Highly linear micropower class AB current mirrors using Quasi-Floating Gate transistors

A design approach to achieve low-voltage micropower class AB CMOS cascode current mirrors is presented. Both class AB operation and dynamic cascode biasing are based on the use of Quasi-Floating Gate transistors. They allow high linearity for large signal currents and accurately set quiescent currents without requiring extra power consumption or supply voltage requirements. Measurement results show that dynamic cascode biasing allows a wider input range and a linearity improvement of more than 23 dB with respect to the use of conventional biasing. A THD value better than −35 dB is measured for input amplitudes up to 100 times the bias currents. Two class AB current mirror topologies are proposed, with slightly different ways to achieve class AB operation and dynamic biasing. The proposed current mirrors, fabricated in a 0.5 µm CMOS technology, are able to operate with a supply voltage of 1.2 V and a quiescent power consumption of only 36 µW, using a silicon area <0.025 mm².     

埋栅结构双极型静电感应晶体管动态特性的改善

双极型静电感应晶体管(BSIT)的失效经常出现在阻断态与导通态之间的瞬态过渡过程。因此,研究BSIT的开关动态过程的物理机理对于设计和制造高性能器件有着重要意义。本文深入研究了埋栅结构电力BSIT瞬态过程的动态特性,讨论了材料、几何结构与工艺参数对BSIT动态性能的影响。提出了一系列改善BSIT动态特性的工艺措施。     

LED用非极性GaN外延膜的制备技术进展

GaN是实现白光LED的关键材料。GaN外延膜通常沿极性c轴生长,基于极性GaN的LED有源层量子阱中由于强内建电场的存在而导致器件发光效率降低,而沿非极性面生长的GaN外延膜可以改善或消除极化效应导致的辐射复合效率降低和发光波长蓝移等问题。文章总结了非极性GaN外延膜的制备技术及研究进展,包括平面外延技术和横向外延过生长技术,指出开发非极性GaN自支撑衬底、发展非极性GaN的横向外延生长技术是制备低位错密度非极性GaN的研究方向。     

Influence of Si<Subscript>3</Subscript>N<Subscript>4</Subscript> passivation on surface trapping in SiC metal-semiconductor field-effect transistors

The SiC metal-semiconductor field-effect transistors (MESFETs) have been reported to have current instability and strong dispersion caused by trapping phenomena at the surface and in the substrate, which degrade direct-current (DC) and radio-frequency (RF) performance. This paper illustrates the change in electrical characteristics of SiC MESFETs after Si₃N₄ passivation. Because of a reduction of surface trapping effects, Si₃N₄ passivation can diminish current collapse under pulsed DC conditions, increasing the RF power performance. The reduction of surface trapping effects is verified by the change in the ratio of the drain current to the gate current under pinch-off conditions.     

Non-functionalized soluble diketopyrrolopyrrole: Simplest p-channel core for organic field-effect transistors

We report the synthesis, characterization and behavior in field-effect transistors of non-functionalized soluble diketopyrrolopyrrole (DPP) core with only a solubilizing alkyl chain (i.e. –C₁₆H₃₃ or –C₁₈H₃₇) as the simplest p-channel semiconductor. The characteristics were evaluated by UV–vis and fluorescence spectroscopy, X-ray diffraction, cyclic voltammetry (CV), thermal analysis, atomic force microscopy (AFM) and density functional theory (DFT) calculation. For top-contact field-effect transistors, two types of active layers were prepared either by a solution process (as a 1D-microwire) or thermal vacuum deposition (as a thin-film) on a cross-linked poly(4-vinylphenol) gate dielectric. All the devices showed typical p-channel behavior with dominant hole transports. The device made with 1D-microwiress of DPP-R18 showed field-effect mobility in the saturation region of 1.42 × 10^?2 cm²/V s with I_ON/I_OFF of 1.82 × 10³. These findings suggest that the non-functionalized soluble DPP core itself without any further functionalization could also be used as a p-channel semiconductor for low-cost organic electronic devices.     

Sputtered oxides used for passivation layers of amorphous InGaZnO thin film transistors

Four sputtered oxide films (SiO₂, Al₂O₃, Y₂O₃ and TiO₂) along with their passivating amorphous InGaZnO thin film transistors (a-IGZO TFTs) were comparatively studied in this paper. The device passivated by an Al₂O₃ thin film showed both satisfactory performance (μ_FE=5.3 cm²/V s, I_on/I_off>10⁷) and stability, as was probably related to smooth surface of Al₂O₃ thin films. Although the performance of the a-IGZO TFTs with a TiO₂ passivation layer was also good enough (μ_FE=3.5 cm²/V s, I_on/I_off>10⁷), apparent V_th shift occurred in positive bias-stress tests due to the abnormal interface state between IGZO and TiO₂ thin films. Sputtered Y₂O₃ was proved no potential for passivation layers of a-IGZO TFTs in this study. Despite unsatisfactory performance of the corresponding a-IGZO TFT devices, sputtered SiO₂ passivation layer might still be preferred for its high deposition rate and excellent transparency which benefit the mass production of flat panel displays, especially active-matrix liquid crystal displays.     

SiGe HBT工艺宽带功率放大器

A novel broadband power amplifier fabricated in 0.13 m SiGe HBT technology is realized.The pseudo-differential structure is proposed to avoid the influence of the bonding wire due to the AC virtual ground created at the common emitter node.A compensated matching technique is adopted in interstage matching to expand bandwidth.A multi-stage broadband matching technique is used in an input/output matching network to offer broadband impedance matching,which ensures maximum power transfer.An adaptive bias circuit could improve linearity and efficiency in wide output power level.With 2.5 V power supply,the measured results achieve 96% 3-dB bandwidth(517-1470 MHz),27.2 dB power gain,26.9 dBm maximum output power,19.7 dBm output 1 dB compression point,and 26.7% power added efficiency.     

智能汽车横向控制方法研究综述

智能汽车在提高行驶安全性和减少交通事故方面有很大的优势,已成为世界范围内的研究热点。综述了智能汽车横向控制的国内外发展历程与研究现状;介绍了车辆横向动力学和轮胎力学的研究历程和模型;阐述了智能汽车横向控制理论和方法以及自动转向执行机构的设计;给出智能汽车横向控制研究的重点和发展趋势。通过分析认为,系统非线性、不确定性和时变特性的智能汽车横向动力学建模和横向控制器设计,特别是高速时的横向控制,以及智能车辆感知决策系统与车辆本身系统的一体化设计,将是今后研究的重点。     

Temperature dependence of transfer characteristics of OTFT memory based on DNA-CTMA gate dielectric

A nonvolatile memory based on an organic thin-film transistor (OTFT) with a biopolymer of DNA-cetyltrimethylammonium chloride (DNA-CTMA) acting as the gate dielectric layer was fabricated. The transfer characteristics of the device prepared by both DNA alone and DNA-CTMA showed a very large and stable hysteresis. In order to analyze the memory mechanism, the temperature dependence of the transfer characteristics, electric conductivity, differential scanning calorimetry (DSC), thermally stimulated depolarization current (TSDC) as well as the dielectric property of the DNA-CTMA film have been investigated. As a result, the quasi-ferroelectric polarization originating from the alignment of the intrinsic dipole moment inside the DNA-CTMA complex was identified as the main source of hysteresis in the lower temperature region.     

Direct investigations of the interface impedance of organic field-effect transistors with self-assembled-monolayer-modified electrodes

It has been demonstrated that the modification of electrodes with self-assembled monolayers (SAMs) reduces the contact resistance and improves the device performances of organic field-effect transistors (OFETs). However, it has been difficult to judge if the contact resistance was reduced by the change in the electronic properties or by the change in the morphology of the metal–organic interface caused by the SAM modification because they have been difficult to be separately assessed. We have directly investigated the local impedance and the potential difference at the electrode–channel interfaces of the OFETs with and without modification of the electrodes by a pentafluorobenzenethiol SAM using frequency-modulation scanning impedance microscopy (FM-SIM). The potential profile measurement and the FM-SIM measurement at the interface showed that the improvement of the field-effect mobility in the SAM-modified OFET was caused by the reduction of the energy level mismatch, namely, the hole injection barrier at the source–channel interface, presumably with the reduction of the hole trap sites at the source–channel interface.