软式操纵系统中张力调节器的设计研究

软式操纵系统是通过钢索张力来传递操纵力的,钢索张力的变化直接影响飞机的操纵性能。张力调节器就是使钢索在各种状态下保持张力恒定的一种调节装置。对张力调节器的原理、结构形式进行了综合论述,并结合设计实例来说明钢索张力调节器的设计过程及设计中各参数的选取原则。     

A new method to cope with decision makers' uncertainty in the equipment selection process

One of the main problems faced while configuring or reconfiguring manufacturing systems is to rank alternative designs taking into account all the different aspects involved (both tangible and intangible). For this purpose the Analytic Hierarchy Process (AHP) is a well-known decision making support method that addresses this problem. A major drawback of AHP is that uncertainty in the judgments of the decision makers and the resulting impact on the ranking is not considered. In real situations, however, judgments based on perceived future scenarios are almost always uncertain. To solve this problem in this paper we present the first complete probabilistic extension to the AHP method. The new method provides the decision maker not only with information on the ranking of the alternatives but also the probability that the ranking remains stable even in presence of uncertainty in the judgements. We verified the validity of the new method in a real application developed for the Ferrari racing team.     

深亚微米集成电路的快速时域仿真技术

随着深亚微米集成电路技术的发展，集成电路的规模越来越大，工作频率越来越高，并正朝着系统集成的方向发展，因而在模拟速度，模拟精度和可模拟的电路规模等各个方面对电路仿真技术提出了新的要求。近年来，各种新的电路仿真方法和仿真系统用相继脱颖百出，并将取代那些传统的，已经无法适应深亚微米技术发展的电路仿真器。     

在（311）面上所生长的Al_xGa_（1－x）As／GaAs单量子阱特性

文章报道了用分子束外延（ＭＢＥ）法在６００℃和６５０℃下，在Ｓｉ掺杂的ＧａＡｓ衬底的（３１１）Ａ和（３１１）Ｂ面上成功地生长了高质量的ＡｌｘＧａ１－Ａｓ／ＧａＡｓ单量子阱材料。计算了光荧光（ＰＬ）峰值能量，并与实验作了比较。讨论了（３１１）Ａ和（３１１）Ｂ面上的不同生长特性。     

Flexible and light weight copper indium diselenide solar cells on polyimide substrates

Thin film flexible CuInSe₂ (CIS) solar cells have been fabricated for the first time on light-weight polymeric substrates. Evaporated Cu---In alloy precursors were selenized in H₂Se atmosphere at around 400°C to grow the CIS absorber layers. Low temperature techniques which are compatible with the polymeric substrates were used to deposit the window layers of CdS and ZnO. The demonstrated active area conversion efficiency of 9.3% makes this light-weight device very attractive for many terrestrial and space power generation applications where high specific power and mechanical flexibility are needed.     

最优化分析使网络电路输出功率最大

用最速上升法分析具有多负载的有源线性网络电路,使其输出功率最大,它可以为电子器件端口的合理布置提供最优数据。     

直接成像技术在PCB中的应用

电子产品日趋小型化、轻量化、多功能化，使电路板线路密度增加，从而对电路板的制作技术有了更高的要求，普通的接触曝光成像技术不能满足高密度电路的要求，激光直接成像（LDI）技术正迎合了精细线路的要求，而在PCB制作中得到应用。介绍了LDI的成像原理、存在的优缺点及其在PCB制作中的应用。     

基于OTA的多功能电压模滤波器及其仿真

本文采用信号流图法设计了一种基于ＯＴＡ的三输入一输出多功能电压模滤波器新电路，该电路由五个ＯＴＡ和两个接地电容构成，合理选择输入电压可实现低通、高通、带通、带阻及全通滤波功能。文章还对电路进行了ＭＯＳ管级的计算机仿真，其结果表明所提出的电路方案正确有效。     

Integrating scheduling and control functions in computer integrated manufacturing using artificial intelligence

Proper integration of scheduling and control in Flexible Manufacturing Systems will make available the required level of decision-making capacity to provide a flexibly-automated, efficient, and quality manufacturing process. To achieve this level of integration, the developments in computer technology and sophisticated techniques of artificial intelligence (AI) should be applied to such FMS functions as scheduling. In this paper, we present an Intelligent Scheduling System for FMS under development that makes use of the integration of two AI technologies. These two AI technologies — Neural Networks and Expert Systems — provide the intelligence that the scheduling function requires in order to generate goodschedules within the restrictions imposed by real-time problems. Because the system has the ability to plan ahead and learn, it has a higher probability of success than conventional approaches. The adaptive behavior that will be achieved contribute to the integration of scheduling and control in FMS.     

Techniques for estimating test length under random test

When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901.