可用于Ⅲ族氮化物生长的50mm 3C-SiC/Si(111)衬底的制备

利用新研制出的垂直式低压CVD(LPCVD)SiC生长系统,获得了高质量的50mm 3C-SiC/Si(111)衬底材料.系统研究了3C-SiC的n型和p型原位掺杂技术,获得了生长速率和表面形貌对反应气体中SiH4流量和C/Si原子比率的依赖关系.利用Hall测试技术、非接触式方块电阻测试方法和SIMS,分别研究了3C-SiC的电学特性、均匀性和故意调制掺杂的N浓度纵向分布.利用MBE方法,在原生长的50mm 3C-SiC/Si(111)衬底上进行了GaN的外延生长,并研究了GaN材料的表面、结构和光学特性.结果表明3C-SiC是一种适合于高质量无裂纹GaN外延生长的衬底或缓冲材料.     

用于制备硅LED的太阳能电池技术

集成电路工艺发展使得芯片内部的互连成为芯片延时的主要问题.制备出高光效的硅LED已经成为OEIC发展的瓶颈.硅是间接带隙半导体,而且载流子寿命较长.所以使用硅材料制备发光器件是长久以来特别引人关注而又较难解决的问题.采取降低非辐射复合速率,增加辐射复合的机会可以实现硅LED的发光.介绍了用于制备硅LED的太阳能电池技术原理和主要方法,以及采用这一原理实现PERL硅电池和区熔硅衬底非晶硅电池用于制备LED的技术.     

Si衬底MOCVD生长GaN/InGaN多量子阱缺陷TEM研究

用透射电子显微镜对Si衬底生长GaN/InGaN多量子阱材料进行横断面测试,在衬底和缓冲层区域进行高分辨电子显微成像(HRTEM)、电子衍射衬度成像、选区电子衍射成像,在量子阱附近区域进行了双束近似电子衍衬像对其位错特性进行研究;用场发射扫描电子显微镜对饱和KoH溶液腐蚀前后材料成像.结果发现,AIN缓冲层具有多孔结构,高温GaN层位错平均密度达108cm-2,同扫描电子显微镜得到的六角腐蚀坑密度一致,量子阱以下发现大量位错发生90°弯曲,而使穿过量子阱位错密度大大降低.在线位错中,以刃位错居多,其次是混合位错,所观察区域几乎未见螺位错.     

GaAs分子束外延中硅阶梯掺杂优化及C-V测量

以硅作为砷化镓分子束外延（MBE）生长中的n型掺杂剂，为了确定硅的掺杂浓度，在一片GaAs半绝缘衬底上生长多个GaAs处延层，每一层中进行不同浓度的Si掺杂，然后用电化学C—V的方法确定各层中的载流子浓度，一次性得到了不同Si掺杂浓度与Si炉的温度之间的关系曲线。本文还介绍了如何采用控制生长的条件得到陡峭的界面，使不同掺杂浓度的层与层之间的界面变化非常明显。     

4Y32-T6铝合金管材生产工艺研究

介绍了4Y32铝合金特性,结合试制生产情况阐述了4Y32-T6铝合金管材熔铸工艺、均匀化退火工艺、挤压工艺、热处理工艺制度等,为工业化生产4Y32-T6管材提供了依据。     

<100>沟道方向对高迁移率双轴应变硅p-MOSFET的作用

双轴应变技术被证实是一种能同时提高电子和空穴迁移率的颇有前景的方法;<100>沟道方向能有效地提升空穴迁移率.研究了在双轴应变和<100>沟道方向的共同作用下的空穴迁移率.双轴应变通过外延生长弛豫SiGe缓冲层来引入,其中,弛豫SiGe缓冲层作为外延底板,对淀积在其上的硅帽层形成拉伸应力.沟道方向的改变通过在版图上45°旋转器件来实现.这种旋转使得沟道方向在(001)表面硅片上从<110>晶向变成了<100>晶向.对比同是<110>沟道的应变硅pMOS和体硅pMOS,迁移率增益达到了130%;此外,在相同的应变硅pMOS中,沟道方向从<110>到(100)的改变使空穴迁移率最大值提升了30%.讨论和分析了这种双轴应变和沟道方向改变的共同作用下迁移率增强的机理.     

Superparamagnetic Nanostructures for Off‐Resonance Magnetic Resonance Spectroscopic Imaging

This study proposes a new method to generate positive contrast in magnetic resonance imaging (MRI) using superparamagnetic contrast agents. Superparamagnetic nanostructures consisting of octahedron manganese ferrite nanoparticles embedded in spherical nanogels are fabricated using a bottom‐up approach. The composite nanoparticles are strongly magnetized in an external magnetic field and produce a unique NMR frequency shift in water protons, which can be demonstrated in MR spectroscopy and imaging to be different from the bulk pool. Moreover, the particles exhibit excellent colloidal stability in aqueous media and good cell biocompatibility. Hence, these particles are potentially useful as biomarkers by taking advantage of the positive contrast effects produced in MRI.     

Constraining Si Particles within Graphene Foam Monolith: Interfacial Modification for High‐Performance Li+ Storage and Flexible Integrated Configuration

Pulverization of electrode materials and loss of electrical contact have been identified as the major causes for the performance deterioration of alloy anodes in Li‐ion batteries. This study presents the hierarchical arrangement of spatially confining silicon nanoparticles (Si NPs) within graphene foam (GF) for alleviating these issues. Through a freeze‐drying method, the highly oriented GF monolith is engineered to fully encapsulate the Si NPs, serving not only as a robust framework with the well‐accessible thoroughfares for electrolyte percolation but also a physical blocking layer to restrain Si from direct exposure to the electrolyte. In return, the pillar effect of Si NPs prevents the graphene sheets from restacking while preserving the highly efficient electron/Li⁺ transport channels. When evaluated as a binder‐free anode, impressive cycle performance is realized in both half‐cell and full‐cell configurations. Operando X‐ray diffraction and in‐house X‐ray photoelectron spectroscopy confirm the pivotal protection of GF to sheathe the most volume‐expanded lithiated phase (Li₁₅Si₄) at room temperature. Furthermore, a free‐standing composite film is developed through readjusting the pore size in GF/Si monolith and directly integrated with nanocellulose membrane (NCM) separator. Because of the good electrical conductivity and structural integrity of the GF monolith as well as the flexibility of the NCM separator, the as‐developed GF/Si‐NCM electrode showcases the potential use in the flexible electronic devices.     

Molecular-beam epitaxial growth of HgCdTe infrared focal-plane arrays on silicon substrates for midwave infrared applications

Molecular beam epitaxy has been employed to deposit HgCdTe infrared detector structures on Si(112) substrates with performance at 125K that is equivalent to detectors grown on conventional CdZnTe substrates. The detector structures are grown on Si via CdTe(112)B buffer layers, whose structural properties include x-ray rocking curve full width at half maximum of 63 arc-sec and near-surface etch pit density of 3–5 × 10⁵ cm⁻² for 9 μm thick CdTe films. HgCdTe p⁺-on-n device structures were grown by molecular beam epitaxy (MBE) on both bulk CdZnTe and Si with 125K cutoff wavelengths ranging from 3.5 to 5 μm. External quantum efficiencies of 70%, limited only by reflection loss at the uncoated Si-vacuum interface, were achieved for detectors on Si. The current-voltage (I-V) characteristics of MBE-grown detectors on CdZnTe and Si were found to be equivalent, with reverse breakdown voltages well in excess of 700 mV. The temperature dependences of the I-V characteristics of MBE-grown diodes on CdZnTe and Si were found to be essentially identical and in agreement with a diffusion-limited current model for temperatures down to 110K. The performance of MBE-grown diodes on Si is also equivalent to that of typical liquid phase epitaxy-grown devices on CdZnTe with R₀A products in the 10⁶–10⁷ Θ-cm² range for 3.6 μm cutoff at 125K and R₀A products in the 10⁴–10⁵ Θ-cm² range for 4.7 μm cutoff at 125K.     

压印技术制备超高密度Si_2Sb_2Te_5基相变存储阵列

采用低成本、高效率的压印技术实现了高密度相变存储器(PCRAM)存储阵列的制备,开发出Si2Sb2Te5(SST)新材料的4Gbit/inch2存储阵列,存储单元面积为0.04μm2;利用SEM观测压印获得的光刻胶图形阵列以及刻蚀后的SST存储阵列,其单元外形均具有高度的一致性,且单元特征尺寸的3倍标准差均小于6nm;利用AFM研究了SST存储单元的I-V特性,阈值电压为1.56V,高、低电阻态阻值变化超过两个数量级。实验结果表明了SST新材料及压印技术在PCRAM芯片中的应用价值。