H. Rowland W. C. Hughes J. W. Cook J. F. Schetzina 《Journal of Electronic Materials》1996,25(5):855-862
Molecular beam epitaxy (MBE) of ZnO on both sapphire and SiC substrates has been demonstrated. ZnO was used as a buffer layer
for the epitaxial growth of GaN. ZnO is a würtzite crystal with a close lattice match (<2% mismatch) to GaN, an energy gap
of 3.3 eV at room temperature, a low predicted conduction band offset to both GaN and SiC, and high electron conductivity.
ZnO is relatively soft compared to the nitride semiconductors and is expected to act as a compliant buffer layer. Inductively
coupled radio frequency plasma sources were used to generate active beams of nitrogen and oxygen for MBE growth. Characterization
of the oxygen plasma by optical emission spectroscopy clearly indicated significant dissociation of O2 into atomic oxygen. Reflected high energy electron diffraction (RHEED) of the ZnO growth surface showed a two-dimensional
growth. ZnO layers had n-type carrier concentration of 9 × 1018 cm−3 with an electron mobility of 260 cm2/V-s. Initial I-V measurements displayed ohmic behavior across the SiC/ZnO and the ZnO/GaN heterointerfaces. RHEED of GaN
growth by MBE on the ZnO buffer layers also exhibited a two-dimensional growth. We have demonstrated the viability of using
ZnO as a buffer layer for the MBE growth of GaN. 相似文献
33.
Preparation and properties of CuInS2 thin film prepared from electroplated precursor 总被引:1,自引:1,他引:1
Yoshio Onuma Kenji Takeuchi Sumihiro Ichikawa Yasunari Suzuki Ryo Fukasawa Daisuke Matono Kenji Nakamura Masao Nakazawa Koji Takei 《Solar Energy》2006,80(1):132-138
Thin CuInS2 films were prepared by sulfurization of Cu/In bi-layers. First, the precursor layer was electroplated onto the treated surface of Mo-coated glass. Observation of the cross-section prepared by focused ion beam (FIB) etching revealed that the void-free film was initially formed on the top surface of the precursor layer and continued to grow until the advancing front of the film reached the Mo layer. The nucleation of voids near the bottom of the CuInS2 film followed. To determine whether the condition of the Cu/In alloy influences the CuInS2 quality we investigated the Cu/In alloy state using FIB. We found that the annealed precursor of low Cu/In ratio (1.2) has several voids in the mid position in the layer compared with Cu-rich precursor (1.6). The cross-sectional view of the Cu-rich absorber layer is uniform compared with the low copper absorber layer. Thin film solar cells were fabricated using the CuInS2 film (Cu/In ratio: 1.2) as an optical absorber layer. It was found that the optimization of a sulfurization period is important in order to improve the cell efficiency. We have not yet obtained good results with high Cu-rich absorber because of a blister problem. This blister was found before sulfurization. So, we are going to solve this blister problem before sulfurization. 相似文献
34.
通过分析总结近年来国内外对砖砌体的本构关系和破坏准则的理论研究成果,找出了较合理、适用的本构关系和破坏准则的组合,能较好地描述墙梁受力破坏的力学特性。并基于塑性理论,编制了“墙梁结构弹塑性有限元法计算程序”,对一些算例进行了验算,得到较好的结果。采用对比分析和图表显示的方法,得出在竖向荷载作用下,随着弹塑性的发展,墙体竖向压应力的变化规律。 相似文献
35.
36.
采用一种高效的双曲结构可变分数延时滤波器(V FD F )实现了宽带波束形成,可以在不改变滤波器系数的情况下改变波束指向,并采用这种可变分数延时滤波器实现了雷达干扰宽带多波束形成,通过共用子滤波器减小了硬件开销。 相似文献
37.
38.
协作多点传输(Coordinated Multiple Point,CoMP)是围绕IMT Advanced的目标而提出的。它通过基站内不同射频接入点(RRU)协作、基站和其所属Relay协作及基站间协作等多种多点协作方式,以减小小区边缘干扰,提高小区边缘频谱效率,增加有效覆盖。这里在有限反馈信道下研究了如何使频谱效率最大化,并分3种情况进行容量分析,包括了在最大SNR波束成型、波束成型信道容量的上界,以及极端情况下的波束成型。 相似文献
39.
TAN Yong-wen XIE Xue-bing Jack Zhou XU Tian-wei YANG Wei-guo YANG Hai 《半导体光子学与技术》2007,13(4):272-275,288
The damage properties of Focused Ion Beam(FIB) milling Si3N4 thin film are investigated by the detailed analyzing images of nanoholes and simulation of Monte Carlo. The damage depth in the Si3N4 thin film for two different ion species(Gallium and Arsenic) under various parameters(ion energy, angle of incidence) are investigated by Monte Carlo method. The simulations show the damage depth increases with the increasing ion energy, the damage depth is dependent on the angle of incident ion, the curves of the damage depth for Ga ion and As ion at 30 keV nearly superpose, while the damage depth for Ga with 90 keV ion is more than that for As ion with the same energy. 相似文献
40.