Models for low-dimensional thermoelectricity

Enhanced thermoelectric performance, expressed in terms of the thermoelectric figure of merit (ZT), has been predicted theoretically for low-dimensional electronic systems under appropriate experimental conditions. Enhanced ZT has been observed experimentally within 2D quantum wells of PbTe, and good agreement between theory and experiment has been obtained. The advantages of low-dimensional systems for thermoelectric applications are described, and prospects for further enhancement of ZT are discussed.     

Studies on polycrystalline Cd0.96Zn0.04Te thin films prepared by vacuum evaporation

Polycrystalline Cd_0.96Zn_0.04Te thin films are deposited onto glass substrates (Corning 7059) kept at room temperature by vacuum evaporation. The films exhibit zinc blende structure with predominant (1 1 1) orientation. The rms roughness of the films evaluated by atomic force microscope is 3.7 nm. The band gap energy of the films measured by optical transmittance measurement is 1.539 eV. The photoluminescence (PL) spectrum of the films shows intense emission due to free and bound exciton recombination and no emission associated with crystal imperfection and PL line shapes give indications of the high quality of the layers. These films have been implanted with properly mass analyzed Boron ions (¹⁰B⁺) and the effect of implantation has been analyzed by X-ray diffraction, Raman scattering and optical transmittance measurements and the results are explained on the basis of the implantation induced surface roughness and lattice disorder.     

A sensitive EPR dosimetry system based on sulfamic acid

There is a need for a sensitive dosimeter using electron paramagnetic resonance spectroscopy (EPR) for use in medical applications, since with this method non-destructive read-out and dose archival could be achieved. Sulfamic acid as a possible detector substance was investigated before and after irradiation, its EPR spectra were recorded and analyzed, some dosimetric characteristics were studied: microwave power saturation behavior, the effect of modulation amplitude on peak-to-peak signal intensity and the line width. Energy-dependence parameters were compared to soft tissue and alanine, and the response to ionizing radiation was studied, also the decay behavior along 133 days after irradiation is presented. It is found that sulfamic acid possesses high-sensitivity and reasonable signal stability which may make it useful as a sensitive dosimeter for medical applications.     

金属/Hg1-xMnxTe接触的I-V特性研究

分别采用溅射和蒸发镀膜法在Hg1-xMnxTe试样表面形成了Au/Hg1-xMnxTe和Al/Hg1-xMnxTe接触,并用Aligent4155c I-V测试仪对其I-V特性进行了测量,随后对试样在10%NH4F:10%H2O2:H2O中进行了钝化处理,并对处理后的试样再次进行了I-V测量,对于测试结果用热电子发射-扩散理论进行了分析.结果表明:Au与Hg1-xMnxTe形成了良好的欧姆接触,而Al与Hg1-xMnxTe形成了具有整流特性的肖特基接触,其肖特基势垒的理论推算值为0.38eV.钝化处理后的试样,其表面漏电现象明显降低,Au/Hg1-xMnxTe接触的电流下降幅度在0.1V时最大,为76.1%;而Al/Hg1-xMnxTe接触在0.2V时最大,为93.2%.随着偏压的进一步增大,两种接触的电流减小的幅度都逐渐变小.     

超声波-水热法合成Bi2Te3纳米管

以水为反应介质，NaBH4为还原剂，合成了BizTe3纳米管及纳米微粒。溶液首先在超声波发生器中预处理1h，然后置于150℃，水热反应釜中继续反应48h。XRD分析表明：合成产物主要物相为Bi2Te3；SEM观察可见产物中有纳米管生成，纳米管直径约为50-100nm，管壁厚约8-10nm，长度在500nm以上。EDS分析表明：纳米管成份为Bi2Te3。Bi2Te3纳米管可能的生长机制为纳米薄片-卷曲-闭合-纳米管。     

In-Situ monitoring of temperature and alloy composition of Hg1−xCdxTe using FTIR spectroscopic techniques

Optical real-time in-situ sensors play a very important role in the processing of semiconductor devices because of their noncontact remote nature and excellent compatibility with UHV systems. In this work, we report on progress in developing an in-situ temperature sensor for HgCdTe structures grown by molecular beam epitaxy (MBE). Based on the Fourier transform infrared (FTIR) spectrometer, this sensor is capable of continuous real-time monitoring of the surface temperature, thickness and alloy composition of HgCdTe epilayers. The accuracy and sensitivity of this FTIR technique were studied in all temperature ranges of interest. Also compared are two different methods of temperature determination obtained from the normalized spectral radiance. The influence of stray radiation and of sample holder rotation on the measurement accuracy have been studied. Reflectivity spectra for HgCdTe/CdZnTe(211) and HgCdTe/CdTe(211)/Si(211) structures have been analyzed in real time in order to determine the layer thickness and alloy composition for growing layers. Also discussed is a multilayer-structure optical model developed to solve the problem of composition determination at early stages of growth. The application of this model for fitting the transmission spectra is demonstrated.     

Variable temperature hall effect on p-Hg1−xCdxTe grown on CdTe and sapphire substrates by liquid phase epitaxy

Variable temperature Hall effect measurements have been made down to 9–10K on p-type Hg_1−xCd_xTe grown by liquid phase epitaxy on both CdTe and sapphire substrates. Carrier freeze-out was usually observed throughout the measured temperature range. For most samples, the hole mobility was well-behaved and exhibited a maximum at ˜ 35K. Values of acceptor ionization energy E_A and donor concentration N_D were estimated from the data, using a model assuming significant compensation, which provided a good fit to the low temperature data. In addition, values of N_D were also estimated from an analysis of the low temperature mobility using the hole effective mass as a parameter to provide reasonable agreement between the N_D values calculated from the Hall coefficient and mobility data. The measured carrier concentration is a result of close compensation between stoichiometric acceptors and donors, with N_D usually in the low-10¹⁷ cm⁻³ range. Average values of E_A for as-grown, undoped x = 0.32 layers on CdTe and sapphire substrates are 7.4 and 6.6 meV, respectively. An activation energy of 0.84 meV was determined for a Cu-doped x = 0.32 layer that was annealed in Hg vapor to reduce the number of Hg vacancies. The average E_A for undoped Hg-annealed x = 0.22 layers on CdTe substrates is 2.35 meV. Layers with x = 0.32 grown on sapphire substrates have average carrier concentrations of 2.92 (σ = 0.54) × 10¹⁶ cm⁻³, compared with 4.64 (θ = 1.26) × 10¹⁶ cm⁻³ for the same composition layers grown on CdTe substrates.     

碲镉汞晶体辐射损伤的分析电镜研究

用分析电子显微镜观察了碲镉汞晶体的显微结构。发现在大剂量电子辐射下,显微结构有较强的损伤。进一步用 X线能谱分析和高分辨电子显微术研究表明,大剂量电子辐射引起了碲镉汞晶体的超结构、叠栅、无序化和 Hg 含量减少。     

基于Bi_2Te_3合金材料的热发电模块研究

为了提高Bi2Te3热电材料的性能,采用Bi2Te3纳米粉体前驱物快速熔炼烧结法,制备了在室温条件下具有温度敏感性的Bi2Te3合金材料,在425K时此材料的热电优值达到0.548。在此基础上,研制了热电模块,并对其性能进行了测试。结果表明,以该Bi2Te3合金材料制备的热发电模块具有良好的伏安特性和稳定的内阻,当热冷端温度分别为140和60℃时,模块的最大输出功率可达到0.39W,显现出潜在的应用前景。