弹性资源下的测试系统资源配置方法

提出采用赋时有色Petri网对测试流程进行建模,用来优化自动测试系统的资源配置。给出了测试流程TCP-net模型的构建步骤;基于模型,给出了寻求测试流程最短测试用时的方法;给出了弹性资源的定义以及在弹性资源条件下最小资源集求解算法和资源分配策略;通过给出一个应用实例,证明了上述方法的有效性和实用性。     

基于小波变换和支持向量机的模拟电路故障诊断方法研究

提出一种利用小波变换提取模拟电路故障特征和基于支持向量机状态分类的模拟电路故障自动识别和诊断方法。首先讨论小波变换的基本原理和支持向量机原理及其多分类算法,同时着重研究支持向量机的一种改进型一对多故障分类算法,然后实现在小波变换上,采用分布式多SVM分类器识别单相桥式整流模拟电路的故障。实验证明,该方法能准确有效地对模拟电路故障进行识别和诊断。     

基于ATmega128的调光控制器方案设计

现有的模拟调光控制器大多采用拉杆、旋钮、开关等对模拟信号进行变换,控制精度不高,体积较大,且只能实现对灯具的通断控制。本文结合PC上位机、ATmega128单片机及AD7226芯片实现一种高精度的模拟调光控制器,通过上位机的调光控制软件可以对灯具实现多种灯光效果的变换。     

A two-phase dynamic dispatching approach to semiconductor wafer testing

There have been numerous advancements and rising competition in semiconductor technologies. In light of this, the wafer test plays a more significant role in providing the most prompt yield feedback for quick process improvement. However, the wafer test shop floor is getting more complicated than ever before because of the increasing change-over rate, nonlinear wafer arrival, and preemption by urgent orders. Furthermore, the foundry wafer test is a heterogeneous production with different production cycle times and a large variety of nonidentical testers. Shop floor conditions, including work in process (WIP) pool, tester status, and work order priority, continuously change. There is a need to operate the kind of production line that simultaneously fulfills multiple objectives. Such objectives are maximum confirmed line item performance (CLIP) for normal lots, 100% CLIP for urgent lots, minimum change-over rate, and shortest cycle time. Thus, a reactive dispatching approach is proposed and expected to perform a real-time solution no matter how/what the shop floor would change. The dynamic approach is mainly triggered by two kinds of major events: one is when an urgent lot comes in, and the other is when a tester is idle. In addition, through a two-phase dispatching algorithm, lot ranking, and lot assignment methods, prioritized WIP lots and an appropriate lot assignment are suggested. A better performance measure is obtained by considering the multiple objectives the wafer test operations seek to achieve.     

一种优化的射频IC接收电路

简要介绍射频IC系统的结构,并针对现有射频IC系统接收电路的不足,通过调整混频器增益、混频管之间距离和工作频率等方法,实现对接收电路的优化。通过仿真,证明了优化的有效性。     

Limiting negations in non-deterministic circuits

The minimum number of NOT gates in a Boolean circuit computing a Boolean function f is called the inversion complexity of f. In 1958, Markov determined the inversion complexity of every Boolean function and, in particular, proved that log₂(n+1) NOT gates are sufficient to compute any Boolean function on n variables. In this paper, we consider circuits computing non-deterministically and determine the inversion complexity of every Boolean function. In particular, we prove that one NOT gate is sufficient to compute any Boolean function in non-deterministic circuits if we can use an arbitrary number of guess inputs.     

CAN节点总线关闭状态下通信中断的解决方法

CAN总线通信中,当某一节点进入总线关闭状态后,不会与总线其他节点通信.针对这个问题,分析了节点从总线关闭状态转化为主动错误状态的条件,提出了采用模拟开关和电压基准主动实现这种转化条件的解决方法,解决了CAN节点恢复时间不确定的问题.     

Σ△微加速度计中基于脉宽调制的力反馈回路

针对微加速度计接口电路的sigma delta（ΣΔ）数字反馈系统,本文提出一种基于脉宽调制（PWM）的力反馈回路：利用模拟低通滤波器将PWM波解调成模拟输出信号,具有滤波和数模转换功能。首先建立了微加速度计ΣΔ闭环反馈系统的Simulink模型并进行了系统级仿真。之后采用Filter Solutions滤波器设计软件确定三阶低通巴特沃斯滤波器,并采用Pspice仿真软件进行电路级仿真。最后将制作的PCB版电路进行测试：PWM波通过力反馈回路能还原成高保真的模拟信号,输出信号和输入信号的频率相对误差小于0.36%,等效DAC分辨率为8位。试验表明,此方案结构简单、成本低,能以较低电路复杂度实现高精度的模拟信号输出。     

模拟量输入计算机的研究与实现

该文经过研究和大量的试验利用三极管的非工作区实现了特模拟量直接输入计算机的信息传输方法。该方法将传感器所采集的信息无需进行模数转换,即可直接将模拟量输入到计算机中。该研究的实现不仅降低了信息传输的成本,而且还实现了远距离传输产提高了信息传输速度。它在工控等领域具有广泛的用途。