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131.
132.
Noriyuki Taoka Masafumi YokoyamaSang Hyeon Kim Rena SuzukiTakuya Hoshii Ryo IidaSunghoon Lee Yuji UrabeNoriyuki Miyata Tetsuji YasudaHisashi Yamada Noboru FukuharaMasahiko Hata Mitsuru TakenakaShinichi Takagi 《Microelectronic Engineering》2011,88(7):1087-1090
The ac signal response of majority carriers has been systematically investigated for Al2O3/InP metal-insulator-semiconductor (MIS) interfaces using C-V and the conductance methods. It was revealed by the conductance curve fitting that both slow trap and interface trap responses contribute to a conductance curve at the Al2O3/InP interfaces in the depletion bias condition, and that the contribution of slow trap response and large surface potential fluctuation make it difficult to obtain a clear conductance peak. It was found that the conductance curves in high frequency region can be represented by the surface potential fluctuation model. This means that the analysis through the conductance curve fitting is effective in characterizing III-V MIS interfaces. 相似文献
133.
介绍了中央空调水系统的化学处理工艺.经过化学清洗、钝化预膜和阻垢缓蚀的处理工艺,使空调水系统水质达到相应标准要求,保证空调系统正常运行. 相似文献
134.
宽带衰落信道中慢衰落信号的实时测量 总被引:2,自引:0,他引:2
本文研究了宽带衰落信道中慢衰落信号的实时测量,通过将测量误差描述为高斯分布的随机变量量化分析了利用RAKE接收机实时测量慢衰落信号的误差,结果表明,采用RAKE接收机进行测量可以显著提高测量的准确性,同时,讨论了没条件下测量滤波器的设计 。 相似文献
135.
The present work aims to verify the 3D quantitative analysis of grain boundary fracture in the breakage of single multiphase particles using X-ray microtomography. The breakage of single multiphase copper ore particles (6 mm cubic particles) by slow compression was examined. From XMT reconstructed images using the Marching Cube method, interfacial areas between copper mineral grains and host rock were determined for both parent particles and progeny particles. In this way, the specific interfacial area ratio was calculated as a metric for grain boundary fracture. Preferential grain boundary fracture only occurs at low energy dissipation rates and the current results confirm initial results for 3 mm cubes published previously by Garcia et al. (2009). 相似文献
136.
137.
Michael Pecht Pradeep Lall Stanley J. Whelan 《Quality and Reliability Engineering International》1990,6(4):275-284
Recently, the use and the applicability of reliability prediction models for microelectronic devices using the temperature-dependent Eyring and Arrhenius function, have been criticized. In fact, the temperature dependence of failure mechanisms of microelectronic devices and electronic equipment in general has been questioned. This paper discusses the effect of temperature on microelectronic failure mechanisms at various device failure sites. This paper also presents information on those mechanisms which may be more appropriately modelled by functions dependent on temperature change, the rate of temperature change and spatial temperature gradients. 相似文献
138.
General analytical expressions for the potential-time (E-t) and derivative-potential ((dt/dE)-E) curves of a electroactive monolayer exhibiting a quasi-reversible behaviour, corresponding to the application of an alternating current time function of the form I(t) = I0 cos(ωt), are presented. The use of this programmed current gives rise to singular and characteristic electrochemical responses. The alternating current also allows to obtain cathodic or both anodic and cathodic responses depending on whether the depletion of the adsorbed species was complete or not, and without using more than one applied current. Moreover, in this last case, it is possible to distinguish a reversible or an irreversible process by means of a simple visualisation of the E-t or (dt/dE)-E curves. Easy methods for estimating thermodynamic and kinetic parameters of the electroactive film are proposed and experimentally tested and compared with those previously obtained by using Cyclic Voltammetry. 相似文献
139.
140.
As an attractive nonlinear dynamic data analysis tool, global preserving kernel slow feature analysis (GKSFA) has achieved great success in extracting the high nonlinearity and inherently time-varying dynamics of batch process. However, GKSFA is an unsupervised feature extraction method and lacks the ability to utilize batch process class label information, which may not offer the most effective means for dealing with batch process monitoring. To overcome this problem, we propose a novel batch process monitoring method based on the modified GKSFA, referred to as discriminant global preserving kernel slow feature analysis (DGKSFA), by closely integrating discriminant analysis and GKSFA. The proposed DGKSFA method can extract discriminant feature of batch process as well as preserve global and local geometrical structure information of observed data. For the purpose of fault detection, a monitoring statistic is constructed based on the distance between the optimal kernel feature vectors of test data and normal data. To tackle the challenging issue of nonlinear fault variable identification, a new nonlinear contribution plot method is also developed to help identifying the fault variable after a fault is detected, which is derived from the idea of variable pseudo-sample trajectory projection in DGKSFA nonlinear biplot. Simulation results conducted on a numerical nonlinear dynamic system and the benchmark fed-batch penicillin fermentation process demonstrate that the proposed process monitoring and fault diagnosis approach can effectively detect fault and distinguish fault variables from normal variables. 相似文献