全文获取类型
收费全文 | 2560篇 |
免费 | 235篇 |
国内免费 | 339篇 |
专业分类
电工技术 | 308篇 |
综合类 | 118篇 |
化学工业 | 87篇 |
金属工艺 | 39篇 |
机械仪表 | 44篇 |
建筑科学 | 3篇 |
矿业工程 | 11篇 |
能源动力 | 15篇 |
轻工业 | 1篇 |
石油天然气 | 7篇 |
武器工业 | 6篇 |
无线电 | 1841篇 |
一般工业技术 | 437篇 |
冶金工业 | 17篇 |
原子能技术 | 34篇 |
自动化技术 | 166篇 |
出版年
2024年 | 7篇 |
2023年 | 48篇 |
2022年 | 33篇 |
2021年 | 90篇 |
2020年 | 59篇 |
2019年 | 89篇 |
2018年 | 55篇 |
2017年 | 130篇 |
2016年 | 151篇 |
2015年 | 140篇 |
2014年 | 211篇 |
2013年 | 177篇 |
2012年 | 189篇 |
2011年 | 188篇 |
2010年 | 150篇 |
2009年 | 158篇 |
2008年 | 171篇 |
2007年 | 147篇 |
2006年 | 127篇 |
2005年 | 104篇 |
2004年 | 107篇 |
2003年 | 70篇 |
2002年 | 75篇 |
2001年 | 58篇 |
2000年 | 65篇 |
1999年 | 31篇 |
1998年 | 45篇 |
1997年 | 31篇 |
1996年 | 32篇 |
1995年 | 33篇 |
1994年 | 29篇 |
1993年 | 29篇 |
1992年 | 28篇 |
1991年 | 11篇 |
1990年 | 22篇 |
1989年 | 16篇 |
1988年 | 17篇 |
1987年 | 6篇 |
1986年 | 1篇 |
1984年 | 2篇 |
1977年 | 1篇 |
1959年 | 1篇 |
排序方式: 共有3134条查询结果,搜索用时 15 毫秒
71.
72.
Ho-Young Cha Y. C. Choi R. M. Thompson V. Kaper J. R. Shealy L. F. Eastman M. G. Spencer 《Journal of Electronic Materials》2004,33(8):908-911
The SiC metal-semiconductor field-effect transistors (MESFETs) have been reported to have current instability and strong dispersion
caused by trapping phenomena at the surface and in the substrate, which degrade direct-current (DC) and radio-frequency (RF)
performance. This paper illustrates the change in electrical characteristics of SiC MESFETs after Si3N4 passivation. Because of a reduction of surface trapping effects, Si3N4 passivation can diminish current collapse under pulsed DC conditions, increasing the RF power performance. The reduction
of surface trapping effects is verified by the change in the ratio of the drain current to the gate current under pinch-off
conditions. 相似文献
73.
随着器件沟道尺寸的不断缩小,短沟道效应(SCE)和漏致势垒降低效应(DIBL)对常规类MOSFET结构的石墨烯纳米条带场效应管(GNRFET)影响变大,从而引起器件性能下降。文中提出了一种新型采用非对称HALO-LDD掺杂结构的GNRFET,其能够有效抑制器件中SCE和DIBL,改善器件性能。并采用一种量子力学模型研究GNRFET的电学特性,该模型基于二维NEGF(非平衡格林函数)方程和Poisson方程自洽全量子数值解。结合器件的工作原理,研究了GNRFET的电学特性和器件结构尺寸效应,通过与采用其他掺杂结构的GNRFET的电学特性对比分析,发现这种掺杂结构的石墨烯纳米条带场效应管具有更低的泄漏电流、更低的亚阈值斜率和DIBL以 相似文献
74.
Akshaya K. Palai Hyejin Cho Sungwoo Cho Tae Joo Shin Soonmin Jang Seung-Un Park Seungmoon Pyo 《Organic Electronics》2013,14(5):1396-1406
We report the synthesis, characterization and behavior in field-effect transistors of non-functionalized soluble diketopyrrolopyrrole (DPP) core with only a solubilizing alkyl chain (i.e. –C16H33 or –C18H37) as the simplest p-channel semiconductor. The characteristics were evaluated by UV–vis and fluorescence spectroscopy, X-ray diffraction, cyclic voltammetry (CV), thermal analysis, atomic force microscopy (AFM) and density functional theory (DFT) calculation. For top-contact field-effect transistors, two types of active layers were prepared either by a solution process (as a 1D-microwire) or thermal vacuum deposition (as a thin-film) on a cross-linked poly(4-vinylphenol) gate dielectric. All the devices showed typical p-channel behavior with dominant hole transports. The device made with 1D-microwiress of DPP-R18 showed field-effect mobility in the saturation region of 1.42 × 10?2 cm2/V s with ION/IOFF of 1.82 × 103. These findings suggest that the non-functionalized soluble DPP core itself without any further functionalization could also be used as a p-channel semiconductor for low-cost organic electronic devices. 相似文献
75.
Four sputtered oxide films (SiO2, Al2O3, Y2O3 and TiO2) along with their passivating amorphous InGaZnO thin film transistors (a-IGZO TFTs) were comparatively studied in this paper. The device passivated by an Al2O3 thin film showed both satisfactory performance (μFE=5.3 cm2/V s, Ion/Ioff>107) and stability, as was probably related to smooth surface of Al2O3 thin films. Although the performance of the a-IGZO TFTs with a TiO2 passivation layer was also good enough (μFE=3.5 cm2/V s, Ion/Ioff>107), apparent Vth shift occurred in positive bias-stress tests due to the abnormal interface state between IGZO and TiO2 thin films. Sputtered Y2O3 was proved no potential for passivation layers of a-IGZO TFTs in this study. Despite unsatisfactory performance of the corresponding a-IGZO TFT devices, sputtered SiO2 passivation layer might still be preferred for its high deposition rate and excellent transparency which benefit the mass production of flat panel displays, especially active-matrix liquid crystal displays. 相似文献
76.
A novel broadband power amplifier fabricated in 0.13 m SiGe HBT technology is realized.The pseudo-differential structure is proposed to avoid the influence of the bonding wire due to the AC virtual ground created at the common emitter node.A compensated matching technique is adopted in interstage matching to expand bandwidth.A multi-stage broadband matching technique is used in an input/output matching network to offer broadband impedance matching,which ensures maximum power transfer.An adaptive bias circuit could improve linearity and efficiency in wide output power level.With 2.5 V power supply,the measured results achieve 96% 3-dB bandwidth(517-1470 MHz),27.2 dB power gain,26.9 dBm maximum output power,19.7 dBm output 1 dB compression point,and 26.7% power added efficiency. 相似文献
77.
A nonvolatile memory based on an organic thin-film transistor (OTFT) with a biopolymer of DNA-cetyltrimethylammonium chloride (DNA-CTMA) acting as the gate dielectric layer was fabricated. The transfer characteristics of the device prepared by both DNA alone and DNA-CTMA showed a very large and stable hysteresis. In order to analyze the memory mechanism, the temperature dependence of the transfer characteristics, electric conductivity, differential scanning calorimetry (DSC), thermally stimulated depolarization current (TSDC) as well as the dielectric property of the DNA-CTMA film have been investigated. As a result, the quasi-ferroelectric polarization originating from the alignment of the intrinsic dipole moment inside the DNA-CTMA complex was identified as the main source of hysteresis in the lower temperature region. 相似文献
78.
It has been demonstrated that the modification of electrodes with self-assembled monolayers (SAMs) reduces the contact resistance and improves the device performances of organic field-effect transistors (OFETs). However, it has been difficult to judge if the contact resistance was reduced by the change in the electronic properties or by the change in the morphology of the metal–organic interface caused by the SAM modification because they have been difficult to be separately assessed. We have directly investigated the local impedance and the potential difference at the electrode–channel interfaces of the OFETs with and without modification of the electrodes by a pentafluorobenzenethiol SAM using frequency-modulation scanning impedance microscopy (FM-SIM). The potential profile measurement and the FM-SIM measurement at the interface showed that the improvement of the field-effect mobility in the SAM-modified OFET was caused by the reduction of the energy level mismatch, namely, the hole injection barrier at the source–channel interface, presumably with the reduction of the hole trap sites at the source–channel interface. 相似文献
79.
N-type organic thin film transistors (OTFT) containing modified gold electrodes have been fabricated to investigate the influence of the self assembled monolayer on the transistor characteristics. We report on the effect of drain/source modification by thiol derivatives on the performances, electrical parameters uniformity and electrical stability of C60 transistors. In the literature, electrical instability is often attributed to organic semiconductor (OSC), OSC-insulator interface and insulator. We found here that OSC-metal interfaces affect dramatically the operational stability for bottom gate/bottom contact structure. These effects have been attributed to morphological evolution at the interface metal-OSC induced by the self-assembled monolayers. 相似文献
80.