Integral methods for flow in a conical centrifuge

A set of through-thickness averaged equations for momentum and strain rate are derived for the problem of axi-symmetric free-surface flow within a spinning cone. The expressions are independent of the choice of constitutive law and can therefore be used for modeling the flow of a variety of materials within an industrial conical centrifuge. By assuming a through-thickness velocity profile the distribution of flow thickness and average velocity over the internal surface of the cone can be obtained. The approach has been validated for thin Newtonian viscous flow by comparison with full three-dimensional solutions of the Navier–Stokes equations obtained with a commercial CFD package. The averaged equations provide an accurate prediction of the flow thickness, velocity and the length of the zones of influence of inlet and outlet boundary conditions.     

Preparation of coatings on alumina ceramic for wettability

To improve the wetting ability between ceramic and metal, titanium and copper coatings on alumina ceramics were prepared by infiltration of molten salt and electroless plating, respectively. A Ti/Cu bi-layer was also obtained by combining the two methods. The preparation process was optimized. The phase composition of the coatings was analyzed by X-ray diffraction (XRD). And the wettability of the titanium coating was investigated. The results showed that the copper droplet was easily spread on the surface of titanium coated alumina. The titanium coated alumina was well composited with high chromium white cast iron and the interface between ceramic and metal was well combined.     

Improved physical properties of Al-doped ZnO thin films deposited by unbalanced RF magnetron sputtering

Room temperature Al-doped ZnO (AZO) thin films with improved crystalline and optical properties were grown on normal glass substrates using unbalanced RF magnetron sputtering technique. To modify the plasma density towards the substrate and enhance the crystalline nature, an additional magnetic field ranging from 0 to 6.0 mT has been applied to the AZO target by proper tuning of solenoid coil current from 0 to 0.2 A respectively, which plays a significant role for controlling the physical properties of AZO films. The results from XRD studies indicate that all AZO films were composed of hexagonal wurtzite structure with better crystal quality through the applied magnetic field, ZnO (002) plane as a preferred growth. Furthermore, XPS studies suggested that symmetric chemical shifts in the binding energies for the Zn 2p and O1s levels with applied magnetic field. SEM analysis revealed the formation of a smooth, homogeneous and dense morphological surface with applied magnetic field. From AFM analysis, it was observed that the applied magnetic field strongly influenced the grain size and the films showed decreasing tendency in electrical resistivity. Films exhibited superior optical transmittance more than 94% in the visible region essentially due to the formation of better crystalline nature. The results indicate that improved band gap from 3.10 to 3.15 eV with additional magnetic field varied from 0 to 6.0 mT respectively.     

Crystallization of Zirconium-Rich PLZT Thin Films Below 500°C

The general problem of processing zirconium-rich lead-lanthanum-zirconate-titanate (PLZT) thin films at the commonly used temperatures between 600 and 650 C is lead-oxide loss, leading to the formation of a non-ferroelectric, surface pyrochlore-type phase. To avoid lead-oxide losses due to sublimation and/or the interaction of the film with the substrate, it is desirable that the annealing temperatures are as low as possible. Our goal was to study and prepare perovskite PLZT 9.5/65/35 (Pb 0.858 La 0.095 Zr 0.65 Ti 0.35 O 3 ) thin films below 500 C. At 400 C the growth of the perovskite phase follows the parabolic law typical of diffusion controlled processes. During prolonged annealing growth continues until the limiting stoichiometry of the perovskite phase with regard to the PbO is reached. We conclude that, even at this low temperature the amount of PbO in the film is the critical factor in the crystallization of the perovskite phase.     

Effects of PbTiO 3 Seed Layer on the Characteristics of RF-Sputtered Pb(Zr 0.5 ,Ti 0.5 )O 3 Thin Films

The effects of seed layers on the characteristics of rf-sputtered lead zirconium titanate thin films were investigated. Prior to sputtering, PbTiO 3 seed layers (100 nm) were deposited onto the Pt/Ti/Si and Pt/Si substrates by sol-gel (spin coating) processing method. Structure-property relation was studied as functions of substrate temperature and sputtering conditions. Special efforts were given in optimizing the deposition parameters to prepare the films in the perovskite phase without post deposition annealing. Dielectric constant and loss tangent of the films were in the range 800-950 and 0.04 -0.06, respectively. Remanent polarization and coercive field were 23.1 w C/cm 2 and 75kV/cm, respectively, for the films without PbTiO 3 seed layer, where as the corresponding quantities for in situ -deposited perovskite Pb(Zr, Ti)O 3 films on PbTiO 3 seed layer were 28 w C/cm 2 and 65 kV/cm, respectively.     

Structural and electrical properties of Na0.5Bi4.0RE0.5Ti4O15 (RE=Tm,Yb and Lu) thin films

In the current study, a series of lanthanide ions, Tm, Yb and Lu, were used for doping at the Bi-site of the Aurivillius phase Na_0.5Bi_4.5Ti₄O₁₅ (NaBTi) to investigate the structural, electrical and ferroelectric properties of the thin films. In this regard, Na_0.5Bi_4.5Ti₄O₁₅ and the rare earth metal ion-doped Na_0.5Bi_4.0RE_0.5i₄O₁₅ (RE=Tm, Yb and Lu, denoted by NaBTmTi, NaBYbTi, and NaBLuTi, respectively) thin films were deposited on Pt(111)/Ti/SiO₂/Si(100) substrates by using a chemical solution deposition method. Formations of the Aurivillius phase orthorhombic structures for all the thin films were confirmed by X-ray diffraction and Raman spectroscopic studies. Based on the experimental results, the rare earth metal ion-doped Na_0.5Bi_4.0RE_0.5Ti₄O₁₅ thin films exhibited a low leakage current and the improved ferroelectric properties. Among the thin films, the NaBLuTi thin film exhibited a low leakage current density of 6.96×10⁻⁷ A/cm² at an applied electric field of 100 kV/cm and a large remnant polarization (2P_r) of 26.7 μC/cm² at an applied electric field of 475 kV/cm.     

Fabrication of CaLa4(Zr0.05Ti0.95)4O15 thin films by RF magnetron sputtering

Crystalline CaLa₄(Zr_0.05Ti_0.95)₄O₁₅ thin films deposited on n-type Si substrates byRF magnetron sputtering at a fixed RF power of 100 W, an Ar/O₂ ratio of 100/0, an operating pressure of 3 mTorr, and different substrate temperatures were investigated. The surface structural and morphological characteristics analyzed by X-ray diffraction and atomic force microscopy were sensitive to the deposition conditions, such as the substrate temperature. The diffraction pattern showed that the deposited films had a polycrystalline microstructure. As the substrate temperature increased, the quality of the CaLa₄(Zr_0.05Ti_0.95)₄O₁₅ thin films improved, and the kinetic energies of the sputtered atoms increased, resulting in a structural improvement of the deposited CaLa₄(Zr_0.05Ti_0.95)₄O₁₅ thin films. A high dielectric constant of 16.7 (f=1 MHz), a dissipation factor of 0.19 (f=1 MHz), and a low leakage current density of 3.18×10⁻⁷ A/cm² at an electrical field of 50 kV/cm were obtained for the prepared films.     

当代电影美术先锋设计分析

当代电影美术先锋设计是基于传统电影美学认知而表现出的独具性及颠覆性兼具的一种价值体系。其通过自身所蕴含的平衡哲理及反叛精神的充分表达,进而在电影中得以完美阐述,其中所使用的表现手法具有多元性及共生性。由此可知,当代电影所体现出的美术先锋设计,其美学基础其有兼容性。文章通过对当代电影的分析和研究,进一步展开了系统化、具体化的解析和阐述,并在结合先锋设计独特魅力的基础上,将创新性的美学观点进一步融入到电影中进行针对性、合理化的表述,旨在全方位、立体化地分析当代电影美术先锋设计。